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Scanning Tunneling Microscopy III pp 23–50Cite as

The Scattering Theoretical Approach to the Scanning Tunneling Microscope

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 29))

Abstract

In the interpretation of Scanning Tunneling Microscopy (STM) one often adopts the somewhat simplistic view that the tunnel current should be proportional to the local surface charge density at the position of the tip. More often than not this gives a reasonable interpretation of the STM-images. But in some cases it leads to an apparent contradiction with other available information on the sample surface. These contradictions are not always easy to resolve and some have been puzzling the STM-community for years.

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  1. G. Doyen
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Editors and Affiliations

  1. Institute of Applied Physics, University of Hamburg, Jungiusstr. 11, D-20355, Hamburg, Germany

    Roland Wiesendanger

  2. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    Hans-Joachim Güntherodt

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Doyen, G. (1993). The Scattering Theoretical Approach to the Scanning Tunneling Microscope. In: Wiesendanger, R., Güntherodt, HJ. (eds) Scanning Tunneling Microscopy III. Springer Series in Surface Sciences, vol 29. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-97470-0_3

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  • DOI: https://doi.org/10.1007/978-3-642-97470-0_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-97472-4

  • Online ISBN: 978-3-642-97470-0

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