Abstract
Many practical catalysts have a complex geometric structure with a range of hierarchies of porosity to enable reacting gases or fluids to reach as much of the surface of the catalyst as possible, and of course for the products to diffuse out and away from the catalyst. The catalysing surface frequently consists of a complex chemical mixture of different phases produced by an empirically evolved chemical process which may incorporate activators, promoters, and so on. The active component is frequently in the form of very small crystals dispersed on the large surface area of a spongy supporting component of the catalyst. The behaviour and misbehaviour of this type of catalyst can depend upon the structure and composition of the active component as well as the morphology of its supporting medium. In order to understand the catalyst’s behaviour it may be necessary to examine its structure at a range of magnifications from a few hundreds to a few millions of times. This will allow us to determine the form and distribution of the active components, the nature of the porosity, the distribution and nature of a coke or poisoning deposit, and so on. This can be achieved by the use of electron microscopy in a variety of forms. Research chemists and industrial chemists have only recently started to use these techniques. In the past they have probably been inhibited from making full use of them because of a lack of experience or appreciation of the various different ways in which an electron microscope can be used.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Abbe, E.: Archiv, f. Mikroskopische Anat. 9, 413 (1873)
Heidenreich, R. D.: Fundamentals of transmission electron microscopy. New York: Interscience Publishers 1964
Hirsch, P. B., Howie, A., Nicholson, R. B.. Pashley, D. W., Whelan, M. J. W.: Electron microscopy of thin crystals. London: Butterworths 1965
Cowley, J. M.: Diffraction physics. Amsterdam, Oxford: North-Holland Publishing Co. 1975
Humphries, C. J.: Reports on the Progress in Physics 42, 1825 (1979)
Spence, J. C. H.: Experimental high-resolution electron microscopy. Oxford: Clarendon Press 1981
Treacy, M. M. J., Howie, A.: J. Catal. 63, 265 (1980)
Kishimoto, S.: J. Phys. Chem. 77, 1719 (1973)
Craido, J. M., Herrera, E. J., Trillo, J. M.: In: Catalysis I. (Hightower, J. W. ed.). Amsterdam: North-Holland 1973, p. 541
Baird, T.: Catalysis 5, 172 (1981)
Howie, A.: Characterization of catalysts. (Thomas, J. M., Lambert, R. M. eds.). Chichester, UK: John Wiley & Sons 1980, p. 89
Chen, J. R., Gomer, R.: Surface Sci. 79, 413 (1979)
Thurstons, R. E., Walls, J. M.: Field-Ion Microscope and Related Techniques. Birmingham: Warwick Publishing Co. 1980
Muller, E. W.: In: Methods of surface analysis. ( Czanderna, A. W., ed.). Amsterdam: Elsevier Scientific Publishing Co. 1975
Block, J. H.: In: Electronic structures and reactivity of metal surfaces. (Derouane, E. G., Lucas, A. A., eds.). New York: Plenum Press 1976. p. 485
Jones, J. P.: Chemistry and Physics of Solids and their Surfaces 8, 18 (1980)
Boyes, E. D.: In: Electron Microscopy and Analysis 1981. (Goringe. M. J., ed.). London. Conference Series Number 61. Institute of Physics, London 1981. p. 27
Humphreys, C. J., Spence, J. C. H.: Optik 58, 125 (1981)
Lauer, R.: Advances in Optical and Electron Microscopy. (Barrer, R.. Cosslett, V. E., eds.). 8, 137 (1982)
Kasper, E.: Advances in Optical and Electron Microscopy. (Barrer, R., Cosslett, V. E., eds.). 8, 207 (1982)
Baker, R. T. K., Harris, P. S.: J. Phys. E: Sci. Instr. 5, 793 (1972)
Mills, J. C., Moodie, A. F.: In: 8th International Congress on Electron Microscopy. (Sanders, J. V., Goodchild, D. J., eds.). Canberra: Aust. Academy of Science 1, 1974, p. 182
Barna, A., Barna, P. D., Pocza, J. F.: Vacuum 17, 219 (1967)
Valle, R., Genty, B., Marraud, A., Cadoz, J.: In: Electron Microscopy and Analysis 1981, Institute of Physics Conference Series No. 61. Bristol and London, The Institute of Physics 1981, p. 35
Poppa, J.: J. Vacuum Sci. and Tech. 2, 42 (1965)
Takayamagi, K., Yagi, K., Kobayashi, K., Honjo, G.: J. Phys. E.: Sci. Instr. 11. 441 (1978)
Poppa. H., Heinemann, K.: Optik 56, 183 (1980)
Parsons, D. F.: In: Physical aspects of electron microscopy and microbeam analysis. (Siegel, B. M., Beaman, D. R., eds.). New York: John Wiley & Sons 1975, p. 267
Chung, T. T., Dash, J., O’Brien, R. J.: 9th International Congress on Electron Microscopy 1. (Sturgess, J. M., ed.). Toronto, Microscopical Society, Canada 1978
Heinemann, K., Rao, B.. Douglass, D. L.: Oxid. Metals 9, 379 (1975)
Rhoades, B. L.: 9th International Congress on Electron Microscopy 1. (Sturgess, J. M., ed.). Toronto, Microscopical Society, Canada 1978, p. 70
Fryer, J. R.: The chemical applications of transmission electron microscopy. London: Academic Press 1979
