Advertisement

STM on Layered Materials

Chapter
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 20)

Abstract

Layered materials [6.1] exhibit many properties which make them special with regards to STM studies and in scanning probe microscopy in general. Thus an entire chapter is devoted to STM investigations of layered materials, although, depending on the electrical conductivity of the layered materials, these investigations could also have been included in the chapters on metals or semiconductors. In contrast, insulating layered materials cannot be studied by STM but only by its relative, atomic force microscopy (AFM). Such investigations are reported in the chapter entitled “Scanning Force Microscopy” in the second volume on “Scanning Tunneling Microscopy”.

Keywords

Charge Density Wave Highly Orientate Pyrolytic Graphite Graphite Surface Atomic Lattice Pure Graphite 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 6.1
    For a comprehensive overview of layered materials see:Physics and Chemistry of Materials with Layered Structures, Vol. 1–6 (Reidel, Dordrecht)Google Scholar
  2. 6.2
    G. Binnig, H. Fuchs, Ch. Gerber, H. Rohrer, E. Stoll, E. Tosatti: Europhys. Lett. 1, 31 (1986)ADSGoogle Scholar
  3. 6.3
    Sangil Park, C.F. Quate: Appi. Phys. Lett. 48, 112 (1986)ADSGoogle Scholar
  4. 6.4
    LP. Batra, N. Garcia, H. Rohrer, H. Salemink, E. Stoll, S. Ciraci: Surf. Sci. 181, 126 (1987)ADSGoogle Scholar
  5. 6.5
    D. Tomanek, S.G. Louie, H.J. Mamin, D.W. Abraham, R.E. Thomson, E. Ganz, J. Clarke: Phys. Rev. B 35, 7790 (1987)ADSGoogle Scholar
  6. 6.6
    D. Tomanek, S.G. Louie: Phys. Rev. B37, 8327 (1988)ADSGoogle Scholar
  7. 6.7
    J. Tersoff: Phys. Rev. Lett. 57, 440 (1986)ADSGoogle Scholar
  8. 6.8
    J. Tersoff, D.R. Hamann: Phys. Rev. B31, 805 (1985)ADSGoogle Scholar
  9. 6.9
    A. Selloni, P. Carnevali, E. Tosatti, C.D. Chen: Phys. Rev. B31, 2602 (1985)ADSGoogle Scholar
  10. 6.10
    B. Reihl, J.K. Gimzewski, J.M. Nicholls, E. Tosatti: Phys. Rev. B33, 5770 (1986)ADSGoogle Scholar
  11. 6.11
    H. Fuchs, E. Tosatti: Europhys. Lett. 3, 745 (1987)ADSGoogle Scholar
  12. 6.12
    J.M. Soler, A.M. Baro, N. Garcia, H. Rohrer: Phys. Rev. Lett. 57, 444 (1986)ADSGoogle Scholar
  13. 6.13
    S.L. Tang, J. Bokor, R.H. Storz: Appi. Phys. Lett. 52, 188 (1988)ADSGoogle Scholar
  14. 6.14
    C.M. Mate, R. Erlandsson, G.M. McClelland, S. Chiang: Surf. Sci. 208, 473 (1989)ADSGoogle Scholar
  15. 6.15
    H.J. Mamin, E. Ganz, D.W. Abraham, R.E. Thomson, J. Clarke: Phys. Rev. B34, 9015 (1986)ADSGoogle Scholar
  16. 6.16
    J.B. Pethica: Phys. Rev. Lett. 57, 3235 (1986)ADSGoogle Scholar
  17. 6.17
    D.P.E. Smith, G. Binnig, C.F. Quate: Appi. Phys. Lett. 49, 1166 (1986)ADSGoogle Scholar
  18. 6.18
    S. Ciraci, LP. Batra: Phys. Rev. B36, 6194 (1987)ADSGoogle Scholar
  19. 6.19
