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Introduction

  • R. Wiesendanger
  • H.-J. Güntherodt
Part of the Springer Series in Surface Sciences book series (SSSUR, volume 20)

Abstract

Since the first successful experiments by G. Binnig, H. Rohrer and coworkers at the IBM Zürich Research Laboratory in March 1981, scanning tunneling microscopy (STM) has developed into an invaluable and powerful surface and interface analysis technique. Some visions from the early days of STM have now been realised, and future applications may exist that can hardly be imagined at present. Only five years after the first successful operation of a scanning tunneling microscope (also abbreviated to STM), Binnig and Röhrer received the Nobel Prize in physics for 1986 together with Ruska for his contributions to the development of electron microscopy. In the following, we will briefly review the historical background of electron tunneling experiments. For a more comprehensive historical review of pre-microscope tunneling experiments, the reader is referred to the article by Walmsley [1.1].

Keywords

Scanning Tunneling Microscope Tunneling Current Scanning Tunneling Microscope Image Applied Bias Voltage Constant Current Mode 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • R. Wiesendanger
  • H.-J. Güntherodt

There are no affiliations available

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