Gai, P. L., Goringe, M. J.: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 39th. 1981, p. 68
Pashley, D. W.: Advances in Physics 14, 327 (1965)
Swann, P. R.: 9th International Congress on Electron Microscopy 1. (Sturgess, J. M., ed.). Toronto, Microscopical Society, Canada 1978
Fujita, H., Komatsu, M.: Jap. J. Appl. Phys. 15, 2221 (1976)
Robinson, V. N. E.: In: Scanning electron microscopy. (Johari, O., ed.). Chicago: I.I.T. Research Institute 1975, p. 51
Crewe, A. V.: Chemica Scripta 14, 17 (1979)
Ulaut, M.: Proceedings EMSA. (Bailey, G. W.. ed.). Baton Rouge: Claitors Publ. Div. 1979
Butler, J. H.: In: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 39th, 1981, p. 136
Philips supertwin lens in the EM420 is quoted as having C8 = 1.2 mm. 1983
Cowley, J. M., Spence, J. C. H.: Ultramicroscopy 3, 433 (1979)
Lynch, J. P.. Lesage, E.. Dexpert, H.. Freund, E.: In: Institute of Physics Conference Series 61. (Goringe. M. J., ed.). London: Institute of Physics, London 1981, p. 67
Agar. A. W., Alderson. R. H., Choscoe, D.: Principles and practice of electron microscope operation. In: Practical methods of electron microscopy. (Glauert. A. M.. ed.). Amsterdam: North-Holland 1974
Andrews. K. W.. Dyson. D. J., Keown, S. R.: In: Interpretation of electron diffraction patterns. London: Hilger and Watts 1967, p. 17
Beeston, B. E. P.: In: Electron diffraction and optical diffraction techniques. (Glauert, A. M.. ed.). Amsterdam: North-Holland 1973, p. 1
Gard, J. A.: In: Electron microscopy in mineralogy. (Wenk, H.-R.. ed.). Berlin: Springer-Verlag 1976, p. 53
Riecke, W. D.: In: Electron microscopy in materials science I. (Valdré. U., Ruedl, E., eds.). Brussels: Commission for European Committees 1975, p. 81
Jaeger, H. G.: Private communication (1981)
Pease, R. F. W., Nixon, W. C.: J. Sci. Instruments 42, 81 (1965)
Pease, R. F. W.: 4th Annual SEM Symposium. (Johari, O., ed.). Chicago: I.I.T. Research Institute 1971, p. 11
Ledebo, L.-A.: In: Electron microscopy and analysis. (Goringe, M. J., ed.). Bristol: Institute of Physics Conference Series 61, 1981, p. 513
Lifshin, E.: In: Scanning electron microscopy. (Wells, O. C., ed.). New York: McGraw- Hill 1974, p. 243
Newbury, D. E.: In: Scanning electron microscopy. (O’Hare, A. M. F., ed.). Chicago: 1.1.T.R.I. 1979, p. 1
Joshi, A., Davis, L. E., Palmberg, P. W.: In: Methods of surface analysis. (Czanderna, A. W., ed.). Amsterdam: Elsevier Scientific Publications 1975, p. 159
MacDonald, N. C.: Appi. Phys. Letters 16, 76 (1970)
MacDonald, N. C., Waldrop, J. R.: Appi. Phys. Letters 19, 315 (1971)
Holloway, P. H., Battacharya, R. S.: Surface and Interface Analysis 3, 118 (1981)
Wells, O. C.: In: Scanning electron microscopy. New York: McGraw-Hill 1974, p. 87
Venables, J. A., Janssen, A. P., Harland, C. J., Joyce, B. A.: Phil. Mae. 34, 445 (1976)
Alford, N. A., Barrie, A., Drummond, I. W., Herd, Q. C.: Surface and Interface Analysis 1, 36 (1979)
Stein, D. F., Joshi, A.: Annual Reviews of Materials Science 11, 485 (1981)
Mathieu, H. J., Landolt, D.: Surface and Interface Analysis 3, 153 (1981)
Bursill, L. A., Barry, J. C., Hutchinson, J. L.: Optik 65, 271 (1983)
Moodie, A. F.: private communication (1983)
Cosslett, V. E., Camps, R. A., Saxton. W. O., Smith, D. J., Nixon, W. C., Ahmed, H., Catto, C. J. D., Cleaver, J. R. A., Smith, K. C. A., Timbs, A. E.. Turner, P. W., Ross, P. M.: Nature 281, 49 (1979)
Jefferson, D. A., Thomas, J. M., Smith, D. J., Camps, R. A.. Catto, C. J. D., Cleaver, J. R. A.: Nature 281, 51 (1979)
Horiuchi. S.: Chemica Scripta 14, 75 (1978)
Crewe, A. V.: Chemica Scripta 14, 17 (1978–79)
Doig, P., Lonsdale, D., Flewitt, P. E. J.: Phil. Mag. A41, 761 (1980)
Oppalzer, H., Knauer, U.: In: Scanning electron microscopy 1, 1979 (Johari, O., ed.). Chicago: SEM Inc. 1979, p. III
Schuman, H., Somlyo, A. P.: Proc. Nat. Acad. Sci. USA 73, 1193 (1976)
Dexpert, H.: private communication
Adamson-Sharpe, K. M., Ottensmeyer, F. P.: J. Microscopy 122, 309 (1981)
Home, R. W., Markham, R.: In: Electron diffraction and optical diffraction techniques. (Glauert, A. M., ed.). Amsterdam, London: North-Holland Publishing Co. 1973, p. 327
Salmon, E. D., Rosier, D.: J. Microscopy 123, 239 (1981)
Agar. A. W., Keown, S. R.: Proc. Roy. Microscopical Soc. G. B. 13, 147 (1978)
Erickson. H. P.: In: Advances in optical and electron microscopy. (Barrer. R., Cosslett, V. F.. eds.). London. New York: Academic Press 5. p. 163 (1973)
Lipson, H., Taylor, C. A.: Fourier transforms and X-ray diffraction. London: G. Bell and Sons 1958
Iijima, S., Anstis, G. R.: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 34th. ( Bailey, G. W., ed.). Florida 1976, p. 476
Klug, A., De Rosier, D. J.: Nature 212, 29 (1966)
Erickson, H. P., Klug, A.: Phil. Trans. Roy. Soc. 261, 105 (1971)