    E. Tekman, S. Ciraci: Phys. Scripta 38, 486 (1988)ADSGoogle Scholar
  20. 6.20
    E. Tekman, S. Ciraci: Phys. Rev. B40, 10286 (1989)ADSGoogle Scholar
  21. 6.21
    S. Ciraci, A. Baratoff, LP. Batra: Phys. Rev. B41, 2763 (1990)ADSGoogle Scholar
  22. 6.22
    S. Ciraci, E. Tekman: Phys. Rev. B40, 11969 (1989)ADSGoogle Scholar
  23. 6.23
    C.J. Chen: Mod. Phys. Lett. B5, 107 (1991)ADSGoogle Scholar
  24. 6.24
    H.A. Mizes, Sangil Park, W.A. Harrison: Phys. Rev. B36, 4491 (1987)ADSGoogle Scholar
  25. 6.25
    T.R. Albrecht, H.A. Mizes, J. Nogami, Sangil Park, C.F. Quate: Appi. Phys. Lett. 52, 362 (1988)ADSGoogle Scholar
  26. 6.26
    K. Kobayashi, M. Tsukada: J. Vac. Sci. Technol. A8, 170 (1990)ADSGoogle Scholar
  27. 6.27
    G. Binnig: Specul. Sci. Technol. 10, 345 (1987)Google Scholar
  28. 6.28
    A. Bryant, D.P.E. Smith, G. Binnig, W.A. Harrison, C.F. Quate: Appi. Phys. Lett. 49, 936 (1986)ADSGoogle Scholar
  29. 6.29
    H.A. Mizes, W.A. Harrison: J. Vac. Sci. Technol. A6, 300 (1988)ADSGoogle Scholar
  30. 6.30
    M.R. Soto: J. Microsc. 152, 779 (1988)Google Scholar
  31. 6.31
    M.R. Soto: Surf. Sci. 225, 190 (1990)ADSGoogle Scholar
  32. 6.32
    H.A. Mizes, J.S. Foster: Science 244, 559 (1989)ADSGoogle Scholar
  33. 6.33
    J.P. Rabe, M. Sano, D. Batchelder, A.A. Kalatchev: J. Microsc. 152, 573 (1988)Google Scholar
  34. 6.34
    D. Anselmetti: “Rastertunnelmikroskopie an Synthetischen Metallen”; Ph.D. Thesis, University of Basel (1990)Google Scholar
  35. 6.35
    R. Coratger, A. Claverie, F. Ajustron, J. Beauvillain: Surf. Sci. 227, 7 (1990)ADSGoogle Scholar
  36. 6.36
    D.W. Abraham, K. Sattler, E. Ganz, H.J. Mamin, R.E. Thomson, J. Clarke: Appi. Phys. Lett. 49, 853 (1986)ADSGoogle Scholar
  37. 6.37
    A.M. Barò, A. Bartolome, L. Vazquez, N. Garcia, R. Reifenberger, E. Choi, R.P. Andres: Appi. Phys. Lett. 51, 1594 (1987)ADSGoogle Scholar
  38. 6.38
    E. Ganz, K. Sattler, J. Clarke: Phys. Rev. Lett. 60, 1856 (1988)ADSGoogle Scholar
  39. 6.39
    E. Ganz, K. Sattler, J. Clarke: J. Vac. Sci. Technol. A6, 419 (1988)ADSGoogle Scholar
  40. 6.40
    E. Ganz, K. Sattler, J. Clarke: Surf. Sci. 219, 33 (1989)ADSGoogle Scholar
  41. 6.41
    A. Humbert, R. Pierrisnard, S. Sangay, C. Chapon, C.R. Henry, C. Claeys: Europhys. Lett. 10, 533 (1989)ADSGoogle Scholar
  42. 6.42
    M.S. Dresselhaus, G. Dresselhaus: Adv. Phys. 30, 139 (1981)ADSGoogle Scholar
  43. 6.43
    P. Pfluger, H.-J. Güntherodt: In Festkörperprobleme (Advances in Solid State Physics) Vol. XXI, ed. by J. Treusch (Vieweg, Braunschweig 1981) pp. 271Google Scholar
  44. 6.44
    M.S. Dresselhaus: Synth. Met. 12, 5 (1985)Google Scholar
  45. 6.45
    W. Rüdorff: Adv. Inorg. Chem. 1, 223 (1959)Google Scholar
  46. 6.46
    J. Schneir, R. Sonnenfeld, P.K. Hansma, J. Tersoff: Phys. Rev. B34, 4979 (1986)ADSGoogle Scholar
