Abstract
Electron microscopy is the most effective technique to obtain directly and dynamically topographic information in the atomic scale, and results in the sensation of both “seeing is believing” and “the materials are living”. In the present paper, usefulness and applications of electron microscopy to materials science are discussed from the following two viewpoints, i.e., high-resolution electron microscopy and high-voltage electron microscopy.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
H. Fujita: Materials Trans. JIM 31, 523–537 (1990)
R.D. Heidenreich: Fundamentals of Transmission Electron Microscopy (Interscience, New York 1964)
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley, M.J. Whelan (eds.): Electron Microscopy of Thin Crystals, 2nd edn. (Krieger, New York 1977)
S. Amelinckx, R. Gevers, G. Remaut, J. Van Landuyt (eds.): Modern Diffraction and Imaging Techniques in Material Science, 2nd edn. (North-Holland, Amsterdam 1979)
U. Valdré (ed.): Electron Microscopy in Material Science (Academic, New York 1971)
U. Valdré, E. Ruedl (eds.): Electron Microscopy in Materials Science, Part I-IV (The European Communities, Luxembourg 1975)
G. Thomas, M.J. Goringe: Transmission Electron Microscopy of Materials (Wiley, New York 1979)
J.M. Cowley: Diffraction Physics, 2nd edn. (North-Holland, Amsterdam 1981)
R. Uyeda: Acta Cryst. A24, 175–181 (1968)
A. Howie: The theory of high energy electron diffraction, in Modern Diffraction and Imaging Techniques in Material Science, ed. by Amelinckx, 2nd edn. (North-Holland, Amsterdam 1979) pp. 295–339
A. Howie, M.J. Whelan: Proc. Roy. Soc. London A263, 217–235 (1961)
N. Kato: Acta Cryst. 16, 276–281 (1963); ibid 282-290
H.A. Bethe: Ann. Phys. 87, 55–129 (1928)
C.H. MacGillavry: Physica 7, 329–343 (1940)
R.D. Heidenreich: J. Appl. Phys. 20, 993–1010 (1949)
N. Kato: J. Phys. Soc. Jpn. 7, 397–406 (1952); ibid 406-14
H. Hashimoto, A. Howie, M.J. Whelan: Proc. Roy. Soc. London A269, 80–103 (1962)
A. Howie, M.J. Whelan: Proc. Roy. Soc. London A267, 206–230 (1962)
M.F. Ashby, L.M. Brown: Phil. Mag. 8, 1083–1103 (1963)
F. Nagata, A. Fukuhara: Jpn. J. Appl. Phys. 6, 1233–1235 (1967)
J.S. Lally, C.J. Humphreys, AJ.F. Metherell, R.M. Fisher: Phil. Mag. 25, 321–343 (1972)
C.J. Humphreys, L.E. Thomas, J.S. Lally, R.M. Fisher: Phil. Mag. 23, 87–114 (1971)
F. Fujimoto, N. Sumida, H. Fujita: J. Phys. Soc. Jpn. 42, 1274–1281 (1977)
H. Hashimoto: Jernkont Ann. 155, 480–490 (1971)
H. Hashimoto, R. Uyeda: Acta Cryst. 10, 143 (1957)
G.A. Bassett, J.W. Menter, D.W. Pashley: Proc. Roy. Soc. London A246, 345–368 (1958)
H. Hashimoto, M. Mannami, T. Naiki: Phil. Trans. Roy. Soc. London A253, 490–516 (1961)
H. Hashimoto, M. Mannami, T. Naiki: Phil. Trans. Roy. Soc. London A253, 459–489 (1961)