Klug, A.: Chemica Scripta 14, 245 (1979)
Cross, P. M.: In: The use of the scanning electron microscope. (Head, J. W. S., Sparrow, J. T., Cross, P. M., eds.). Oxford, Pergamon Press 1972, p. 75
Lyman, C. E.: Microbeam Analysis 16, 261 (1981)
Kay, D. H.: Techniques for electron microscopy. Oxford: Blackwell Scientific Publications 1965
Goodhew, P. J.: In: Practical methods in electron microscopy. ( Glauert, A. M., ed.). Amsterdam: North-Holland 1973
Baird, T.: Catalysis 5, 179 (1982)
Freel, J.: J. Catal. 25, 139 (1972)
Fukami, A.. Adachi. K., Katoh, M.: J. Electron Microscopy (Japan) 21, 99 (1972)
Hoelke, C. W.: Micron 5, 307 (1975)
Ohtsuki, M., Isaacson, M. S., Crewe, A. V.: In: Scanning electron microscopy. ( Johari, O., ed.). Chicago: SEM Inc. 1979
Muller, M., Koller, T.: Optik 35, 287 (1972)
Mihama, K., Tanaka, N.: J. Electron Microscopy (Japan) 25, 65 (1976)
Iijima, S.: Micron 8, 41 (1977)
Baumeister, W.. Hahn, M.: Micron 7, 371 (1976)
Glauert, A. M.: Fixation, dehydration and embedding of biological specimens. Amsterdam: North-Holland 1975
Dalmai-Imelik, G., Leclerq, C, Martin, I.: J. Microscopie 20, 123 (1974)
Sprys, J. W., Bartosiewicz, L., McCune, R., Plummer, H. K.: J. Catal. 39, 91 (1975)
Baker, R. T. K., Prestridge, E. B., Garten, R. L.: J. Catal. 56, 390 (1979)
Glassi, H., Kramer, R., Hayek, K.: J. Catal. 63, 167 (1980)
Chu, Y. F., Ruckenstein, E.: J. Catal. 55, 281 (1978)
Chen, M., Schmidt, L. D.: J. Catal. 55, 348 (1978)
Hamilton, J. F.: In: Growth and properties of metallic clusters. (Burdon, J., ed.). Holland: Elsevier Scientific Publishing Co. 1980, p. 289
Tighe, N. J.: In: Electron microscopy in mineralogy. (Wenke, H. R., ed.). Berlin: Springer Verlag 1976, p. 144
Bursill, L. A., Lodge, Eliz. A., Thomas, J. M.: Nature 286 111 (1980)
Bursill, L. A., Thomas, J. M.. Rao, K. J.: Nature 289, 157 (1981)
Hirsch, E. H.: Nature 293, 759 (1981)
Smith, A. E., Eyring, LeR.: Ultramicroscopy 8, 65 (1982)
Cowley, J. M.: Ultramicroscopy 8, 1 (1982)
Cowley, J. M.: Appi. Phys. Letters 15, 58 (1969)
Dekker, A. J.: Solid State Physics 6, 251 (1958)
Lane, G. S.: In: The use of scanning electron microscopy. (Hearle, J. W. S., Sparrow, J. T., Cross, P. M., eds.). Oxford: Pergamon Press 1972, p. 219
Wells, O. C.: In: Scanning electron microscopy. (Wells, O. C, ed.). New York: McGraw-Hill 1974, p. 129
Pawley, J. B.: In: Proc. Scanning Electron Microscopy Symposium. (Johari, O., ed.). Chicago: 1.1.T.R.I. 1972, p. 153
Pfferkorn, G. E., Grunter, H., Pfautsch, M.: In: Proc. Scanning Electron Microscopy Symposium. (Johari, O., ed.). Chicago: I.I.T.R.I. 1972, p. 147
Broers, A. N.: Ultramicroscopy 8, 137 (1982)
Robinson, V. N. E.: J. Phys. E.: Sei. Instrum. 7, 650 (1974)
George, E. P., Robinson, V. N. E.: In: Scanning Electron Microscopy 1977. (Johari, O., 1 ed.). Chicago: I.I.T.R.I. 1977, p. 63
Wells, O. C, Broers. A. N., Bremer. C. G.: Appi. Phys. Letters 23. 353 (1973)
Scanning electron microscopy and X-ray microanalysis. (Goldstein, J. I., Newbury, D. E., Echlin. P., Joy, D. C., Fiori. C.. Lifshin. E.. eds.). New York: Plenum 1981
Stephani. D.: J. Vac. Sci. Technol. 16. 1739 (1979)
Morton. R. R. A.: In: Stereoloey and Quantitative Metallography. Pa.: A.S.T.M.504. 1972. p. 81
Shaw. M. P.. Kohler. V. L., Ralph. B.: J. Microscopy 128. 251 (1982)
Humphries. C. J.: Rep. Prog. Phys. 42. 1825 (1979)
Lynch, D. F.. CTKeefe. M. A.: Acta Cryst. A28. 536 (1972)
Ishizuka. K.. Uyeda. N.: Acta Cryst. A33, 740 (1977)
Self. P. G., O’Keefe. M. A.. Buseck. P. R., Sparso. A. E. C.: Ultramicroscopy 11. 35 (1983)
Allpress. J. G.. Sanders, J. V.: J. Appi. Cryst. 6, 165 (1973)
O’Keefe, M. A.. Fryer, J. R.. Smith. D. J.: Acta Cryst. A39, 839 (1983)
Van Dyck. D.: J. Microscopy 132. 31 (1983)
CTKeefe. M. A.: Acta Cryst. A29. 389 (1973)
Metherell, A. J. F.: In: Electron microscopy for materials science. (Valdré, U., Ruedl, E.. eds.). Brussels: Commissioner for European Communities 1975. p. 496
Yacaman, M. J., Ocana. T.: phys. stai. sol. 42, 571 (1972)
Head, A. K., Humble, P.. C’lareborough. L. M., Morton. A. J., Foreward, C. T.: Computed electron micrographs and defect identification. Amsterdam: North-Holland 1973
Heinemann, K., Poppa, H.: Appi. Phys. Lett. 20. 122 (1972)
Freeman, L. A.. Howie, A.. Treacy. M. M. J.: J. Microscopy 111, 165 (1977)
Krakow, W., Howland, L. A.: Ultramicroscopy 2. 53 (1976)
Cowley. J. M.: In: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 31st, ( Arceneaux. C. J., ed.). New Orleans. La 1973
Cowley. J. M.: Acta Cryst. A29. 529 and 537 (1973)
Rudec, M. L., Howie, A.: Phil. Mag. 25. 1001 (1972)
Berry, M. V., Doyle, P. A.: J. Phys? C.: Solid State Phys. 6, L6 (1973)
Iijima, S., O’Keefe. M. A.: In: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 35th. (Bailey, G. W., ed.). Boston, Mass. 1977, p. 190
