Abstract
Spatial resolution is important for any microscopy. This chapter presents the theory, technique, and examples of achieving the ultimate resolution of a transmission electron microscope with the method of “high-resolution transmission electron microscopy.” Recall (Sect. 2.3.3) that the HRTEM image is an interference pattern between the forward-scattered and diffracted electron waves from the specimen. Interference patterns require close attention to the phases of the waves. While the ray optics approach is useful for a few geometrical arguments, the most important issues in HRTEM are best understood in terms of the phase of the electron wavefront and how this phase is altered by the specimen and by the objective lens. The specimen itself is approximated as an object that provides phase shifts to the electron wavefront, sometimes in proportion to its scattering potential. The method of HRTEM also demands close attention to the performance of the objective lens and other characteristics of the microscope.
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Further Reading
The contents of the following are described in the Bibliography. S. Amelinckx and D. van Dyck: “Diffraction Contrast and High Resolution Microscopy of Structures and Structural Defects,” in Electron Diffraction Techniques, Volume 2, J. M. Cowley, Ed. (International Union of Crystallography, Oxford University Press, Oxford 1992).
J. Barry: ‘Computing for High-Resolution Images and Diffraction Patterns’. In Electron Diffraction Techniques, Volume 1, J. M. Cowley, Ed. (International Union of Crystallography, Oxford University Press, Oxford 1992).
P. R. Buseck, J. M. Cowley and L. Eyring: High-Resolution Transmission Electron Microscopy and Associated Techniques(Oxford University Press, Oxford 1988).
J. M. Cowley: Diffraction Physics, 2nd edn., (North-Holland, Amsterdam. 1975).
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L. Reimer: Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, 4th edn. (Springer-Verlag, New York 1997).
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F. G. Smith and J. H. Thomson: Optics, 2nd edn. (John Wiley and Sons, New York 1988).
J. C. H. Spence: Experimental High-Resolution Electron Microscopy(Oxford University Press, Oxford 1988).
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References and Figures
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Fultz, B., Howe, J.M. (2001). High-Resolution TEM Imaging. In: Transmission Electron Microscopy and Diffractometry of Materials. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04516-9_10
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DOI: https://doi.org/10.1007/978-3-662-04516-9_10
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