EBIC Contrast and Precipitation in Σ = 13 and Σ = 25 Annealed Silicon Bicrystals

  • A. Ihlal
  • G. Nouet
Part of the Springer Proceedings in Physics book series (SPPHY, volume 35)


It is found that annealed silicon bicrystals exhibit two types of EBIC contrast which are associated with precipitates decorating the grain boundary plane. Typical colonies of copper containing precipitates and homogeneous distribution of smaller precipitates are observed in TEM. The results suggest that the length of annealing has no noticeable influence on the contrasts observed.


Boundary Plane Polycrystalline Silicon Electron Beam Induce Current Typical Coloni Bright Field Micrograph 
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Copyright information

© Springer-Verlag Berlin, Heidelberg 1989

Authors and Affiliations

  • A. Ihlal
    • 1
  • G. Nouet
    • 1
  1. 1.Laboratoire d’Etudes et de Recherches sur les Matériaux, Institut des Sciences de la Matière et du RayonnementURA 994 CNRS, UniversitéCaen CedexFrance

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