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Electron Microscope Techniques for Surface Characterization

  • P. S. Turner
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 23)

Abstract

Electron microscopy in its various forms has developed over the past forty years into one of the major techniques of materials science. Surface analytical techniques are more recent additions to the materials scientists’ range of experimental methods for learning about materials properties. Microscopy and spectroscopy are complementary, and the use of one alone can result in an inadequate characterization of a material. In this chapter we will consider the various modes of electron microscopy and attempt to demonstrate the critical importance of applying electron optical imaging as well as surface analytical techniques in studies of surfaces.

Keywords

High Resolution Transmission Electron Microscope Objective Lens Chromatic Aberration Probe Diameter Image Tube 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 3.1
    J.A. Venables, DJ. Smith, J.M. Cowley: HREM, STEM, REM SEM and STM, Surf. Sci. 181, 235 (1987), see also J.A. Venables: Ultramicroscopy 7, 81 (1981)Google Scholar
  2. 3.2
    A. Howie, U. Valdre (eds.): Surface and Interface Characterization by Electron Optical Methods; Proc. NATO ASI, Erice 1987 ( Plenum, New York 1988 )Google Scholar
  3. 3.3
    P.K. Larson, PJ. Dobson (eds.): Reflection High-Energy Electron Diffraction and Reflection Imaging of Surfaces, Proc. NATO ASI, Veldhoven 1987 ( Plenum, New York 1988 )Google Scholar
  4. 3.4
    J.A. Venables, DJ. Smith (eds.): Proceedings of Workshop on Surfaces and Surface Reactions, Wickenberg Inn, Arizona, 1989: Ultramicroscopy 31 (1989)Google Scholar
  5. 3.5
    PJ. Goodhew: Electron Microscopy and Analysis (Wykeham, London 1975 ); PJ. Goodhew, FJ. Humphreys: Electron Microscopy and Analysis, 2nd edn. ( Taylor and Francis, London 1988 )Google Scholar
  6. 3.6
    P.W. Hawkes: Electron Optics and Electron Microscopy ( Taylor and Francis, London 1972 )Google Scholar
  7. 3.7
    I.M. Watt: The Principles and Practice of Electron Microscopy ( Cambridge University Press, Cambridge 1985 )Google Scholar
  8. 3.8
    J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori, E. Lifshin: Scanning Electron Microscopy and X-ray Microanalysis ( Plenum, New York 1981 )CrossRefGoogle Scholar
  9. 3.9
    L. Reimer: Scanning Electron Microscopy, Springer Ser. Opt. Sci. Vol. 45 ( Springer Berlin, Heidelberg 1985 )Google Scholar
  10. 3.10
    L. Reimer: Transmission Electron Microscopy,Springer Ser. Opt. Sci., Vol.36 (Springer Berlin, Heidelberg 1984); second edition published in 1989, also includes reflection EMGoogle Scholar
  11. 3.11
    J.M. Cowley: Diffraction Physics, 2nd edn. ( North Holland, Amsterdam 1981 )Google Scholar
  12. 3.12
    A.E. Ringwood: Safe Disposal of High Level Nuclear Reactor Wastes (ANU, Canberra 1978); J.A. Cooper, D.R. Cousens, R.A. Lewis, S. Myhra, R.L. Segall, R.StC. Smart, P.S. Turner: J. Am. Ceram. Soc. 68, 64 (1985)CrossRefGoogle Scholar
  13. 3.13
    A.F. Moodie, C.E. Warble: J. Cryst. Growth 10, 26 (1971)CrossRefGoogle Scholar
  14. 3.14
    D. Chems: Phil. Mag. 30, 549 (1974)CrossRefGoogle Scholar
  15. 3.15
    K. Kambe, G. Lehmpfuhl: Optik 42, 187 (1975); G. Lehmpfuhl, Y. Uchida: Ultramicroscopy 4, 275 (1979)CrossRefGoogle Scholar
  16. 3.16
    M. Klaua, H. Bethge: Ultramicroscopy 11, 125 (1983)CrossRefGoogle Scholar
  17. 3.17
    K. Takayanagi, Y. Tanashiro, M. Takahashi, S. Takahashi: J. Vac. Sci. Technol. A3, 1502 (1985)CrossRefGoogle Scholar
  18. 3.18
    L.D. Marks, DJ. Smith: Nature 303, 316 (1983); DJ. Smith: Surf. Sci. 178, 462 (1986)Google Scholar
  19. 3.19
    L.D. Marks: Surf. Sci. 139, 281 (1984)Google Scholar
  20. 3.20
    For reviews of REM, see K. Yagi: J. Appl. Cryst. 20, 147 (1987); K. Yagi: Electron microscopy of surface structure, Adv. Opt. Elec. Microsc. 11, 57 (1989)Google Scholar
  21. 3.21
    N. Osakabe, Y. Tanashiro, K. Yagi, G. Honjo: Japan J. Appl. Phys. 19, L309 (1980); Surf. Sci. 109, 353 (1981)Google Scholar
  22. 3.22
    Y. Thnishiro, K. Takayanagi: Ultramicroscopy 31, 20 (1989)CrossRefGoogle Scholar
  23. 3.23
    T. Nagatani, S. Saito: Proc. 11th Inn. Conf. Elec. Microsc., Kyoto, Japan (1986) 2101; K. Ogura, M. Kersker: Proc. 46th EMSA (1988) p. 204Google Scholar
  24. 3.24
    E. Bauer: Ultramicroscopy 17, 51 (1985); E. Bauer, M. Mundschau, W. Swiech, W. Telieps: Ultramicroscopy 31, 49 (1989)CrossRefGoogle Scholar
  25. 3.25
    G.G. Hembree, P.A. Crozier, J.S. Drucker, M. Krishnamurthy, J.A. Venables, J.M. Cowley: Ultramicroscopy 31, 111 (1989)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • P. S. Turner

There are no affiliations available

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