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Ultraviolet and X-Ray Spectroscopy

  • Hans Kuzmany

Abstract

The higher the energy of the electromagnetic radiation the deeper we can look into the atoms and into the band structure of solids. Thus, for ultraviolet radiation and x rays a new area opens up for spectroscopic investigations. It becomes possible to analyze the structure of the valence band and of lower bands down to the core levels.

Keywords

Core Level Proportional Counter Light Quantum Core Line Exit Slit 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 12.1.
    H. Kuhlenkampff, L.S. Schmidt: Ann. Phys. 43, 494 (1943)CrossRefGoogle Scholar
  2. 12.2.
    Int. Tables of X-Ray Crystallography Vol. 4, J.A. Ibers, W.C. Hamilton (eds.) (The Kynoch Press, Birmingham 1974)Google Scholar
  3. 12.3.
    B.K. Agarawal: X-Ray Spectroscopy. An Introduction, 2nd edn., p.335, Springer Series in Opt. Sci., Vol.15 (Springer, Berlin, Heidelberg 1991)Google Scholar
  4. 12.4.
    P. Wobrauschek: J. Trace and Microprobe Techniques, 13, 83 (1995)Google Scholar
  5. 12.5.
    S. Hüfner: Photoelectron Spectroscopy, Springer Series in Solid-State Sci. Vol.82, p.455 (Springer, Berlin, Heidelberg 1995)Google Scholar
  6. 12.6.
    P. Steiner, H. Höchst, S. Hüfner: in Photoemission in Solids II, L. Ley, M. Cardona (eds.) p.349, Topics Appl. Phys., Vol.27 (Springer Berlin, Heidelberg 1979)CrossRefGoogle Scholar
  7. 12.7.
    D.W. Langer: Festkörperprobleme 13, 193 (1973)Google Scholar
  8. 12.8.
    N.V. Smith, G.K. Wertheim, S. Hüfner, M.M. Traum: Phys. Rev. B10, 3197 (1974)ADSGoogle Scholar
  9. 12.9.
    S. Hüfner, G.K. Wertheim, J.H. Wernick: Phys. Rev. B8, 4511 (1973)ADSGoogle Scholar
  10. 12.10.
    S. Hüfner: Photoelectron Spectroscopy, Springer Series in Solid-State Sci., Vol. 82, p.7 (Springer, Berlin, Heidelberg 1995)Google Scholar
  11. 12.11.
    D.M. Poirier, J. Weaver: Phys. Rev. B47, 10959 (1994)ADSGoogle Scholar
  12. 12.12.
    R.A. Pollak, L. Ley, S. Kowalczyk, D.A. Shirley, J.D. Joannopoulos, D.J. Chadi, M.L. Cohen: Phys. Rev. Lett. 29, 1103 (1972)ADSCrossRefGoogle Scholar
  13. 12.13.
    A. Karpfen: J. Chem. Phys. 75, 238 (1982)ADSCrossRefGoogle Scholar
  14. 12.14.
    K. Seki, U. Karlsson, R. Engelhardt, E.E. Koch: Chem. Phys. Lett. 103, 343 (1984)ADSCrossRefGoogle Scholar
  15. 12.15.
    J. Weaver: J. Phys. Chem. Sol. 53, 1433 (1992)ADSCrossRefGoogle Scholar
  16. 12.16.
    T.M. Hayes, J.B. Boyce: Solid State Phys. 37 173 (1982)CrossRefGoogle Scholar
  17. 12.17.
    J. Stöhr: NEXAFS Spectroscopy (Springer, Berlin, Heidelberg 1992)Google Scholar
  18. 12.18.
    S. Hüfner: Photoelectron Spectroscopy, Springer Series in Solid-State Sci., Vol. 82, p.437 (Springer, Berlin, Heidelberg 1995)Google Scholar

Additional Reading

  1. Agrawal B.K.: X-Ray Spectroscopy. An Introduction, 2nd edn., Springer Series in Opt. Sci., Vol.15 (Springer, Berlin, Heidelberg 1989)Google Scholar
  2. Briggs D., Seah M.P.: Practical Surface Analysis, Volume I, (John Wiley, Chichester 1992)Google Scholar
  3. Cardona M., Ley L. (eds.): Photoemission in Solids I, Topics Appl. Phys., Vol.26 (Springer, Berlin, Heidelberg 1978)Google Scholar
  4. Hayes T.M., Boyce J.B.: Extended x-ray absorption fine structure spectroscopy, Solid State Phys. Vol.37, 173 (1982)CrossRefGoogle Scholar
  5. Hüfner S.: Photoelectron Spectroscopy, Springer Series in Solid-State Sci., Vol. 82 (Springer, Berlin, Heidelberg 1995)Google Scholar
  6. Smith N.V.: Inverse Photoemission, Rep. Progress Phys. 51, 1227 (1988)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1998

Authors and Affiliations

  • Hans Kuzmany
    • 1
    • 2
  1. 1.Institut für FestkörperphysikUniversität WienWienAustria
  2. 2.Ludwig-Boltzmann-Institut für FestkörperphysikWienAustria

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