Abstract
Much of the fascination of Scanning Tunneling Microscopy (STM) results from its ability to directly image atomic and molecular structures of a wide variety of materials. Since its inception, one purpose of STM has been to go beyond imaging by performing local experiments with individual nanoscopic objects addressed by the STM tip [5.1]. The concept of the technique to be presented in this chapter is to use the tip of a STM as a source of low-energy electrons or holes to locally excite photon emission and thus study luminescence1 phenomena on nanometer-sized structures of metals, semiconductors and molecules [5.2]. This combination of STM with optical methods offers several attractive features. First, photons represent a particularly versatile channel of information in addition to the tunneling current. Their intensity, spectral distribution, angular emission pattern, polarization status, and time correlation are accessible by sensitive optical methods and represent unique probes of the tunneling region. Spatial mapping of these physical quantities permits the addition of “true color” to STM images. Second, the emission of visible or infrared light is a chemically specific characteristic of many excitations of solids and molecules.
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References
G. Binnig, H. Rohrer: IBM J. Res. Develop. 30, 355 (1986)
J.K. Gimzewski, B. Reihl, J.H. Coombs, R.R. Schlittler: Z. Phys. B 72, 497 (1988)
P.K. Hansma: Tunneling Spectroscopy (Plenum, New York 1982)
E.L. Wolf: Principles of Electron Tunneling Spectroscopy (Oxford Univ. Press. New York 1985)
R. Berndt, R. Gaisch, J.K. Gimzewski, B. Reihl, R.R. Schlittler, W.D. Schneider, M. Tschudy: Science 262, 1425 (1993)
R. Berndt, R. Gaisch, W.D. Schneider, J.K. Gimzewski, B. Reihl, R.R. Schlittler, M. Tschudy: Phys. Rev. Lett. 74, 102 (1995)
D.L. Abraham, A. Veider, Ch. Schönenberger, H.P. Meier, D.J. Arent, S.F. Alvarado: Appl. Phys. Lett. 56, 1564 (1990)
J. Lambe, S.L. McCarthy: Phys. Rev. Lett. 37, 923 (1976)
D. Hone, B. Mühlschlegel, D.J. Scalapino: Appl. Phys. Lett. 33, 203 (1978)
R.W. Rendell, D.J. Scalapino, B. Mühlschlegel: Phys. Rev. Lett. 41, 1746 (1978)
J.R. Kirtley, T.N. Theis, J.C. Tsang, D.J. DiMaria: Phys. Rev. B 27, 4601 (1983)
R.D. Young, J. Ward, F. Scire: Rev. Sci. Instrum. 43, 999 (1972)
R.D. Young: Phvs. Today 42–49 (November 1972)
J.K. Gimzewski, J.K. Sass, R.R. Schlittler, J. Schott: Europhys. Lett. 8, 435 (1989)
J.H. Coombs, J.K. Gimzewski, B. Reihl, J.K. Sass, R.R. Schlittler: J. Microsc. 152, 325 (1988)
N. Venkateswaran, K. Sattler, M. Ge: Surf. Sci. 274, 199 (1992)
V. Sivel, R. Coratger, F. Ajustron, J. Beauvillain: Phys. Rev. B 45, 8634 (1992)
M.J. Gallagher, S. Howells, L. Yi, T. Chen, D. Sarid: Surf. Sci. 278, 270 (1992)
R. Berndt, J.K. Gimzewski, R.R. Schlittler: J. Vac. Sci. Technol. B 9, 573 (1991)
S. Ushioda, Y. Uehara, M. Kuwahara: Appl. Surf. Sci. 60/61, 448 (1992)
Recently, conductive transparent tips have been used for low-temperature luminescence studies; T. Murashita: J. Vac. Sci. Technol. B 15, 32 (1997)
R. Berndt: “Photon Emission from the Scanning Tunneling Microscope”; PhD thesis. University of Basel (1992)
S.F. Alvarado, Ph. Renaud: Phys. Rev. Lett. 68, 1387 (1992)
K. Takeuchi, Y. Uehara, S. Ushioda, S. Morita: J. Vac. Sci. Technol. B 9, 557 (1991)
I.I. Smolyaninov, E.V. Moskovets: Phys. Lett. A 165, 252 (1992)
R. Berndt, A. Baratoff, J.K. Gimzewski: in Scanning Tunneling Microscopy and Related Methods, NATO ASI Series E, Vol. 184, ed. by R.J. Behm, N. Garcia, and H. Rohrer (Kluwer, Dordrecht 1990) pp. 269–280