S. Miyake, K. Fujiwara, M. Tokonami, F. Fujimoto: Jpn. J. Appl. Phys. 3, 276–285 (1964)
J.C.H. Spence: Experimental High-Resolution Electron Microscopy (Clarendon, Oxford 1981)
S. Horiuchi: High-Resolution Electron Microscopy–Principle and Application (Kyoritsu, Tokyo 1987) (in Japanese)
J.W. Cowley, A.F. Moodie: Acta Cryst. 10, 609–619 (1957)
K. Ishizuka, N. Uyeda: Acta Cryst. A33, 740–749 (1977)
D. Van Dyck, W. Coene: Ultramicroscopy 15, 29–40, 41-50, 287-300 (1984)
D.J.H. Cockayne, I.L.F. Ray, M.J. Whelan: Phil. Mag. 20, 1265–1270 (1969)
D.J.H. Cockayne: Z. Naturforsch. 27a, 452–60 (1972)
D.J.H. Cockayne: J. Microsc. 98, 116–134 (1973)
K. Lonsdale: Proc. Roy. Soc. London A179, 315–320 (1942)
T. Evans, C. Phaal: Proc. Roy. Soc. London A270, 538–552 (1962)
G.S. Woods: Phil. Mag. 34, 993–1012 (1976)
A.R. Lang: Phil. Mag. 36, 495–500 (1977)
N. Sumida, A.R. Lang: Proc. Roy. Soc. London A419, 235–257 (1988)
N. Sumida, A.R. Lang: J. Appl. Cryst. 15, 266–274 (1982)
I.L.F. Ray, D.J.H. Cockayne: Proc. Roy. Soc. London A325, 543–554 (1971)
I.L.F. Ray, R.C. Crawford, D.J.H. Cockayne: Phil. Mag. 21, 1027–1032 (1970)
R.C. Crawford, I.L.F. Ray, D.J.H. Cockayne: Phil. Mag. 27, 1–7 (1973); J. Micros. 98, 196-199 (1973)
A.T. Winter, S. Mahajan, D. Brasen: Phil. Mag. A37, 315–326 (1978)
P. Pirouz, D.J.H. Cockayne, N. Sumida, P.B. Hirsch, A.R. Lang: Proc. Roy. Soc. London A386, 241–249 (1983)
D.W. Pashley, J.W. Menter, G.A. Bassett: Nature 179, 752–755 (1957)
A.R. Lang: Nature 220, 652–657 (1968)
L.A. Bursill, J.L. Hutchison, N. Sumida, A.R. Lang: Nature 292, 518–520 (1981)
J.C. Barry, L.A. Bursill, J.L. Hutchison: Phil. Mag. A51, 15–49 (1985)
P. Humble, J.K. Mackenzie, A. Olsen: Phil. Mag. A52, 605–621 (1985)
P. Humble, D.F. Lynch, A. Olsen: Phil. Mag. A52, 623–641 (1985)
R.F. Stephenson: The Partial Dissociation of Nitrogen Aggregates in Diamond by High Temperature-High Pressure Treatments. Ph.D. Thesis, University of Reading (1978)
J. Maguire: Platelets and Voidites in Diamond. Ph.D. Thesis, University of Reading (1983)
J.C. Barry, L.A. Bursill, J.L. Hutchison, A.R. Lang, G.M. Rackham, N. Sumida: Phil. Trans. Roy. Soc. London A321, 361–401 (1987)
P.B. Hirsch, P. Pirouz, J.C. Barry: Proc. Roy. Soc. London A407, 239–258 (1986)
P.B. Hirsch, J.L. Hutchison, J. Titchmarsh: Phil. Mag. A54, L49–L54 (1986)
J.L. Hutchison, L.A. Bursill: J. Micros. 131, 63–66 (1983)
J.C. Barry: Ultramicroscopy 20, 169–176 (1986)
N. Sumida, J.L. Hutchison, P.B. Hirsch: Proc. Diamond Conf. (Oxford 1987) pp. 79-81
G.S. Woods: Proc. Roy. Soc. London A407, 219–238 (1986)
T. Evans, G.S. Woods: Phil. Mag. 55, 295–299 (1987)
T. Mishima, N. Sumida, H. Fujita: Proc. 11th Int’l. Cong. on EM (Kyoto 1986) pp. 995-996
N. Sumida, T. Mishima, H. Fujita: J. Jpn. Inst. Metals 54, 1302–1307 (1990) (in Japanese)
E. Taguchi, N. Sumida, H. Fujita: J. Elect. Microsc. 39, 164–167 (1990)
