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Nano-optics and Scanning Near-Field Optical Microscopy

  • D. W. Pohl
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 28)

Abstract

The previous chapters have dealt mainly with scanning probe microscopies based upon the transport of electrons and upon static fields (forces).

Keywords

Evanescent Wave Silver Film Optical Antenna Magnetic Energy Density Tunnel Contact 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 7.1
    See, for instance, A. Sommerfeld: Ann. d. Physik IV 28, 665–737 (1909)ADSCrossRefGoogle Scholar
  2. 7.2
    See, for instance, K.H. Drexhage: Interaction of Light with Monomolecular Dye Layers, in Progress in Optics, ed. by E. Wolf, Vol. XII (North-Holland, Amsterdam 1974) pp. 163–232Google Scholar
  3. 7.3
    T.H. Forster: Die Naturw. 33, 166–175 (1946)ADSCrossRefGoogle Scholar
  4. 7.4
    P. Moon: Field Theory Handbook (Springer, Berlin, Heidelberg 1961)MATHGoogle Scholar
  5. 7.5
    W. Denk, D.W. Pohl: J. Vac. Sci. Technol. B9, 510–513 (1991)Google Scholar
  6. 7.6
    J.H. Coombs, J.K. Girnzewski, B. Reihl, J.K. Sass, R.R. Schlittler: J. Microscopy 152, Pt. 2, 325–336 (1988)CrossRefGoogle Scholar
  7. 7.7
    J.K. Girnzewski, J.K. Sass, R.R. Schlittler, R.R. Schott: Europhys. Lett. 8, 435–440 (1989)ADSCrossRefGoogle Scholar
  8. 7.8
    U.Ch. Fischer, U.T. Dürig, D.W. Pohl: Scan. Microscopy 3, 1–7 (1989)Google Scholar
  9. 7.9
    R.C. Reddick, R.I. Warmack, T.L. Ferrell: Phys. Rev. B 39, 767–770 (1989)ADSCrossRefGoogle Scholar
  10. 7.10
    D. Courjon, K. Sarayeddine, M. Spajer: Opt. Commun. 71, 23–28 (1989)ADSCrossRefGoogle Scholar
  11. 7.11
    F. De Fornel, J.P. Goudonnet, L. Salomon, E. Lesniewska: An evanescent field optical microscope, in Proc. SPIE Vol. 1139 (SPIE, Washington 1989) pp. 77–84Google Scholar
  12. 7.12
    D.W. Pohl, W. Denk, M. Lanz: Appl. Phys. Lett. 44, 651–653 (1984)ADSCrossRefGoogle Scholar
  13. 7.13
    U. Dürig, D.W. Pohl, F. Rohner, J. Appl. Phys. 59, 3318–3327 (1986); see also 7.58ADSCrossRefGoogle Scholar
  14. 7.14
    E. Betzig, M. Isaacson, A. Lewis: Appl. Phys. Lett. 51, 2088–2090 (1987)ADSCrossRefGoogle Scholar
  15. 7.15
    See, for instance, A. Wokaun: Mol. Phys. 56,1–33 (1985)ADSCrossRefGoogle Scholar
  16. 7.16
    See, for instance, S.A. Schelkunoff: Electromagnetic Waves (Van Nostrand, Princetown 1943)Google Scholar
  17. 7.17
    R. Dill, K. Klark: Frequenz 44,36 (1990)CrossRefGoogle Scholar
  18. 7.18
    A. Baratoff, B.N.I. Persson: To be publishedGoogle Scholar
  19. 7.19
    D.W. Pohl: Scanning Near-Field Optical Microscopy (SNOM), in Advances in Optical and Electron Microscopy, Vol. 12, ed. by C.I.R. Sheppard, T. Mulvey (Academic, London 1991) pp. 243–312Google Scholar
  20. 7.20
    M. Born, E. Wolf: Principles of Optics (Pergamon, London 1959)MATHGoogle Scholar
  21. 7.21
    H. Rather: Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Mod. Phys. Vol. 111 (Springer, Berlin, Heidelberg 1988)Google Scholar
  22. 7.22
    R. Ruppin: Surface Sci. 58, 530–536 (1976)ADSCrossRefGoogle Scholar
  23. 7.23
    R. Ruppin: Surface Sci. 127, 108–118 (1983)ADSCrossRefGoogle Scholar
  24. 7.24
