Bulk Defect Characterization Using Short Wavelength Measurements
We present a summary of the work we have done at Stanford on bulk defect evaluation in structural ceramics. A short wavelength approach to defect detection and characterization was taken. Our results indicate that defect detection and material characterization are successful in the short wavelength regime. Defect characterization, however, is more difficult using a single backscattering measurement. A high-frequency synthetic aperture imaging approach was developed to improve defect characterization and our preliminary results are very encouraging.
KeywordsDefect Detection Structural Ceramic Sidelobe Level Time Domain Response Defect Characterization
Unable to display preview. Download preview PDF.
- 3.Richardson, J. M., and Cohen, D., Rockwell International Science Center, private communication.Google Scholar
- 4.Khuri-Yakub, B. T., and Kino, G. S., Appl. Phys. Lett. 31 (2) (1977).Google Scholar
- 5.Liang, K., Khuri-Yakub, B. T., Chou, C. H., and Kino, G. S., “A Three-Dimensional Synthetic Focus System,” 1980 IEEE Ultrasonics Symp. Proc.Google Scholar