Cowley, J. M., Massover, W. H., Jap, Bing. K.: Optik 40, 42 (1974)
Yacaman. M. J., Dominguez, J. M.: J. Catal. 67, 475 (1981)
Cowley, J. M., Moodie, A. F.: Proc. Phys. Soc. 76, 378 (1960)
Olsen. A.. Spence, J. C. H.: Phil. Mag. A43, 945 (1981)
O’Keefe, M. A., Sanders. J. V.: Optik 46, 421 (1976)
Goodman. P., Moodie, A. F.: Acta Cryst. A30, 280 (1974)
Self, P. G., O’Keefe, M. A., Busek, P. R.. Sparso. A. E. C: Ultramicroscopy 11, 35 (1983)
Scherzer, O.: J. Appi. Phys. 20, 20 (1949)
Cowley. J. M., Fields, P. M..: Acta Cryst. A35. 28 (1979)
Cowley. J. M.. Iijima, S.: In: Electron microscopy in mineralogy. (Wenk. H.-R., ed.). Berlin, Heidelberg. New York: Springer-Verlag 1976, p. 123
Allpress, J. G.. Hewat. E. A.. Moodie, A. F., Sanders. J. V.: Acta Cryst. A28. 528 (1972)
Lynch. D. F., O’Keefe, M. A.: Acta Cryst. A28, 536 (1972)
Ishizuka. K., Uyeda, N.: Acta Cryst. A33, 740 (1977)
Hashimoto, H., Tokai. Y.. Yokota, Y., Endoh, H., Fukuda, E.: Jap. J. Appi. Phys. 19, L1 (1980)
Hiraga, K., Shindo, D., Hirayabayashi, M., Terasaki, O., Watanabe, D.: Acta Cryst. B36. 2550 (1980)
Marks, L. D.: Surface Sci. 139. 281 (1984)
Cowley. J. M.: Appi. Phys. Letters 15, 58 (1969)
Crewe, A. V.. Wall, J.: Optik 30. 461 (1970)
Cowley. J. M.. Spence, J. C. H.: Ultramicroscopy 6, 359 (1981)
Cowley, J.: Ultramicroscopy 7, 181 (1981)
Zhu. J.. Cowley. J. M.: Acta Cryst. A38. 718 (1982)
Row R. A., Messier, R., Cowley, J. M.: Thin Solid Films 79, 207 (1981)
Cliff, G., Lorimer, G. W.: J. Microscopy 103, 203 (1975)
Delannay, F.: Catal. Rev.-Sci. Eng. 22, 141 (1980)
Champness, P. E., Cliff, G., Lorimer, G. W.: Ultramicroscopy 8, 121 (1982)
Goldstein, J. I., Costley, J. L., Lorimer, G. W., Reed, S. J. B.: In: Scanning electron microscopy. (Johari, O., ed.). Chicago: 1.1.T.R.I. 1977, p. 315
Dexpert, H., Freund, E., Lynch, J. P., Pennycook, S. J.: In: Electron Microscopy and Analysis 1981. Inst. Phys. Conf. Ser. 61. (Goringe, M. J., ed.). Bristol and London: Institute of Physics 1981, p. 209
Ottensmeyer, F. P., Andrew, J. W., Bazett-Jones, D. P., Chan, A. S. K., Hewitt, J.: J. Microscopy 109, 259 (1977)
Aebi, U., Fowler, W. E., Smith, P. R.: Ultramicroscopy 8, 191 (1982)
Hashimoto, H., Endoh, H., Takai, Y.. Tomioka, H., Yokota, Y.: Chemica Scripta 14, 25 (1978–79)
Klug, A.: Chemica Scripta 14, 245 (1978–79)
Kirkland, E. J.. Siegel, B. M., Uyeda, N., Fujiyoshi, Y.: Ultramicroscopy 5. 479 (1980)
Kanaya, K., Baba, N., Takamiya, K.: Micron 12. 353 (1981)
Boyes, E. D., Muggridge, B. J., Goringe, M. J.: J. Microscopy 127, 321 (1982)
Hawkes, P. W.: ed. Image processing and computer-aided design in electron optics. Academic Press 1973
Misell, D. L.: Image analysis, enhancement and interpretation. Amsterdam: North-Holland 1978
Saxton, W. O.: J. Microsc. Spectroscop. Electron 5, 665 (1980)
Howie, A., Marks, L. D., Pennycook, S. J.: Ultramicroscopy 8, 163 (1982)
Crewe, A. V., Wall, J., Langmore, J. P.: Science 168, 1338 (1970)
Hashimoto, H., Kumao, A., Hino, K., Yotsumoto. H., Ono, A.: Japan J. Appl. Phys. 10, 1115 (1971)
Formanek, H., Muller, M., Hahn, M. H., Koller, Th: Naturwissenschaften 58, 339 (1971)
Eisenhandler, C. B., Siegel, B. M.: J. Appl. Phys. 37, 1613 (1966)
Hall, C. R., Hines, R. L.: Phil. Mag. 21, 1175 (1970)
Hashimoto, H.. Kumao, A., Hino, K., Endoh, H., Yotsumoto, H., Ono, A.: J. Electron Microscopy 22, 123 (1973)
Iijima, S.: Optik 48, 193 (1977)
Mihama, K., Shima, S., Uyeda, R.: In: Electron Microscopy 1974. (Sanders, J. V., Good- child, D. J., eds.). Canberra: Australian Academy of Science 1974, p. 262
Freeman, L. A., Howie, A., Treacy, M. M. J.: J. Microscopy 111, 165 (1977)
Treacy, M. M. J., Howie, A., Wilson, C. J.: Phil. Mag. 38, 569 (1978)
Crewe, A. L.: Chemica Scripta 14, 17 (1978–79)
Hainfeld, J. F., Wall, J. S.: In: Scanning Electron Microscopy 1980. (Johari, O., ed.). Chicago: SEM Inc. 1980, p. 107
Ulant M.: In: EMS A 79. (Bailey, G. W., ed.). Baton Rouge: Claitons Publ. Div. 1979, p. 470
Wall, J. S., Hainfeld, J. F.. Bartlett. P. A., Singer, S. J.: Ultramicroscopy 8, 397 (1982)
Langmore, J. P.: In: Principles and techniques of electron microscopy. ( Hayat, M. A., ed.). New York, Van Nostrand Reinhold Co. 1977
Flynne. P. C., Wanke, S. E,, Turner, P. S.: J. Catal. 33, 233 (1974)
Barrie, J. C., Bursill. L. A.: In: Seventh Australian Conference on Electron Microscopy. Canberra: Canberra Publ. and Print. Co. 1982, p. 135
Prestridge, E. B.. Yates. D. J. C.: Nature 234. 345 (1971)
Yacaman, M. J.: In: Growth and properties of metallic clusters. (Burden, J., ed.). The Netherlands: Elsevier Sei. Publ. Co. 1980, p. 225
Smith, D. J., Marks. L. D.: Phil. Mag. A44. 735 (1981)
Millward, G. R.: J. Catal. 64. 381 (1980)
Newcomb, S. B., Stobbs, W. B., Little, J. A.: phys. stat. sol. A76. 191 (1983)
Nagata, F.. Matsuda. T.. Komoda, T.: Japan J.Appl. Phys. 14. 1815 (1975).