  47. 6.47
    D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt: Phys. Rev. B39, 11135 (1989)ADSGoogle Scholar
  48. 6.48
    D. Anselmetti, R. Wiesendanger, V. Geiser, H.R. Hidber, H.-J. Güntherodt: J. Microsc. 152, 509 (1988)Google Scholar
  49. 6.49
    R. Wiesendanger, D. Anselmetti, V. Geiser, H.R. Hidber, H.-J. Güntherodt: Synth. Met. 34, 175 (1989)Google Scholar
  50. 6.50
    S.P. Kelty, C.M. Lieber: Phys. Rev. B40, 5856 (1989)ADSGoogle Scholar
  51. 6.51
    S.P. Kelty, C.M. Lieber: J. Phys. Chem. 93, 5983 (1989)Google Scholar
  52. 6.52
    D. Anselmetti, V. Geiser, G. Overney, R. Wiesendanger, H.-J. Güntherodt: Phys. Rev. B42, 1848 (1990)ADSGoogle Scholar
  53. 6.53
    D. Anselmetti, V. Geiser, D. Brodbeck, G. Overney, R. Wiesendanger, H.-J. Güntherodt: Synth. Met. 38, 157 (1990)Google Scholar
  54. 6.54
    S. Gauthier, S. Rousset, J. Klein, W. Sacks, M. Berlin: J. Vac. Sci. Technol. A6, 360 (1988)ADSGoogle Scholar
  55. 6.55
    S. Gauthier, S. Rousset, J. Klein, W. Sacks, M. Berlin: In The Structure of Surfaces, ed. by J.F. van der Veen, M.A. Van Hove, Springer Ser. Surf. Sci., Vol. 11 (Springer, Berlin, Heidelberg 1988) pp. 71Google Scholar
  56. 6.56
    D.M. Hwang, N.W. Parker, M. Utlaut, A.V. Crewe: Phys. Rev. B27, 1458 (1983)ADSGoogle Scholar
  57. 6.57
    C.H. Oik, J. Heremans, M.S. Dresselhaus, J.S. Speck, J.T. Nicholls: Phys. Rev. B42, 7524 (1990)ADSGoogle Scholar
  58. 6.58
    M. Tanaka, W. Mizutani, T. Nakashizu, N. Morita, S Yamazaki, H. Bando, M. Ono, K. Kajimura: J. Microsc. 152, 183 (1988)Google Scholar
  59. 6.59
    A. Selloni, C.D. Chen, E. Tosatti: Phys. Scripta 38, 297 (1988)ADSGoogle Scholar
  60. 6.60
    X. Qin, G. Kirczenow: Phys. Rev. B39, 6245 (1989)ADSGoogle Scholar
  61. 6.61
    X. Qin, G. Kirczenow: Phys. Rev. B41, 4976 (1990)ADSGoogle Scholar
  62. 6.62
    M. Lagues, J.E. Fischer, D. Marchand, C. Fretigny: Solid State Commun. 67, 1011 (1988)ADSGoogle Scholar
  63. 6.63
    D. Marchand, C. Fretigny, N. Lecomte, M. Lagues: Synth. Met. 23, 165 (1988)Google Scholar
  64. 6.64
    D. Tomanek, G. Overney, H. Miyazaki, S.D. Mahanti, H.-J. Güntherodt: Phys. Rev. Lett. 63, 876 (1989)ADSGoogle Scholar
  65. 6.65
    J.A. Wilson, A.D. Yoffe: Adv. Phys. 18, 193 (1969)ADSGoogle Scholar
  66. 6.66
    H. Tokumoto, H. Bando, W. Mizutani, M. Okano, M. Ono, H. Murakami, S. Okayama, Y. Ono, K. Watanabe, S. Wakiyama, F. Sakai, K. Endo, K. Kajimura: Jpn. J. Appi. Phys. 25, L621 (1986)ADSGoogle Scholar
  67. 6.67
    K. Kajimura, H. Bando, K. Endo, W. Mizutani,-H. Murakami, M. Okano, S. Okayama, M. Ono, Y. Ono, H. Tokumoto, F. Sakai, K. Watanabe, S. Wakiyama: Surf. Sci. 181, 165 (1987)ADSGoogle Scholar
  68. 6.68
    H. Bando, H. Tokumoto, W. Mizutani, K. Watanabe, M. Okano, M. Ono, H. Murakami, S. Okayama, Y. Ono, S. Wakiyama, F. Sakai, K. Endo, K. Kajimura: Jpn. J. Appi. Phys. 26, L41 (1987)ADSGoogle Scholar
