Electron Microscope Techniques for Surface Characterization

  • P. S. Turner
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 23)


Electron microscopy in its various forms has developed over the past forty years into one of the major techniques of materials science. Surface analytical techniques are more recent additions to the materials scientists’ range of experimental methods for learning about materials properties. Microscopy and spectroscopy are complementary, and the use of one alone can result in an inadequate characterization of a material. In this chapter we will consider the various modes of electron microscopy and attempt to demonstrate the critical importance of applying electron optical imaging as well as surface analytical techniques in studies of surfaces.


High Resolution Transmission Electron Microscope Objective Lens Chromatic Aberration Probe Diameter Image Tube 
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© Springer-Verlag Berlin Heidelberg 1992

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  • P. S. Turner

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