Degradation Processes in Thin Film Electroluminescent Devices

  • R. Mach
  • G. O. Mueller
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 38)

Abstract

In his famous paper INOGUCHI /1/ as early as 1974 considered lifetimes of thin film electroluminescent devices (ELD), well aware of the fact that Destriau’s EL powder samples had dis-credited EL by their low maintenance. What he claimed in /1,2/ — 10.000 h operation at surprisingly high frequencies and even at elevated temperatures — was to raise interest and stimulate new hopes and activities worldwide. Nevertheless it was a long way to production of information displays, not only because of the driver problems. The fact that even today new insulator materials for the’ simple’ ZnS:Mn based ELD are invented (patented) and published, claiming better lifetimes and/or higher storable charge, proves that an international standardization has not yet been reached /3/. Several papers on degradation /1, 2, 4, 5/ have been published descibing the main symptom — an almost rigid shift of the brightness(B)-voltage(V)-characteristic along the V-axis. No explanations however have been offered.

Keywords

Sulphide Chlorine 

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References

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Copyright information

© Springer-Verlag Berlin, Heidelberg 1989

Authors and Affiliations

  • R. Mach
    • 1
  • G. O. Mueller
    • 1
  1. 1.Central Institute for Electron PhysicsAcademy of Sciences of GDRBerlinGDR

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