Abstract
Several papers dealing with the mechanism of ZnS:Mn2+ emission in TFEL devices have been reported and two principal phenomena which govern the decay of the yellow Mn2+ emission have been registered [ 1,2,3 ] :
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Diffusion mechanism and energy trapping : an excited Mn* transfers its energy via non excited Mn to killers that reduces the emitted light by the introduction of non radiative channels.
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Interaction between excited Mn* : This phenomena occurs only at high excitation level ; the higher the excitation level, the lower the decay time.
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References
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J. Benoit, P. Benalloul, A. Geoffroy and C. Barthou, Phys. Stat. Sol. (a) 105, 637 (1988).
G.O. Müller, J. Neugebauer, R. Mach and U. Reinsperger, J. Crystal Growth 86, 890 (1988).
R. Mach and G.O. Müller, Phys. Stat. Sol. (a) 81, 609 (1984).
J. Benoit et al., to be published.
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© 1989 Springer-Verlag Berlin, Heidelberg
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Benoit, J., Benalloul, P., Geoffroy, A. (1989). Influence of the Mn Concentration and the Level of Excitation on Efficiency of ZnS:Mn Devices. In: Shionoya, S., Kobayashi, H. (eds) Electroluminescence. Springer Proceedings in Physics, vol 38. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-93430-8_15
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DOI: https://doi.org/10.1007/978-3-642-93430-8_15
Publisher Name: Springer, Berlin, Heidelberg
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