Jaeger. H. J.: unpublished results (1983)
Schwanke. J., Allard. L. F.. Deeba, M., Gates. B. C.: J. Catal. 84. 27 (1983)
Millward. R. G.; Jefferson, D. A., Thomas, J. M.: J. Microscopy 113, 1 (1978)
Jefferson. D. A.. Millward. G. R.. Thomas. J. M.: Acta Cryst. A32. 823 (1976)
Lynch, D. F.. Sanders, J. V.: unpublished results (1984)
Von Borries, B., Kausche, G. A.: Kolloid Z. 90. 132 (1940)
Yacaman, M. J., Ocana, Z. T.: phys. stat. sol. (a) 42, 571 (1977)
Goringe, M. J.: In: Electron microscopy for materials science. (Valdré, U., Ruedl, E., eds.). Commission for European Communities 1975
Clareborough, L. M., Humble, P., Loretto, M. H.: Acta Cryst. 15. 1007 (1967)
Hayashi, T.. Ohno, T., Yatsuya. S.. Uyeda, R.: Jap. J. Appl. Phys. 16, 705 (1977)
Allpress, J. G., Sanders. J. V.: Aust. J. Phys. 23. 23 (1970)
Allpress, J. G. Sanders. J. V.: Surface Sci. 7, 1 (1967)
Ogawa, S., Ino, S.: J. Crystal Growth 13/14. 48 (1972)
Ogawa, S., Ino, S.: In: Advances in epitaxy and endotaxy. (Schneider, H. G., Ruth. V., eds. ). Leipzig 1971
Uyeda, R.: J. Crystal Growth 24/25. 69 (1974)
Avery, N. R., Sanders. J. V.: J. Catal. 18, 129 (1970)
Roy, R. A., Messier, R., Cowley, J. M.: Thin Solid Films 79, 207 (1981)
Larroque. P., Brieu, M.: Acta Cryst. A34, 853 (1978)
Kimoto, K.: Nippon Kessho Seicho Gakkaishi 6, 88 (1979)
Solliard, C.: Surface Sci. 106, 58 (1981)
Smith. D. J., White. D. Baird, T., Fryer. J. R.: J. Catal. 81, 107 (1983)
Foger, K.: Catalysis Sci. Tech. 6, 227 (1984)
Burton, J. J.: Cat. Rev.-Sci. Eng. 9, 209 (1974)
Gillet, M.: Surface Sci. 67, 139 (1977)
Ko, E. I., Madix, R. J.: Adv. Mech. Phys. Surf. 1, 153 (1981)
Cherns, D.: Phil. Mag. 30, 549 (1974)
Krakow, W., Ast, D. G.: Surface Sci. 58, 485 (1976)
Hiñes, R. L.: Thin Solid Films 35, 229 (1976)
Takayanagi, K.: Ultrastructure 8, 147 (1982)
Klaura, M., Bethge, H.: Ultramicroscopy 11, 125 (1983)
Cullis, A. G., Maher, D. M.: Ultramicroscopy 1, 97 (1975)
Gomez, A.. Harnández, P., José-Yacamán, M.: Surface and Interface Analysis 4, 120 (1982)
Lynch, D. F., Moodie, A. F., O’Keefe, M. A.: In: Electron Microscopy 1974. (Sanders, J. V., Goodchild, D. J. eds.). Canberra: Australian Academy of Science 1974, p. 222
Cowley. J. M., Moodie, A. F.: Proc. Phys. Soc. 76, 378 (1960)
Moodie, A. F., Warble, C. E.: In: Sintering and Catalysis. Materials Science Research 10. (Kucznski, G. C, ed.). New York: Plenum 1975. p. 1
Iijima, S.: Optik 47, 437 (1977)
Allpress, J. G., Sanders, J. V.: J. Appl. Cryst. 6. 165 (1973)
Moodie, A. F., Warble, C. E.: J. Crystal Growth 10, 26 (1971)
Marks, L. D., Smith, D. J.: Nature 303, 316 (1983)
Marks, L. D., Smith, D. J.: Phys. Rev. Lett. 51, 1000 (1983)
Young,. R. T., Wong, C.: J. Catal. 85, 154 (1984)
Hojlund Neilsen, P. E., Cowley, J. M.: Surface Sci. 54, 340 (1976)
Osakabe, N., Tanishiro, Y.. Yagi, K., Honjo, G.: Surface Sci. 102. 424 (1981)
Shuman, H.: Ultramicroscopy 2, 361 (1977)
Osakabe, N., Tanishiro, Y., Yagi, K., Honjo, G.: Surface Sci. 97, 393 (1980)
Cowley, J. M.: In: Proc. Ann. Meeting of Electron Microscopical Soc. Amer. 39th ( Bailey, G. W., ed.). Atlanta 1981, p. 212
Hsu. T., Cowley, J. M.: Ultramicroscopy 11, 239 (1983)
Turner, P. S.. Cowley, J. M.: Ultramicroscopy 6, 125 (1981)
Ultramicroscopy 11,91–223 (1983)
Baker, R. T. K. Prestridge, E. B., Garten, R. L.: J. Catal. 56, 390 (1979)
Aral. M., Ishikawa. T.. Nishiyama, Y.: J. Phys. Chem. 86, 577 (1982)
Ambrose, B. K.: J. Phys. E.: Sei. Inst. 9, 382 (1976)
Jaeger, H. J., Sanders, J. V.: unpublished information
Inui, T., Morinaga, N., Ishihara, T., Kanie, T., Takegami, Y.: J. Catal. 79, 176 (1983)
Knapton, A. G.: Platinum Metals Review 22, 131 (1978)
Flytzani-Stephanopolous, M., Wong, S., Schmidt, L. D.: J. Catal. 49, 54 (1977)
Gault, A. G., Masel, R. I.: J. Catal. 73, 294 (1982)
Amariglio, A., Amariglio, H.: J. Catal. 68, 86 (1981)
Cooper, B. J., Trimm, D. L.: J. Catal. 62, 35 (1980)
Murray, R. T.: In: Characterisation of catalysts. (Thomas, J. M., Lambert, R. M., eds.). John Wiley and Sons, 1980, p. 105
Klein, J. C., Hercules, D. M.: J. Catal. 82, 424 (1983)
Rao. V. U. S., Szirmac, A., Fisher, R. M.: J. Catal. 62, 44 (1980)
Sanders, J. V., Spink, J. A., Pollack, S. S.: J. Appl. Catal. 5, 65 (1983)
Davis, S. M., Zaera, F., Somorjai. G. A.: J. Catal. 77. 439 (1982)
