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Scanning Tunneling Microscopy II pp 233–271Cite as

Nano-optics and Scanning Near-Field Optical Microscopy

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Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 28))

Abstract

The previous chapters have dealt mainly with scanning probe microscopies based upon the transport of electrons and upon static fields (forces).

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  1. D. W. Pohl
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  1. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056, Basel, Switzerland

    Roland Wiesendanger  & Hans-Joachim Güntherodt  & 

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Pohl, D.W. (1992). Nano-optics and Scanning Near-Field Optical Microscopy. In: Wiesendanger, R., Güntherodt, HJ. (eds) Scanning Tunneling Microscopy II. Springer Series in Surface Sciences, vol 28. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-97363-5_7

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  • DOI: https://doi.org/10.1007/978-3-642-97363-5_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-97365-9

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