Abstract
We shall use the term “scene analysis” to denote the assignment of labels or interpretations to the results of a segmentation algorithm. For example, we may decide to call a region the “right lung” in a chest x-ray picture, or a set of regions a “highway” in a satellite photograph. Furthermore, we may assign a group of regions to a single solid object. The early work of GUZMAN [6.1] is a typical example of a solution to this problem using some simple semantic rules. Scene analysis is a central problem in both pattern recognition and artificial intelligence and there is a rich literature on it. We could have postponed our treatment of the subject until the end of this book but we choose to discuss it here because of its traditional connection with picture segmentation. Such “interpretation guided segmentation” has been emphasized in the research of the Artificial Intelligence Laboratories and it is exemplified by the work of BAJCSY, BARROW, BINFORD, GARVEY, NAGAO, TENENBAUM, YAKIMOVSKY, and SAKAI, among others [6.2–13]. It has been also used in the context of medical image analysis by HARLOW and his colleagues [6.14,15]. We take advantage of this opportunity to discuss some important questions in “computer vision”, which extend beyond segmentation.
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References
A.Guzman: Proc. Fall Joint Comput. Conf. 33, 291–304 (1968)
H.G.Barrow, A.P.Ambler, R.M.Burstall: In Frontiers of Pattern Recognition, ed. by S.Watanabe ( Academic Press, New York 1972 ) pp. 1–29
Y.Yakimovsky, J.Feldman: Proc. 3rd Int. Joint Conf. Artificial Intelli- gence (Stanford Aug. 1973 ) pp. 580–588
R.Nevatia, T.O.Binford: Proc. 3rd Int. Joint Conf. Artificial Intelligence (Stanford Aug. 1973 ) pp. 641–647
W.A.Perkins, T.O.Binford: CGIP 2, 355–376 (1973)
M.Nagao, S.Hashimoto, T.Sakai: CGIP 2, 272–280 (1973)
J.M.Tenenbaum: CGIP 2, 308–320 (1973)
J.A.Feldman, Y.Yakimovsky: Artificial Intelligence Journal 5, 349–371 (1974)
M.Aiello, C.Lami, U.Montanari: CGIP 3, 225–235 (1974)
R.Bajcsy, M.Tavakoli: IEEE Trans. CAS-22, 463–474 (1975)
J.M.Tenenbaum, H.G.Barrow: Proc. 3rd Intern. Joint Conf. Pattern Recognition (Coronado, Calif. Nov. 8–11, 1976 ) pp. 504–513
T.D.Garvey: Proc. 3rd Intern. Joint Conf. Pattern Recognition (Coronado, Calif. Nov. 8–11, 1976 ) pp. 567–575
T.Sakai, T.Kanade, Y.Ohta: Proc. 3rd Intern. Joint Conf. Pattern Recognition (Coronado, Calif. Nov. 8–11, 1976 ) pp. 581–585
C.A.Harlow, S.A.Eisenbeis: IEEE Trans. C-22, 678–689 (1973)
C.A.Harlow, S.J.Dywer III, G.Lodwick: In Digital Picture Analysis, ed. by A.Rosenfeld, Topics in Applied Physics, Vol. 11 (Springer, Berlin, Heidelberg, New York 1976 ) pp. 65–150
D.Waltz: In Applied Computation Theory, ed. by T.Yeh ( Prentice Hall, New York 1976 ) pp. 468–529
A.Rosenfeld, R.A.Hummel, S.W.Zucker: IEEE Trans. SMC-6, 420–433 (1976)
S.W.Zucker: Proc. 3rd Intern. Joint Conf. Pattern Recognition (Coronado, Calif. Nov. 8–11, 1976 ) pp. 852–861
S.W.Zucker, R.A.Hummel, A.Rosenfeld: IEEE Trans. C-26, 394–403 (1977)
J.E.Hoperoft, J.D.Ullman: Formal Languages and Their Relation to Automata ( Addison-Wesley, Reading 1969 )
J.M.Brayer, P.H.Swain, K.S.Fu: In Syntactic Pattern Recognition, Application’s, ed. by K.S.Fu (Springer, New York, Heidelberg, Berlin 1977 ) pp. 215–242
J.Keng, K.S.Fu: Proc. Symp. Current Math. Problems in Image Science (Monterey, Calif. Nov. 1976 )
S.W.Zucker: Production Schemes with Feedback, Tech. Report No. 77–2 ( McGill Univ., Febr. 1977 )
D.Nitzan, A.E.Brain, R.O.Duda: IEEE Proc. 65, 206–220 (1977)
M.R.Garey, D.S.Johnson, R.E.Tarjan: SIAM J. of Computing 5, 704–714 (1976)
J.R.Ullmann: JACM 23, 31–42 (1976)
M.O.Rabin: Proc. IFIPS 615–619 (1974)
R.Ford,Jr., D.R.Fulkerson: Flows in Networks, (Princeton Univ. Press, Princeton 1962 )
S.L.Tanimoto, T.Pavlidis: CACM 20, 223–229 (1977)
S.Tanimoto: In Proc. IEEE Dec. Control Conf. (Clearwater, Florida Dec. 1976)
N.Badler: 2nd Intern. Joint Conf. Pattern Recognition (Copenhagen, August 1974 ) pp. 157–161
L.Uhr: Proc. 3rd Intern. Joint Conf. Pattern Recognition (Coronado, Calif. Nov. 8–11, 1976 ) pp. 287–293
J.K.Aggarval, R.O.Duda: IEEE Trans. C-24, 966–976 (1975)
C.R.Brice, C.L.Fennema: Artificial Intelligence Journal 1, 205–226 (1970)
Y.Yakimovsky: JACM 23, 599–618 (1976)
K.S.Fu: Sequential Methods in Pattern Recognition and Machine Learning ( Academic Press, New York 1968 )
D.Marr: On the purpose of Zow level vision,MIT-Art. Intel. Tech. Report 324 (1974)
E.C.Freuder: In Pattern Recognition and Artificial Intelligence, ed. by C.H.Chen ( Academic Press, New York 1976 ) pp. 248–256
B.L.Bullock: In Pattern Recognition and Artificial Intelligence, ed. by C.H.Chen ( Academic Press, New York 1976 ) pp. 61–85
S.W.Zucker, E.V.Krisnamurthy, R.L.Haar: Tech. Report TR-477, Univ. of Mayland, August 1976
E.A.Coddington, N.Levinson: Theory of Ordinary Differential Equations ( McGraw-Hill, New York 1955 )
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Pavlidis, T. (1977). Scene Analysis. In: Structural Pattern Recognition. Springer Series in Electrophysics, vol 1. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-88304-0_6
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DOI: https://doi.org/10.1007/978-3-642-88304-0_6
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