P. Johansson, R. Monreal, P. Apell: Phys. Rev. B 42, 9210 (1990)
B.N.J. Persson, A. Baratoff: Phys. Rev. Lett. 68, 3224 (1992)
R. Berndt, J.K. Gimzewski: Phys. Rev. B 45, 14095 (1992)
R. Berndt, J.K. Gimzewski, P. Johansson: Phys. Rev. Lett. 67, 3796 (1991)
B.N.J. Persson, A. Baratoff: Bull. Am. Phys. Soc. 35, 634 (1990)
P. Johansson, R. Monreal: Z. Phys. B 84, 269 (1991)
P. Johansson: “Theory of Inelastic Tunneling: Applications to DoubleBarrier Structures and Scanning Tunneling Microscopes” PhD thesis, Chalmers University (1991)
P. Johansson, R. Monreal, P. Apell: in Near Field Optics, NATO Advanced Studies Institutes Series E, Vol. 242, ed. by D.W. Pohl and D. Courjon (Kluwer, Dordrecht 1993) pp. 341–352
K.R. Welford, J.R. Sambles: J. Mod. Opt. 35, 1467 (1988)
R. Berndt, J.K. Gimzewski, P. Johansson: Phys. Rev. Lett. 71, 3493 (1993)
R. Berndt, J.K. Gimzewski: phys. stat. sol. A 131, 31 (1992)
R. Berndt, J.K. Gimzewski, R.R. Schlittler: Ultramicroscopy 42/44, 355 (1992)
N. Majlis, A. Levy Yeyati, F. Flores, R. Monreal: Phys. Rev. B 52, 12505 (1995)
M. Tsukada, T. Shimizu, K. Kobayashi: Ultramicrosc. 42/44, 360 (1992)
T. Shimizu, K. Kobayashi, M. Tsukada: Appl. Surf. Sci. 60/61, 454 (1992)
Y. Uehara, Y. Kimura, S. Ushioda, K. Takeuchi: Jpn. J. Appl. Phys. 31, 2465 (1992)
B. Laks, D.L. Mills: Phys. Rev. B 20, 4962 (1979)
I.I. Smolyaninov: in Near Field Optics, NATO Advanced Studies Institutes Series E, Vol. 242, ed. by D.W. Pohl and D. Courjon (Kluwer, Dordrecht 1993). pp.353–360
I.I. Smolyaninov, O. Keller: phys. stat. sol. B 185, 275 (1994)
I.I. Smolyaninov, M.S. Khaikin, V.S. Edelman, Phys. Lett. A 149, 410 (1990)
I.I. Smolyaninov, V.S. Edelman, V.V. Zavylow: Phys. Lett. A 158, 337 (1991)
G. Binnig, H. Rohrer: Helv. Phys. Acta 55, 726 (1982)
K.H. Gundlach: Solid State Electron. 9, 949 (1966)
A.J. Jason: Phys. Rev. 156, 266 (1967)
G. Binnig, K.H. Frank, H. Fuchs, N. Garcia, B. Reihl, H. Rohrer, F. Salvan, A.R. Williams: Phvs. Rev. Lett. 55. 991 (1985)
R.S. Becker, J.A. Golovchenko, B.S. Swartzentruber: Phys. Rev. Lett. 55, 987 (1985)
R. Berndt, J.K. Gimzewski: Ann. Physik 2, 133 (1993)
A. Otto, I. Mrozek, H. Grabhorn, W. Akemann: J. Phys.: Condens. Matter 4, 1143 (1992)
A. Madrazo, M. Nieto-Vesperinas, N. Garcia: Phys. Rev. B 53, 3654 (1996)
A.L. Vasquez de Parga, S.F. Alvarado: Phys. Rev. Lett. 72, 3726 (1994)
A.L. Vasquez de Parga, S.F. Alvarado: Europhys. Lett. 36, 577 (1996)
A.W. McKinnon, M.E. Welland, T.M.H. Wong, J.K. Gimzewski: Phys. Rev. B 48, 150 (1993)
K. Tto, R. Ohvama, Y. Uehara, S. Ushinda: Surf. Sci. 324, 282 (1995)
T. Umeno, R. Nishitani, A. Kasuya, Y. Nishina: Phys. Rey. B 54, 13499 (1996)
R. Berndt, J.K. Gimzewski: Phys. Rev. B48, 4746 (1993)
R. Berndt, J.K. Gimzewski: Surf. Sci. 269/270, 556 (1992)
R. Berndt, J.K. Gimzewski: in Atomic and Nanoscale modification of materials, NATO Advanced Studies Institutes Series E, Vol. 239, ed. by Ph. Avouris (Kluwer, Dordrecht 1993) , pp. 327–335
N. Kroo, J.P. Thost, M. Völker, W. Krieger, H. Walther: Europhys. Lett. 15, 289 (1991)
H. Rohrer: in Scanning Tunneling Microscopy and Related Methods, NATO ASI Series E, Vol. 184, ed. by R.J. Behm, N. Garcia, and H. Rohrer (Kluwer, Dordrecht 1990), pp.1–25
V. Sivel, R. Coratger, F. Ajustron, J. Beauvillain: Phys. Rev. B 50, 5628 (1994)
V. Sivel, R. Coratger, F. Ajustron, J. Beauvillain: Phys. Rev. B 51, 14598 (1995)