Whyte, T. E. Jr.: Catalysis Reviews 8, 117 (1973)
Pope, D., Smith, W. L., Eastlake, M. J., Moss, R. L.: J. Catal. 22. 72 (1971)
Takasa, Y., Akimura, T., Kasahara, K., Matsuda, Y., Miura, H., Toyoshima, I.: J. Amer. Chem. Soc. 104, 5249 (1982)
Paryjczak, T., Syzmura, J. A.: React. Kinet. Catal. Lett. 13, 345 (1980)
Moss, R. L,., Pope, D., Davis, B. J., Edwards, D. H.: J. Catal. 58, 206 (1979)
Cocco, G.. Schiffini, L., Strukul, G.: J. Catal. 65, 348 (1980)
Gallizot, P.: Catal. Rev.-Sci. Eng. 20, 121 (1979)
Bond, G. C., Hierl, G.: J. Catal. 61, 348 (1980)
Moss, R. L., Pope, D., Davis, B. J.: J. Catal. 61, 57 (1980)
Gault, F. G., Garin, F., Maire, G.: In: Growth and properties of metallic clusters. ( Bourdon, J., ed.). Netherlands: Elsevier Scientific Publ. Co. 1980
Naccache, C., Kaufherr, N., Dufaux, M., Pandiera, J., Imelik, B.: In: Molecular sieves II. (Katzer, J. R., ed.). Washington: A.C.S. 1977, p. 538
Haaland, D.. Williams, F. L.: J. Catal 76, 450 (1982)
White, D., Baird, T., Fryer, J. R., Freeman, L. A., Smith D. J.: J. Catal. 81, 119 (1983)
Kramer, R., Zuegg, H.: J. Catal. 85, 530 (1984)
Cullis, C. F., Willatt, B. M.: J. Catal. 83, 267 (1983)
Fuentes, S., Figueras, F.: J. Catal. 61, 443 (1980)
Thornton, E. W., Knözinger, H., Tesche, B., Rafalko, J. J., Gates, B. G.: J. Catal. 62, 117 (1980)
Graydon, W. F.. Langan, M. D.: J. Catal. 69, 180 (1981)
Ellestad, O. H., Naccache, C.: In: Perspectives in catalysis. (Larsson, R.. ed.). Sweden: C. W. K. Gleerup 1981, p. 95
McVicker, G. B., Baker, R. T. K., Garten, R. L., Kugler, E. L.: J. Catal. 65, 207 (1980)
Lee, P. C., Meisel, D.: J. Catal. 70, 160 (1981)
Galvagno, S., Schwank, J., Parravano, G.: J. Catal. 61, 223 (1980)
Prestridge, E. B., Via, G. H., Sinfeldt, J. H.: J. Catal. 50, 115 (1977)
Bartholomew, C. H., Pannell, R. B., Fowler, R. W.: J. Catal. 79, 34 (1983)
Smith, J. S., Thrower, P. A., Vannice, M. A.: J. Catal. 68, 270 (1981)
Mustard, D. G.. Bartholomew, C. H.: J. Catal. 67, 186 (1981)
Kuo, H. K., Ganesan, P., De Angelis, R. J.: J. Catal. 64, 303 (1980)
Scott, B. A., Plecenick, R. M., Cargill, G. S. III, McGuire, T. R., Herd, S. R.: Inorg. Chem. 19. 1252 (1980)
Jiang, X-Z., Hayden, T. F., Dumesic, J. A.: J. Catal. 83, 168 (1983)
Chu, Y. F., Ruckenstein, E.: J. Catal. 55, 28 (1978)
Chen, M., Schmidt, L. D.: J. Catal. 55, 348 (1978)
Tartachuk, B. J.. Dumesic, J. A.: J. Catal. 70, 308 (1981)
Bartholomew, C. H.. Sorensen, W. L.: J. Catal. 81, 131 (1983)
Glassl, H., Kramer, R., Hayek, K.: J. Catal. 68, 388 (1981)
Harris, P. J. F., Boyes, E. D., Cairns, J. A.: J. Catal. 82, 127 (1983)
Baker, R. T. K.. Prestridge, E. B., Garten, R. L.: J. Catal. 56. 390 (1979)
Baker. R. T. K.. Prestridge. E. B.. Garten. R. L.: J. Catal. 59, 293 (1979)
Smith. D. J., White, D.. Baird. T.. Fryer. J. R.: J. Catal. 81, 107 (1983)
Clark, R. W.. Tien. J. K.. Wynblatt. P.: J. Catal. 61. 15 (1980)
Chen. J. J.. Ruckenstein. E.: J. Catal. 69. 254 (1981)
Wanke. S. E.. Flynn. P. C.: Catal. Rev.-Sci. Eng. 12. 93 (1975)
Schmidt, L. D., Wang, T., Vacquez, A.: Ultramicroscopy 8, 175 (1982)
Foger. K.. Jaeger. H.: J. Catal. 70. 53 (1981)
Jaeger, H.. Foger. K.: Micron 13. 267 (1982)
White. D.. Baird. T.. Fryer. J. R.. Freeman, L. A., Smith, D. J., Day, M.: J. Catal. 81. 119 (1983)
Ruckenstein. E.. Chu, Y. F.: J. Catal. 59. 109 (1979)
Tatarchuk, B. J., Chludzinski. J. J., Sherwood, R. D.. Dumensic. J. A., Baker. R. T. K.: J. Catal. 70, 433 (1981)
Wang, T., Schmidt. L. D.: J. Catal. 66, 301 (1980)
Ruckenstein. E., Chen, J. J.: J. Catal. 70. 233 (1981)
Heinemann. K., Osaka, T.. Poppa, H.: Ultramicroscopy 12, 9 (1983)
Stulga, J. E., Wynblatt, P., Tien, J. K.: J. Catal. 62. 59 (1980)
Chen, M.. Schmidt. L. D.: J. Catal. 55, 348 (1978)
Baker, R. T. K.: J. Catal. 63. 523 (1980)
Clark, R. W., Wynblatt. P., Tien. J. K.: Acta Met. 30, 139 (1982)
Chen, M.. Wang. T.. Schmidt, L. D.: J. Catal. 60, 356 (1979)
Wang. T.. Schmidt, L. D.: J. Catal. 70, 187 (1981)
Baker, R. T. K., Prestridge. E. B. Garten, R. L.: J. Catal. 59. 293 (1979)
Baker. R. T. K.. Prestridge. E. B., Murrell. L. L.: J. Catal. 79, 348 (1983)
Derouane. E. G., Chendzinski. J. J., Baker, R. T. K.: J. Catal. 85. 187 (1984)
Mériaudeau, P.. Ellestad, O. H.. Dufaux, M., Naccache, C.: J. Catal. 75. 243 (1982)