F. Thon: Phase contrast electron microscopy, in Electron Microscopy in Materials Science, ed. by U. Valdré (Academic, New York 1971) pp. 571–625
Y. Hirotsu, R. Akada: Jpn. J. Appl. Phys. 23, L479–L481 (1984)
T. Hamada, F.E. Fujita: Jpn. J. Appl. Phys. 25, 318–327 (1986)
T. Sakata, H. Fujita, N. Sumida: Proc. 11th Int’l. Cong. on EM (Kyoto 1986) pp. 1545-1546
T. Sakata, N. Sumida, H. Fujita: Inst. Phys. Conf. Ser., No. 90 (IOP, Bristol 1987) pp. 171-174
T. Sakata, N. Sumida, H. Fujita: J. Jpn. Inst. Metals 54, 495–501 (1990) (in Japanese)
G. Thomas, H. Mori, H. Fujita, R. Sinclair: Scr. Metall. 16, 589–592 (1982)
S. Iijima, T. Ichihashi: Jpn. J. Appl. Phys. 24, L125–L128 (1985)
M. Mitome, Y. Tanishiro, K. Takayanagi: Z. Phys. D 12, 45–51 (1989)
T. Sakata, N. Sumida: to be published
C. Lu, H. Fujita: J. Elect. Microsc. 39, 412–416 (1990)
N. Sumida, H. Fujita: to be published.
H. Fujita, T. Taoka and NRIM 500 kV EM Group: J. Elect. Microsc. 14, 307–308 (1965)
H. Fujita: Jpn. J. Appl. Phys. 5, 729 (1969)
H. Fujita: J. Phys. Soc. Japan 21, 1605 (1966)
H. Fujita, Y. Kawasaki, E. Furubayashi, S. Kajiwara: Jpn. J. Appl. Phys. 11, 214–230 (1972)
H. Fujita, T. Tabata, K. Yoshida, N. Sumida, K. Katagiri: Jpn. J. Appl. Phys. 11, 1522–1536 (1972)
H. Fujita: J. Elect. Microsc. Techn. 3, 243–304 (1986)
H. Fujita: J. Elect. Microsc. Techn. 12, 201–218 (1989)
T. Tabata, H. Mori, H. Fujita: J. Phys. Soc. Japan 40, 1103–1111 (1976)
H. Fujita: Proc. 11th Int’l. Cong. on EM (Kyoto 1986) pp. 1025-1030
H. Fujita: ISIJ, International 30, 70–81 (1990)
H. Fujita: J. Phys. Soc. Jpn. 26, 331–338 (1969)
H. Fujita: J. Phys. Soc. Jpn 26, 1437–1445 (1969)
H. Fujita: J. Phys. Soc. Jpn. 16, 396–406 (1961)
H. Fujita: J. Elect. Microsc. Techn. 3, 45–56 (1986)
H. Fujita, S. Kimura: J. Phys. Soc. Jpn. 52, 157–167 (1983)
H. Fujita, H. Mori: Trans. JIM. 29 (suppl.), 37–40 (1988)
H. Mori, H. Fujita: Jpn. J. Appl. Phys. 21, L494–L496 (1982)
H. Fujita: Advanced Materials-II (The Joint Committee for Advanced Materials Research under the Auspieces of the Jpn. Soc. of Appl. Phys., the Ceramics Soc. Jpn. and Jpn. Inst. of Metals, 1990) pp. 113-122
H. Fujita: Ultramicroscopy, 39, 369–381 (1991)
H. Fujita: Trans. Materials Research Soc. Jpn. 2, 38–50 (1992)
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1994 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Fujita, H., Sumida, N. (1994). Usefulness of Electron Microscopy. In: Fujita, F.E. (eds) Physics of New Materials. Springer Series in Materials Science , vol 27. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-00461-6_8
Download citation
DOI: https://doi.org/10.1007/978-3-662-00461-6_8
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-662-00463-0
Online ISBN: 978-3-662-00461-6
eBook Packages: Springer Book Archive