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Electron Microscope Techniques for Surface Characterization

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Surface Analysis Methods in Materials Science

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 23))

Abstract

Electron microscopy in its various forms has developed over the past forty years into one of the major techniques of materials science. Surface analytical techniques are more recent additions to the materials scientists’ range of experimental methods for learning about materials properties. Microscopy and spectroscopy are complementary, and the use of one alone can result in an inadequate characterization of a material. In this chapter we will consider the various modes of electron microscopy and attempt to demonstrate the critical importance of applying electron optical imaging as well as surface analytical techniques in studies of surfaces.

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Authors
  1. P. S. Turner
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Editor information

Editors and Affiliations

  1. Department of Physics, Newcastle University, Callaghan, 2308, Newcastle, NSW, Australia

    D. John O’Connor

  2. CSIRO Division of Materials Science and Technology, Locked Bag 33, 3168, Clayton, Victoria, Australia

    Brett A. Sexton

  3. South Australian Surface Technology Centre, University of South Australia, The Levels, 5095, Adelaide, South Australia, Australia

    Roger St. C. Smart

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© 1992 Springer-Verlag Berlin Heidelberg

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Turner, P.S. (1992). Electron Microscope Techniques for Surface Characterization. In: O’Connor, D.J., Sexton, B.A., Smart, R.S.C. (eds) Surface Analysis Methods in Materials Science. Springer Series in Surface Sciences, vol 23. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-02767-7_3

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  • DOI: https://doi.org/10.1007/978-3-662-02767-7_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-02769-1

  • Online ISBN: 978-3-662-02767-7

  • eBook Packages: Springer Book Archive

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