Secondary Ion Emission from NbV-Alloys
In an attempt to establish quantitative analyses of solids by secondary ion mass spectrometry (SIMS), a series of samples in the niobium-vanadium binary alloy system was studied. Ejection of cluster particles, both electrically charged and neutrals, was recently reported to confirm closely to the stoichiometry of the targets . In an extension of this and related work [2,3,4] the behaviour of monoatomic particles as well as the influence of surface morphology was investigated here.
KeywordsCluster Emission Deformed Surface Layer Auger Image Vibratory Polishing Carbidic Carbon
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