  69. 6.69
    R.V. Coleman, B. Giambattista, A. Johnson, W.W. McNairy, G. Slough, P.K. Hansma, B. Drake: J. Vac. Sci. Technol. A6, 338 (1988).ADSGoogle Scholar
  70. 6.70
    D.C. Dahn, M.O. Watanabe, B.L. Blackford, M.H. Jericho: J. Appi. Phys. 63, 315 (1988)ADSGoogle Scholar
  71. 6.71
    M. Watanabe, D.C. Dahn, B. Blackford, M.H. Jericho: J. Microsc. 152, 175 (1988)Google Scholar
  72. 6.72
    G.W. Stupian, M.S. Leung: Appi. Phys. Lett. 51, 1560 (1987)ADSGoogle Scholar
  73. 6.73
    M. Weimer, J. Kramar, C. Bai, J.D. Baldeschwieler: Phys. Rev. B37, 4292 (1988)ADSGoogle Scholar
  74. 6.74
    D. Sarid, T.D. Henson, N.R. Armstrong, L.S. Bell: Appi. Phys. Lett. 52, 2252 (1988)ADSGoogle Scholar
  75. 6.75
    T.D. Henson, D. Sarid, L.S. Bell: J. Microsc. 152, 467 (1988)Google Scholar
  76. 6.76
    T. Ichinokawa, T. Ichinose, M. Tohyama, H. Itoh: J. Vac. Sci. Technol A8, 500 (1990)ADSGoogle Scholar
  77. 6.77
    S. Akari, M. Stachel, H. Birk, E. Schreck, M. Lux, K. Dransfeld: J. Microsc. 152, 521 (1988)Google Scholar
  78. 6.78
    S.L. Tang, R.V. Kasowski, B.A. Parkinson: Phys. Rev. B39, 9987 (1989)ADSGoogle Scholar
  79. 6.79
    H. Bando, N. Morita, H. Tokumoto, W. Mizutani, K. Watanabe, A. Homma, S. Wakiyama, M. Shigeno, K. Endo, K. Kajimura: J. Vac. Sci. Technol A6, 344 (1988)ADSGoogle Scholar
  80. 6.80
    T.R. Albrecht: “Advances in Atomic Force Microscopy and Scanning Tunneling Microscopy”: Ph.D. Thesis, Stanford University (1989)Google Scholar
  81. 6.81
    J.A. Wilson, F.J. DiSalvo, S. Mahajan: Adv. Phys. 24, 117 (1975)ADSGoogle Scholar
  82. 6.82
    G. Grüner: Rev. Mod. Phys. 60, 1129 (1988)ADSGoogle Scholar
  83. 6.83
    R.E. Peierls: Quantum Theory of Solids (Oxford University Press, Oxford 1955) pp. 108zbMATHGoogle Scholar
  84. 6.84
    R.V. Coleman, B. Drake, P.K. Hansma, G. Slough: Phys. Rev. Lett. 55, 394 (1985)ADSGoogle Scholar
  85. 6.85
    R.V. Coleman, B. Giambattista, P.K. Hansma, A. Johnson, W.W. McNairy, C.G. Slough: Adv. Phys. 37, 559 (1988)ADSGoogle Scholar
  86. 6.86
    R.V. Coleman, B. Drake, B. Giambattista, A. Johnson, P.K. Hansma, W.W. McNairy, G. Slough: Phys. Scripta 38, 235 (1988)ADSGoogle Scholar
  87. 6.87
    C.G. Slough, W.W. McNairy, R.V. Coleman, B. Drake, P.K. Hansma, Phys. Rev. B34, 994 (1986)ADSGoogle Scholar
  88. 6.88
    R.V. Coleman, W.W. McNairy, C.G. Slough, P.K. Hansma, B. Drake: Surf. Sci. 181, 112 (1987)ADSGoogle Scholar
  89. 6.89
    B. Giambattista, A. Johnson, R.V. Coleman, B. Drake, P.K. Hansma: Phys. Rev. B37, 2741, 1958ADSGoogle Scholar
  90. 6.90
    R.E. Thomson, U. Walter, E. Ganz, J. Clarke, A. Zettl, P. Rauch, F.J. DiSalvo: Phys. Rev. B38, 10734 (1988)ADSGoogle Scholar
  91. 6.91
    R.E. Thomson, U. Walter, E. Ganz, P. Rauch, A. Zettl, J. Clarke: J. Microsc. 152, 771 (1988)Google Scholar
