Secondary Ion Emission from NbV-Alloys

  • J. Schou
  • G. Flentje
  • W. O. Hofer
  • U. Linke
Conference paper
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 19)

Abstract

In an attempt to establish quantitative analyses of solids by secondary ion mass spectrometry (SIMS), a series of samples in the niobium-vanadium binary alloy system was studied. Ejection of cluster particles, both electrically charged and neutrals, was recently reported to confirm closely to the stoichiometry of the targets [1]. In an extension of this and related work [2,3,4] the behaviour of monoatomic particles as well as the influence of surface morphology was investigated here.

Keywords

Auger 

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References

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    J. Schou and W.O. Hofer, to be publishedGoogle Scholar
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Copyright information

© Springer-Verlag Berlin Heidelberg 1982

Authors and Affiliations

  • J. Schou
    • 1
  • G. Flentje
    • 2
  • W. O. Hofer
    • 2
  • U. Linke
    • 2
  1. 1.Risø National LaboratoryRoskildeDenmark
  2. 2.I.G.V., Kernforschungsanlage JülichJülichFed. Rep. of Germany

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