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Principles, Techniques, and Instrumentation of NEXAFS

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Book cover NEXAFS Spectroscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 25))

Abstract

In this chapter a basic question is addressed: How can the X-ray absorption signal from a single molecular layer on the surface of a bulk material be measured? In particular, electron yield and fluorescence yield detectors and experimental techniques are discussed and specific attention is given to the problems of normalization and background correction of experimental data.

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    Dr. Joachim Stöhr

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Stöhr, J. (1992). Principles, Techniques, and Instrumentation of NEXAFS. In: NEXAFS Spectroscopy. Springer Series in Surface Sciences, vol 25. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-02853-7_5

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  • DOI: https://doi.org/10.1007/978-3-662-02853-7_5

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-08113-2

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