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Theory of Non-contact Force Microscopy

  • Chapter
Scanning Tunneling Microscopy III

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 29))

Abstract

Different forces which may be present in non-contact scanning force microscopy are theoretically analyzed with respect to their typical magnitude and range. It is shown that van der Waals forces provide an ever-present contribution to long-range probe-sample interactions. If a liquid is present in the intervening gap between probe and sample, it is found that ionic double-layer forces may play an important role. If the probe is in very close proximity to the substrate, the discrete structure of intervening liquids may lead to characteristic solvation forces. For liquids being present as thin adsorbed films on top of the substrate, capillary forces turn out to be the source of very strong long-range probe-sample interactions.

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Authors
  1. U. Hartmann
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Editor information

Editors and Affiliations

  1. Institute of Applied Physics, University of Hamburg, Jungiusstr. 11, D-20355, Hamburg, Germany

    Roland Wiesendanger

  2. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    Hans-Joachim Güntherodt

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© 1993 Springer-Verlag Berlin Heidelberg

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Hartmann, U. (1993). Theory of Non-contact Force Microscopy. In: Wiesendanger, R., Güntherodt, HJ. (eds) Scanning Tunneling Microscopy III. Springer Series in Surface Sciences, vol 29. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-97470-0_12

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  • DOI: https://doi.org/10.1007/978-3-642-97470-0_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-97472-4

  • Online ISBN: 978-3-642-97470-0

  • eBook Packages: Springer Book Archive

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