    P.F. Liao, A. Wokaun: J. Chem. Phys. 76, 751–752 (1982)ADSCrossRefGoogle Scholar
  25. 7.25
    P. Royer, J.P. Goudonnet, R.I. Warmak, T.L. Ferrell: Phys. Rev. B 35, 3753–3759 (1987)ADSCrossRefGoogle Scholar
  26. 7.26
    A. Sommerfeld, F. Renner: Ann. d. Physik V 41, 1–36 (1942)MathSciNetADSCrossRefGoogle Scholar
  27. 7.27
    A. Sommerfeld: Partial differential equations in physics, Vol. 1 of Pure and Applied Mathematics, ed. by P.A. Smith, S. Eilberg (Academic, New York 1949)Google Scholar
  28. 7.28
    H. Kuhn: J. Chem. Phys. 53, 101–108 (1970)ADSCrossRefGoogle Scholar
  29. 7.29
    W.H. Weber, C.F. Eagen: Opt. Lett. 4, 236–238 (1979)ADSCrossRefGoogle Scholar
  30. 7.30
    U.Ch. Fischer, D.W. Pohl: Phys. Rev. Lett. 62, 458–461 (1989)ADSCrossRefGoogle Scholar
  31. 7.31
    J. Gersten, A. Nitzan: J. Chem. Phys. 73, 3023–3037 (1980)ADSCrossRefGoogle Scholar
  32. 7.32
    R. Ruppin: Solid State Commun. 39, 903–906 (1981)ADSCrossRefGoogle Scholar
  33. 7.33
    B. Labani, C. Girard, D. Courjon, D. van Labeke: J. Opt. Soc. Am. B 7, 936–943 (1990)ADSCrossRefGoogle Scholar
  34. 7.34
    D. van Labeke, B. Labani, C. Girard: Chem. Phys. Lett. 162,399 (1969)CrossRefGoogle Scholar
  35. 7.35
    H.A. Bethe: Phys. Rev. 66, 163–182 (1944)MathSciNetADSMATHCrossRefGoogle Scholar
  36. 7.36
    C.I. Bouwkamp: On Bethe’s Theory of Diffraction by Small Holes, Phillips Research Reports 5, 321–332 (1950); On the diffraction of electromagnetic waves by small circular disks and holes, ibid., 401–422MathSciNetGoogle Scholar
  37. 7.37
    E.W. Marchaud, E. Wolf: J. Opt. Soc. Am. 59, 79 (1969)ADSCrossRefGoogle Scholar
  38. 7.38
    Y. Leviatan, J. Appl. Phys. 60, 1577–1583 (1986)ADSCrossRefGoogle Scholar
  39. 7.39
    E. Marx, E.C. Teague: Appl. Phys. Lett. 51, 2073–2075 (1987)ADSCrossRefGoogle Scholar
  40. 7.40
    A. Baños: Dipole radiation in the presence of a conducting half-space, in Int’l Series of Monographs in Electromagnetic Waves, Vol. 9 (Pergamon, Oxford 1966)Google Scholar
  41. 7.41
    M.J.O. Strutt: Ann. Physik V 1, 721–772 (1929)ADSCrossRefGoogle Scholar
  42. 7.42
    W. Lukosz, R.E. Kunz: J. Opt. Soc. Am. 67, 1607–1613 (1977a); W. Lukosz, R.E. Kunz: J. Opt. Soc. Am. 67, 1615–1619 (1977b)ADSCrossRefGoogle Scholar
  43. 7.43
    D.W. Pohl, U. Ch. Fischer, U. Dürig: Scanning near-field optical microscopy (SNOM): Basic principles and some recent developments, in Scanning Microscopy Technologies and Applications, ed. by E. Clayton Teague, Proc. SPIE 897 (SPIE, Washington 1988) pp. 84–90Google Scholar
  44. 7.44
    W. Denk, D.W. Pohl: In preparationGoogle Scholar
  45. 7.45
    E. Betzig, M. Isaacson, H. Barshatzky, A. Lewis, K. Lin: Near-field scanning optical microscopy (NSOM), in Scanning Microscopy Technologies and Applications, ed. by E. Clayton Teague, Proc. SPIE 897 (SPIE, Washington 1988) pp. 91–99Google Scholar
  46. 7.46
    A. Harootunian, E. Betzig, M. Isaacson, A. Lewis: Appl. Phys. Lett. 49, 674–676 (1986)ADSCrossRefGoogle Scholar
  47. 7.47
    K. Lieberman, S. Harush, A. Lewis, R. Kopelman: Science 247, 59–61 (1990)ADSCrossRefGoogle Scholar
  48. 7.48
