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Einleitung

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Zusammenfassung

Das Prinzip des Raster-Elektronenmikroskopes (engl.: Scanning Electron Microscope, im folgenden kurz SEM) wurde von KNOLL (1935) in Berlin konzipiert. Die weitere historische Entwicklung des SEM ist an verschiedenen Stellen referiert worden (Oatley, 1965; Thornton, 1968; Pfefferkorn, 1970).

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Literatur zu § 1

  • Box, A. B.: In: Modern diffraction and imaging techniques in material science (Hrsg. S. Amelinckx u. a.), S. 655. Amsterdam-London 1970.

    Google Scholar 

  • Knoll, M.: Z. tech. Phys. 16, 467 (1935).

    Google Scholar 

  • Möllenstedt, G., Lenz, F.: Advan. Electron. Electron Phys. 18, 251 (1963).

    Article  Google Scholar 

  • Oatley, C. W., Nixon, W. C., Pease, R. F. W.: Advan. Electron. Electron Phys. 21, 181 (1965).

    Google Scholar 

  • Pfefferkorn, G.: Beitr. elektronenmikr. Direktabb. Oberfl, Bd. 3, S. 1. Münster 1970.

    Google Scholar 

  • Thornton, P. R.: Scanning electron microscopy. Applications to materials and device science. London: Chapman and Hall 1968.

    Google Scholar 

  • Wegmann, L.: Prakt. Metallographie, 5, 241 (1968).

    Google Scholar 

Monographien und Tagungsbände

  • Fujita, T., Tokunaga, M. D. J., Indue, H.: Atlas of scanning electron microscopy in medicine. Amsterdam-London-New York: Elsevier Publishing Company 1971.

    Google Scholar 

  • Hearle, J. W. S., Sparrow, J. T., Cross, P. M.: The use of scanning electron microscope. Oxford-New York-Toronto-Sydney-Braunschweig: Pergamon Press 1972.

    Google Scholar 

  • Heywood, V. H. (ed.): Scanning electron microscopy. Systematic and evolutionary applications. London-New York: Academic Press 1971.

    Google Scholar 

  • Oatley, C. W.: The scanning electron microscope, part I: The instrument. Cambridge: University Press 1972.

    Google Scholar 

  • Meylan, B. A., Butterfield, B. G.: Three-dimensional structure of wood. London: Chapman and Hall 1972.

    Google Scholar 

  • Thornton, P. R.: Scanning electron microscopy. Applications to materials and device science. London: Chapman and Hall 1968.

    Google Scholar 

  • Troughton, J., Donaldson, L. A.: Probing plant structure. London: Chapman and Hall 1972.

    Google Scholar 

  • Beiträge zur elektronenmikroskopischen Direktabbildung von Oberflächen (Hrsg. G. Pfefferkorn), Bd. 1 (1968), Bd. 2 (1969), Bd. 3 (1970), Bd. 4/2 ( 1971 ). Münster: Verlag R. A. Remy.

    Google Scholar 

  • Proceedings of the Annual Scanning Electron Microscope Symposium (ed. O. JoHARI), ab 1969 jährlich. Chicago: IIT Research Institute.

    Google Scholar 

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© 1973 Springer-Verlag Berlin Heidelberg

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Reimer, L., Pfefferkorn, G. (1973). Einleitung. In: Raster-Elektronenmikroskopie. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-00083-0_1

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  • DOI: https://doi.org/10.1007/978-3-662-00083-0_1

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-06102-1

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