  92. 6.92
    G. Gammie, S. Skala, J.S. Hubacek, R. Brockenbrough, W.G. Lyons, J.R. Tucker, J.W. Lyding: J. Microsc. 152, 497 (1988)Google Scholar
  93. 6.93
    X.L. Wu, C.M. Lieber: Science 243, 1703 (1989)ADSGoogle Scholar
  94. 6.94
    X.L. Wu, C.M. Lieber: Phys. Rev. Lett. 64, 1150 (1990)ADSGoogle Scholar
  95. 6.95
    E. Meyer, D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt, F. Lévy, H. Berger: Europhys. Lett. 9, 695 (1989)ADSGoogle Scholar
  96. 6.96
    E. Meyer, R. Wiesendanger, D. Anselmetti, H.R. Hidber, H.-J. Güntherodt, F. Lévy, H. Berger: J. Vac. Sci. Technol. A8, 495 (1990)ADSGoogle Scholar
  97. 6.97
    C.G. Slough, B. Giambattista, A. Johnson, W.W. McNairy, C. Wang, R.V. Coleman: Phys. Rev. B37, 6571 (1988)ADSGoogle Scholar
  98. 6.98
    B. Giambattista, A. Johnson, W.W. McNairy, C.G. Slough, R.V. Coleman: Phys. Rev. B38, 3545 (1988)ADSGoogle Scholar
  99. 6.99
    M. Tanaka, W. Mizutani, T. Nakashizu, N. Morita, S. Yamazaki, H. Bando, M. Ono, K. Kajimura: J. Microsc. 152, 183 (1988)Google Scholar
  100. 6.100
    M. Tanaka, W. Mizutani, T. Nakashizu, S. Yamazaki, H. Tokumoto, H. Bando, M. Ono, K. Kajimura: Jpn. J. Appi. Phys. 28, 473 (1989)ADSGoogle Scholar
  101. 6.101
    C. Wang, B. Giambattista, C.G. Slough, R. Coleman: Bull. Am. Phys. Soc. 35, 209 (1990)Google Scholar
  102. 6.102
    G. Boato, P. Cantini, R. Colella: Phys. Rev. Lett. 42, 1635 (1979)ADSGoogle Scholar
  103. 6.103
    P. Cantini, G. Boato, R. Colella: Physica B99, 59 (1980)Google Scholar
  104. 6.104
    S. Baumgartner: “Rastertunnelmikroskopie auf Ladungsdichtewellen”; Diploma Thesis, University of Basel (1990)Google Scholar
  105. 6.105
    X.L. Wu, P. Zhou, C.M. Lieber: Phys. Rev. Lett. 61, 2604 (1988)ADSGoogle Scholar
  106. 6.106
    X.L. Wu, P. Zhou, C.M. Lieber: Nature 335, 55 (1988)ADSGoogle Scholar
  107. 6.107
    X.L. Wu, C.M. Lieber: J. Am. Chem. Soc. 111, 2731 (1989)Google Scholar
  108. 6.108
    X.L. Wu, C.M. Lieber: Phys. Rev. B41, 1239 (1990)ADSGoogle Scholar
  109. 6.109
    X.L. Wu, C.M. Lieber: J. Am. Chem. Soc. 110, 5200 (1988)Google Scholar
  110. 6.110
    C.B. Scruby, P.M. Williams, G.S. Parry: Phil. Mag. 31, 255 (1975)ADSGoogle Scholar
  111. 6.111
    K. Nakanishi, H. Shiba: J. Phys. Soc. Jpn. 43, 1839 (1977)ADSGoogle Scholar
  112. 6.112
    K. Nakanishi, H. Takatera, Y. Yamada, H. Shiba: J. Phys. Soc. Jpn. 43, 1509 (1977)ADSGoogle Scholar
  113. 6.113
    A. Yamamoto: Phys. Rev. B27, 7823 (1983)ADSGoogle Scholar
  114. 6.114
    J.W. Lyding, J.S. Hubacek, G. Gammie, S. Skala, R. Brockenbrough, J.R. Shapley, M.P. Keyes: J. Vac. Sci. Technol. A6, 363 (1988)ADSGoogle Scholar
  115. 6.115
    E.G. Slough, B. Giambattista, A. Johnson, W.W. McNairy, R.V. Coleman: Phys. Rev. B39, 5496 (1989)ADSGoogle Scholar
  116. 6.116
