On the Mechanism of “Forming” and Degradation in DCEL Panels
Forming and degradation phenomena in direct current powder electroluminescent (DCEL) zinc sulphide manganese copper (ZnS:Mn,Cu) phosphor devices have been studied for over two decades and various models have been proposed /1/. The major drawback of powder DCEL devices has been their stability or maintenance. It was noticed very early on that the device ambient significantly affected the degradation rate. The use of dry ambients was found to lead to better maintenance, /2/. Despite these early results showing the effect of the ambient and the fact that panels are usually treated in an inert gas prior to lifetesting /3/, very little further research was carried out along these lines until recently /4/. However, stable DC devices can now be produced by the use of constant power circuitry /5/. These systems are now being produced for VDU application.
KeywordsZinc Migration Dioxide Sulphide Argon
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