Abstract
So far, it has been shown how the knowledge of the unit cell of a crystal makes it possible to construct all possible sets of lattice planes (hkl) and to calculate their spacings d and the scattering angle of the corresponding reflections hkl. In order to measure the many reflections required for a structure determination, it is necessary to determine the precise orientations of the crystal relative to the X-ray beam required to bring each set of lattice planes in turn into the position that fulfils the Bragg condition and causes the scattered radiation to fall on the detector system.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2000 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Massa, W. (2000). The Reciprocal Lattice. In: Crystal Structure Determination. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-04248-9_4
Download citation
DOI: https://doi.org/10.1007/978-3-662-04248-9_4
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-65970-9
Online ISBN: 978-3-662-04248-9
eBook Packages: Springer Book Archive