System-Related Aspects of Testing

  • J. Armaos
  • W. Glunz
  • B. Hanstein
  • M. Johansson
  • M. Pabst
  • H. Severloh
Conference paper


For the complex electronic systems of today, efficient test methods are required. This paper surveys design for testability and test data generation techniques applicable to different kinds of digital systems. In particular, the concept of modular testing, test strategy planning (knowledge-based selection of optimal test method combinations), and automatic synthesis of testable systems are discussed.


Paration Sarna 


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Copyright information

© Springer-Verlag Berlin Heidelberg 1990

Authors and Affiliations

  • J. Armaos
    • 1
  • W. Glunz
    • 1
  • B. Hanstein
    • 1
  • M. Johansson
    • 1
  • M. Pabst
    • 1
  • H. Severloh
    • 1
  1. 1.Applied Computer Science and Software Systems Design AutomationSiemens Corporate Research and DevelopmentMunichGermany

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