Yao, H. C., Sieg, M., Plummer, H. K. jnr.: J. Catal. 59, 365 (1979)
Koopman, P. G. J.; Kieboom, A. P. G., van Bekkum, H.: J. Catal. 69. 172 (1981)
Wang. T.. Schmidt, L. D.: J. Catal. 71. 411 (1981)
Foger, K., Jaeger, H.: J. Catal. 92, 64 (1985)
Honjo, G., Yagi, K.: In: Current Topics in Materials Science. (Kaldis, E., ed.). North Holland Publishing Co. 6. 1980, p. 197
Honjo. G.. Takayanagi, K., Kobayashi, K., Yagi, K.: phys. stat. sol. 55, 353 (1979)
Metois, J. J., Heinemann, K., Poppa. H.: Phil. Mag. 35, 1413 (1977)
Heinemann, K.. Poppa, H.: Thin Solid Films 33, 237 (1976)
Jaeger, H.. Mercer, P. D.. Sherwood. R. G.: Surface Sci. 13, 349 (1969)
Wasserman. E. F., Hines, R. L.: J. Appl. Phys. 38, 196 (1967)
Baker, R. T. K.. Thomas, C. Thomas. R. B.: J. Catal. 38, 510 (1975)
McVicker. G. B.. Garten. R. L., Baker. R. T. K.: J. Catal. 54, 129 (1978)
Gai. P. L., Goringe. M. J.: Proc. Ann. Meeting Electron Microscopical Soc. Amer. 39th, 68 (1981)
Baker, R. T. K., Harris, P. S.: In: Chemistry and Physics of Carbon. Vol. 14. New York: Dekker 1978, p. 83
Baker, R. T. K.: Catal. Rev.-Sci. Eng. 19, 161 (1979)
Keep. C. W.. Wells. M.: J. Catal. 66, 451 (1980)
Baker, R. T. K., Sherwood, R. D.: J. Catal. 70, 198 (1981)
Baker. R. T. K.. Sherwood, R. D.. Derouane, E. G.: J. Catal. 75, 382 (1982)
Simoens. A. J.. Derouane, E. G.. Baker. R. T. K.: J. Catal. 75. 175 (1982)
Derouane, E. G., Baker. R. T. K., Dumesic, J. A., Sherwood, R. D.: J. Catal. 69 101 (1981)
Baker, R. T. K., Sherwood. R. D., Dumesic, J. A.: J. Catal. 62, 221 (1980)
Baker, R. T. K.. Sherwood, R. D.. Dumesic, J. A.: J. Catal. 66, 56 (1980)
Baker, R. T. K.. Sherwood, R. D.: J. Catal. 61. 378 (1980)
Coates, D. J.. Evans, J. W.. Cabrera. A. L., Somerjai, G. J., Heineman, H.: J. Catal. 80. 215 (1983)
Yang. R. T.. Wong. C: J. Chem. Phys. 75. 4471 (1981)
Takayanagi, K., Yagi, K., Kobayashi, K., Honjo. G.: J. Phys. E.: Sci. Inst. 11. 441 (1978)
Howie. A.: J. Microscopy 129. 239 (1983)
Smith, D. J.. Stobbs. W. M.. Saxton, W. O.: Phil. Mag. B43, 907 (1981)
Bursill. L. A.. Mallinson. L. G., Elliot. S. R., Thomas. J. M.: J. Phys. Chem. 85. 3004 (1981)
Rudec, M. L.: phys. stat. sol. B46. K1 (1971)
Rudec. M. L. Howie, A.: Phil. Mag. 25, 1001 (1972)
Berry, M. V., Doyle, P. A.: J. Phys. C. Solid State Phys. 6, L6 (1973)
Oberlin. A.: Carbon 17. 7 (1979)
Fryer, J. R.: Carbon 19. 431 (1981)
Sanders, J. V.. Spink, J. A., Pollack, S. S.: Applied Catal. 5. 65 (1983)
Haldeman. R. G., Botty. M. C.: J. Phys. Chem. 63. 489 (1959)
Marsh, H., Crawford, D., O’Grady, T. M., Wennerberg, A.: Carbon 20, 419 (1982)
Iijima, S.: Chemica Scripta 14. 117 (1978–79)
Ban, L. L., Crawford, D., Marsh, H.: J. Appl. Cryst. 8. 415 (1975)
Rouzaud, J. N.. Oberlin, A., Beny-Bassez, C.: Thin Solid Films 105, 75 (1983)
Jefferson, D. A.. Millward, G. R., Thomas, J. M.: Acta Cryst. A32, 823 (1976)
Thomas. J. M.. Millward, G. R.. Schlögl. R. F.. Boehm. H. P.: Mater. Res. Bull. 15. 671 (1980)
Beer. M.. Carpenter. R. W.. Eyring. LeR.. Lyman, C. E., Thomas, J. M.: Chem. & Eng. News 59, 40 (1981)
Millward, G. R., Jefferson. D. A., Thomas, J. M.: J. Microscopy 113, 1 (1978)
Smith. P. P. K.. Buseck. P. R.: Science 212, 322 (1981)
Heimann. R. B.. Kleiman. J.. Salanzky, N. M.: Nature 306, 164 (1983)
Hayatsu. R., Scott, R. G., Studier, M. H., Lewis, R. S., Anders. E.: Science 209, 1515 (1980)
Whittaker, A. G., Watts. E. J., Lewis, R. S., Anders, E.: Science 209. 1512 (1980)
Whittaker. A. G.: Carbon 17. 21 (1979)
Smith. P. P. K.. Buseck, P. R.: Science 212. 322 (1981)
Smith, P. P. K., Buseck. P. R.: Science 216, 984 (1982)
Davis, W. R., Slawson. R. J.. Rigby, G. R.: Nature 171, 756 (1953)
Baird, T.. Fryer, J. R.. Grant. B.: Carbon 12. 591 (1974)
Audier. M.,,Oberlin, A., Coulon. M.: J. Crystal Growth 55. 549 (1981)
Baker, R. T. K., Harris, P. S.. Thomas. B., Waite. R. J.: J. Catal. 30, 86 (1973)
Ruston, W. R.. Warzec, M., Hennant, J., Waty. J.: Carbon 7. 47 (1969)
Baker. R. T. K.. Alonzo. J. R.. Dumesic. J. A.. Yates. D. J. C.: J. Catal. 77, 74 (1982)
Baker, R. T. K.: Cat. Rev.-Sci Eng. 19, 161 (1979)
Baker, R. T. K., Chludzinski, jnr., J. J.: J. Catal. 64, 464 (1980)
Jackson. S. D., Thompson, S. J.. Webb. G.: J. Catal. 70, 249 (1981)
Kawasumi, S.. Egashira. M.. Katsuki, H.: J. Catal. 68. 237 (1981)