    E. Betzig, J. Wiener, R. Kostelak: Progress in near field scanning optical microscopy, presented at 5th Int’l Conf. on Scanning Tunneling Microscopy/Spectroscopy (STM’ 90) and 1st Int’l Conf. on Nanometer Scale Science and Technology (NANO I), Baltimore, USA, July 23–27, 1990Google Scholar
  49. 7.49
    U. Ch. Fischer: J. Vac. Sci. Technol. B 3, 386–390 (1985)CrossRefGoogle Scholar
  50. 7.50
    U. Ch. Fischer, U.T. Dürig, D.W. Pohl: Appl. Phys. Lett. 52, 249–251 (1988)ADSCrossRefGoogle Scholar
  51. 7.51
    L. Bumm: Private communicationGoogle Scholar
  52. 7.52
    U. Ch. Fischer: Resolution and contrast generation in scanning near-field optical microscopy, in Scanning Tunneling Microscopy and Related Methods, ed. by R.J. Behm, N. Garcia H. Rohrer, NATO ASI Series E: Applied Sciences Vol. 184 (Kluwer, Dordrecht 1990) p. 475Google Scholar
  53. 7.53
    R. Berndt, A. Baratoff, J.K. Gimzewski: Scanning tunneling optical microscopy (STOM) of silver nanostructures, in Scanning Tunneling Microscopy and Related Methods, ed. by R.J. Behm, N. Garcia, H. Rohrer, NATO ASI Series E: Applied Sciences Vol. 184 (Kluwer, Dordrecht 1990) p. 269Google Scholar
  54. 7.54
    M.J. Bloemer, J.P. Mantovani, J.P. Goudonnet, D.R. James, R.J. Warmak, T.L. Ferrell: Phys. Rev. B 35, 5947–5954 (1987)ADSCrossRefGoogle Scholar
  55. 7.55
    D.L. Abraham, A. Veider, C. Schönenberger, H.P. Meier, D.J. Arent, S.F. Alvarado: Appl. Phys. Lett. 56, 1564–1566 (1990)ADSCrossRefGoogle Scholar
  56. 7.56
    U. Ch. Fischer, J. Opt. Soc. Am. B 3, 1239–1244 (1986)ADSCrossRefGoogle Scholar
  57. 7.57
    R.S. Becker, V.E. Anderson, R.D. Birkhoff, T.L. Ferrell, R.H. Ritchie: Can. J. Phys. 59,521–529 (1981)ADSCrossRefGoogle Scholar
  58. 7.58
    D.W. Pohl, W. Denk, U. Dürig: Optical stethoscopy: Imaging with λ/20, in Micron and Submicron Integrated Circuit Metrology, ed. by K.M. Monahan, Proc. SPIE 565 (SPIE, Washington 1985) pp. 56–61Google Scholar
  59. 7.59
    Y. Leviatan: IEEE Trans. Microw. Theory Tech. MTT-36, 44–52 (1988)ADSCrossRefGoogle Scholar
  60. 7.60
    D.W. Pohl, U. Ch. Fischer, U.T. Dürig: J. Microscopy 152, 853–861 (1988)CrossRefGoogle Scholar
  61. 7.61
    D.W. Pohl, U. Dürig, J.K. Gimzewski: Direct access storage unit, European Patent Application No. 0247219 (1986)Google Scholar
  62. 7.62
    E.H. Synge: Phil. Mag. 6, 356–362 (1928)Google Scholar
  63. 7.63
    J.A. O’Keefe: J. Opt. Soc. Am. 46, 359 (1956)CrossRefGoogle Scholar
  64. 7.64
    E.A. Ash, G. Nichols: Nature 237, 510–515 (1972)ADSCrossRefGoogle Scholar
  65. 7.65
    G.A. Massey: Appl. Opt. 23, 658–660 (1984)ADSCrossRefGoogle Scholar
  66. 7.66
    D.W. Pohl: Optical near-field scanning microscope, European Patent 82111974.0, filed 12/27/82; US Patent 4,604,520 (1982/86)Google Scholar
  67. 7.67
    A. Lewis, M. Isaacson, A. Harootunian, A. Muray: Ultramicroscopy 13, 227–231 (1984)CrossRefGoogle Scholar
  68. 7.68
    U.Ch. Fischer, H.P. Zingsheim: Appl. Phys. Lett. 40, 195–197 (1982)ADSCrossRefGoogle Scholar
  69. 7.69
    G.A. Massey, J.A. Davis, S.M. Katnik, E. Omon: Appl. Opt. 24, 1498–1501 (1985)ADSCrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • D. W. Pohl

There are no affiliations available

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