J.K. Gimzewski, R. Berndt, R.R. Schlittler, A.W. McKinnon, M.E. Welland, T. Wong, Ph. Dumas, M. Gu, C. Syrykh, F. Salvan, A. Hallimaoui: in Near Field Optics, NATO Advanced Studies Institutes Series E, Vol. 242, ed. by D.W. Pohl and D. Courjon (Kluwer, Dordrecht 1993), pp. 333–340
S. Ushioda: Sol. Stat. Comm. 84, 173 (1992)
Ph. Dumas, M. Gu, C. Syrykh, J.K. Gimzewski, I. Makarenko, A. Halimaoui. F. Salvan: Europhys. Lett. 23. 197 (1993)
M. Gu, C. Syrykh, Ph. Dumas, F. Salvan: J. Lumin. 57, 315 (1993)
Ph. Dumas, M. Gu, C. Syrykh, A. Halimaoui, F. Salvan, J.K. Gimzewski, R.R. Schlittler: J. Vac. Sci. Technol. B 12, 2064 (1994)
K. Ito, S. Ohyama, Y. Uehara, S. Ushioda: Appl. Phys. Lett. 67, 2536 (1995)
D.L. Abraham, S.F. Alvarado, H.P. Meier, D.J. Arent, Helv. Phys. Acta 63, 783 (1990)
R. Berndt, J.K. Gimzewski, R.R. Schlittler: in Scanned Probe Microscopies, Conference Series AIP, Vol. 231, ed. by K. Wickramasinghe (American Institute of Physics, New York 1992), pp. 328–336
L. Montelius, F. Owman, M.E. Pistol, L. Samuelson: Inst. Phys. Conf. Ser. Microsc. Semicond. Mater. Conf. 117, 719 (1991)
L. Montelius, M.E. Pistol, L. Samuelson: Ultramicrosc. 42/44, 210 (1992)
L. Samuelson, J. Lindahl, L. Montelius, M.E. Pistol: Phys. Scr. T 42, 149 (1992)
L. Samuelson, A. Gustafsson, J. Lindahl, L. Montelius, ME. Pistol, J.O. Malm, G. Vermeire, P. Demeester: J. Vac. Sci. Technol. B 12, 2521 (1994)
S.F. Alvarado: Phys. Rev. Lett. 75, 513 (1995)
Y. Kuk, P.J. Silverman: J. Vac. Sci. Technol. A 8, 289 (1990)
R.C. Alig, S. Bloom, C.W. Struck: Phys. Rev. B 22, 5565 (1980)
F. Steinrisser: Phys. Rev. Lett. 24, 213 (1970)
M. Wenderoth, M.J. Gregor, R.G. Ulbrich: Sol. Stat. Commun. 83, 535 (1992)
S.F. Alvarado, Ph. Renaud, H.P. Meier: Journ. Phys. IV 1, C6 (1991)
O. Albrektsen, D.J. Arent, H.P. Meier, H.W.M. Salemink: Appl. Phys. Lett. 57 31 (1990)
Ph. Renaud, S.F. Alvarado: Phys. Rev. B 44, 6340 (1991)
M. Pfister, M.B. Johnson, S.F. Alvarado, H.W.M. Salemink, U. Marti, D. Martin, F. Morier-Genoud, F.K. Reinhart: Appl. Phys. Lett. 65, 1168 (1994)
B.G. Yacobi, D.B. Holt: J. Appl. Phys. 59, R1 (1986)
S.F. Alvarado, Ph. Renaud, D.L. Abraham, Ch. Schönenberger, D.J. Arent, H.P. Meier: J. Vac. Sci. Technol. B 9, 409 (1991)
M. Bischoff, R. Elm, H. Pagnia, C. Sprössler: Intl. J. Electron. 73, 1091 (1992)
J. Horn, R. Richter, H.L. Hartnagel, C. Sprössler, M. Bischoff, H. Pagnia: Mater. Sci. Eng. B 20, 183 (1993)
M. Bischoff, B. Krebs, H. Pagnia, M. Stehle: Intl. J. Electron. 77, 205 (1994)
M. Stehle, M. Bischoff, H. Pagnia, J. Horn, N. Marx, B.L. Weiss, H.L. Hartnagel: J. Vac. Sci. Technol. B 13, 305 (1995)
J. Horn, N. Marx, B.L. Weiss, H.L. Hartnagel, M. Stehle, M. Bischoff, H. Pagnia: Materials Science Forum 185/188, 145 (1995)
R. Berndt, R. Gaisch, J.K. Gimzewski, B. Reihl, R.R. Schlittler, W.D. Schneider, M. Tschudy: Appl. Phys. A 57, 513 (1993)
R. Berndt, R. Gaisch, W.D. Schneider, J.K. Gimzewski, B. Reihl, R.R. Schlittler, M. Tschudy: Surf. Sci. 307/309, 1033 (1994)
A. Adams, J. Moreland, P.K. Hansma: Surf. Sci. 111, 351 (1981)
A. Rosenberg, D.P. DiLella: Chem. Phys. Lett. 233, 96 (1994)
M. Böhringer, R. Berndt: unpublished
E. Flaxer, O. Sneh, O. Cheshnovsky: Science 262, 2012 (1993)
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Berndt, R. (1998). Photon Emission from the Scanning Tunneling Microscope. In: Wiesendanger, R. (eds) Scanning Probe Microscopy. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-03606-8_5
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DOI: https://doi.org/10.1007/978-3-662-03606-8_5
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