    C.G. Slough, R.V. Coleman: Phys. Rev. B40, 8042 (1989)ADSGoogle Scholar
  117. 6.117
    G. Gammie, J.S. Hubacek, S.L. Skala, R.T. Brockenbrough, J.R. Tucker, J.W. Lyding: Phys. Rev. B40, 9529 (1989)ADSGoogle Scholar
  118. 6.118
    G. Gammie, J.S. Hubacek, S.L. Skala, R.T. Brockenbrough, J.R. Tucker, J.W. Lyding: Phys. Rev. B40, 11965 (1989)ADSGoogle Scholar
  119. 6.119
    C.G. Slough, B. Giambattista, W.W. McNairy, R.V. Coleman: J. Vac. Sci. Technol. A8, 490 (1990)ADSGoogle Scholar
  120. 6.120
    J. Heil, J. Wesner, B. Lommel, W. Assmus, W. Grill: J. Appi. Phys. 65, 5220 (1989)ADSGoogle Scholar
  121. 6.121
    D. Anselmetti, R. Wiesendanger, H.-J. Güntherodt, G. Grüner: Europhys. Lett. 12, 241 (1990)ADSGoogle Scholar
  122. 6.122
    E. Garfunkel, G. Rudd, D. Novak, S. Wang, G. Ebert, M. Greenblatt, T. Gustafsson, S.H. Garofahni: Science 246, 99 (1989)ADSGoogle Scholar
  123. 6.123
    K. Nomura, K. Ichimura: Solid State Commun. 71, 149 (1989)ADSGoogle Scholar
  124. 6.124
    K. Nomura, K. Ichimura: J. Vac. Sci. Technol. A8, 504 (1990)ADSGoogle Scholar
  125. 6.125
    J.G. Bednorz, K.A. Müller: Z. Phys. B64, 189 (1986)ADSGoogle Scholar
  126. 6.126
    M.C. Gallagher, J.G. Adler: J. Vac. Sci. Technol. A8, 464 (1990)ADSGoogle Scholar
  127. 6.127
    M.D. Kirk, J. Nogami, A.A. Baski, D.B. Mitzi, A. Kapitulnik, T.H. Geballe, C.F. Quate: Science 242, 1673 (1988)ADSGoogle Scholar
  128. 6.128
    C.K. Shih, R.M. Feenstra, J.R. Kirtley, G.V. Chandrashekhar: Phys. Rev. B40, 2682 (1989)ADSGoogle Scholar
  129. 6.129
    X.L. Wu, C.M. Lieber, D.S. Ginley, R.J. Baughman: Appi. Phys. Lett. 55, 2129 (1989)ADSGoogle Scholar
  130. 6.130
    Y. Le Page, W.R. McKinnon, J.-M. Tarascón, P. Barboux: Phys. Rev. B40, 6810 (1989)ADSGoogle Scholar
  131. 6.131
    M. Tanaka, T. Takahashi, H. Katayama-Yoshida, S. Yamazaki, M. Fujinami, Y. Okabe, W. Mizutani, M. Ono, K. Kajimura: Nature 339, 691 (1989)ADSGoogle Scholar
  132. 6.132
    M. Tanaka, S. Yamazaki, M. Fujinami, T. Takahashi, H. Katayama-Yoshida, W. Mizutani, K. Kajimura, M. Ono: J. Vac. Sci. Technol. A8, 475 (1990)ADSGoogle Scholar
  133. 6.133
    N.J. Zheng, U. Knipping, I.S.T. Tsong, W.T. Petuskey, J.C. Barry: J. Vac. Sci. Technol. A6, 457 (1988)ADSGoogle Scholar
  134. 6.134
    L.E.C van de Leemput, P.J.M. van Bentum, L.W.M. Schreurs, H. van Kempen: Physica C152, 99 (1988)ADSGoogle Scholar
  135. 6.135
    L.E.C van de Leemput, P.J.M. van Bentum, F.A.J.M. Driessen, J.W. Gerritsen, H. van Kempen, L.W.M. Schreurs, P. Bennema: J. Microsc. 152, 103 (1988)Google Scholar
  136. 6.136
    C.J. Chen, C.C. Tsuei: Solid State Commun. 71, 33 (1989)ADSGoogle Scholar
  137. 6.137
    K. Takata, S. Hosoki, S. Hosaka, T. Tajima: Rev. Sci. Instrum. 60, 789 (1989)ADSGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

There are no affiliations available

Personalised recommendations