Audier. M.. Oberlin. A.. Oberlin, M., Coulon. M.. Bonnetain. L.: Carbon 19. 217 (1981)
Sacco, jnr. A., Thacker, P., Chang, T. N., Chiang, A. T. S.: J. Catal. 85, 224 (1984)
Harvard. D. C. Wilson. R.: J. Colloid & Interface Sci. 57. 276 (1976)
Gaskell, P. H.. Mistry. A. B.: Phil. Mag. A39, 245 (1979)
Wilson. S. J.: J. Solid State Chem. 30. 247 (1979)
Wilson. S. J.: Mineral. Mag. 43. 301 (1979)
Spitler. C. A.. Pollack. S. S.: J. Catal. 69. 241 (1981)
Lippens, B. C. de Boer. J. H.: Acta Cryst. 17. 1312 (1964)
Soled. S.: J. Catal. 81. 252 (1983)
Dominguez. E. J. M., Acosta, N. D. R„ Schifter. S. I.: J. Catal. 83. 480 (1983)
Bursill. L. A.. Lodge. E. A.. Thomas. J. M.: Nature 286. I II (1980)
Bursill. L. A.. Thomas, J. M.: J. Phys. Chem. 85, 3007 (1981)
Thomas. J. M.. Ramdas. S.. Millward. G. R.. Klinowski. J.. Audier. M.. Gonzalez- Colbet. J.. Fyfe, C. A.: J. Solid State Chem. 45. 368 (1982)
Audier. M.. Thomas. J. M.. Klinkowski. J.. Jefferson. D. A.. Bursill, L. A.: J. Phys. Chem. 86. 581 (1982)
Thomas, J. M., Millward, G. R.: J. Chem. Soc. Chem. Commun. 24, 1380 (1982)
Millward. G. R.. Ramdas. M.. Thomas. J. M., Barlow. M. T.: J. Chem. Soc. Faraday Trans. II 79. 1075 (1983)
Gallezot, P., Alarcon-Diaz, A., Dalmon, J. A., Renouprez, A. J., Imelik, B.: J. Catal. 39, 334 (1975)
Beshoukhanova, C., Guidot, J.. Barthomeuf, D.: J. Chem. Soc. Faraday Trans. I 77. 1595 (1981)
Schmidt. H.: In: Metal microstructures in zeolites. (Jacobs, P. A.. Jaeger, N. I.. Jiru, P.. Schulz-Eklott, G. eds.). Amsterdam: Elsevier Scientific Publ. Co. 1982, p. 191
Exner, D., Jaeger, N., Nowak, R., Schriibers, H., Schulz-Eklott, G.: J. Catal. 74, 188 (1982)
Gallezot, P.: Catal. Rev.-Sci. Eng. 20, 121 (1979)
Terasaki, O., Thomas, J. M., Ramdas, S.: Chem. Commun. 216 (1984)
Sharma, R. K.. Rai, K. N., Srivastava, R. D.: J. Catal. 63, 271 (1980)
Smith, D. J., Fisher, R. M., Freeman. L. A.: J. Catal. 72, 51 (1981)
Candia, R., Clausen, B. S., Topsoe, H.: J. Catal. 77, 564 (1982)
Sanders, J. V.. Pratt. K. C.: J. Catal. 67, 331 (1981)
Pratt, K. C., Sanders, J. V.: J. Catal. 66, 82 (1980)
Duchet. J. C., van Oers. E. M. de Beer, V. H. J.. Prins. R.: J. Catal. 80. 386 (1983)
Figueras, F., Figlarz, M., Portefaix, J. L., Forissier, M., Gerand, B., Guenot, J.: J. Catal. 71, 389 (1981)
Barber, S., Booth, J., Pyke, D. R., Reid, R., Tilley, R. J. D.: J. Catal. 77, 180 (1982)
De Rossi. S., Iguchi, E., Schiavello, M., Tilley. R. J. D.: J. Catal. 61. 256 (1980)
Gai, P. L., Boyes, E. D., Bart, J. C. J.: Phil. Mag. A45, 531 (1982)
Cowley, J. M.. Wheatley, J. C., Kehl, W. L.: J. Catal. 56, 185 (1979)
Somorjai, G. A.: Catal. Rev. 7. 87 (1972)
Hojlund, P. E., Cowley, J. M.: Surface Sci. 54, 340 (1976)
Osakabe, N., Tanishiro, Y... agi, K., Honjo, G.: Surface Sci. 97, 393 (1980)
OSakabe, N., Tanishiro, Y., Yagi, K., Honjo, G.: Surface Sci. 102, 424 (1981)
Cowley, J. M.: Surface Sci. 114, 587 (1982)
Moodie. A. F., Warble, C. E.: J. Crystal Growth 10. 26 (1971)
Iijima, S.: Optik 47, 437 (1977)
Marks, L. D.. Smith, D. J.: Nature 303, 316 (1983)
Bonzel, H. P., Ferrer, S.: Surface Sci. 118, L263 (1982)
Cowley, J. M.: J. Microscopy 129, 253 (1983)
Pennycook, S. J.: J. Microscopy 124, 15 (1981)
Dexpert. H., Freund. E., Lesage, E., Lynch. J. P.: Studies in Surface Science in Catalysis 11. 53 (1982)
Blanchard, G., Charcosset, H.. Dexpert, H., Freund. E., Leclercq. C., Martino, G.: J. Catal. 70, 168 (1981)
Houalla, M., Delannay, F., Delmon, B.: J. Chem. Soc. Faraday Trans. I, 76, 1766 (1980)
Auroux, A.. Dexpert, H., Leclercq, C. Vedrine, J.: Applied Catal. 6, 95 (1983)
Turkevich, J.. Ban, L. L., Wall, J. H.: In: Perspectives in catalysis. (Larsson, R.. ed.). Sweden: CWK Gleerup 1981, p. 59
Cowley. J. M.: private communication (1984)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1985 Springer-Verlag, Berlin, Heidelberg
About this chapter
Cite this chapter
Sanders, J.V. (1985). The Electron Microscopy of Catalysts. In: Anderson, J.R., Boudart, M. (eds) Catalysis. Catalysis, vol 7. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-93281-6_2
Download citation
DOI: https://doi.org/10.1007/978-3-642-93281-6_2
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-93283-0
Online ISBN: 978-3-642-93281-6
eBook Packages: Springer Book Archive