Bulk Defect Characterization Using Short Wavelength Measurements

  • C. H. Chou
  • K. Liang
  • B. T. Khuri-Yakub
  • G. S. Kino
Conference paper

Summary

We present a summary of the work we have done at Stanford on bulk defect evaluation in structural ceramics. A short wavelength approach to defect detection and characterization was taken. Our results indicate that defect detection and material characterization are successful in the short wavelength regime. Defect characterization, however, is more difficult using a single backscattering measurement. A high-frequency synthetic aperture imaging approach was developed to improve defect characterization and our preliminary results are very encouraging.

Keywords

Combustion Carbide Brittle Nitride Sapphire 

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References

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    Khuri-Yakub, B. T., and Kino, G. S., Appl. Phys. Lett. 31 (2) (1977).Google Scholar
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    Liang, K., Khuri-Yakub, B. T., Chou, C. H., and Kino, G. S., “A Three-Dimensional Synthetic Focus System,” 1980 IEEE Ultrasonics Symp. Proc.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1983

Authors and Affiliations

  • C. H. Chou
    • 1
  • K. Liang
    • 1
  • B. T. Khuri-Yakub
    • 1
  • G. S. Kino
    • 1
  1. 1.Edward. L. Ginzton LaboratoryStanford UniversityStanfordUSA

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