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Secondary Ion Emission from NbV-Alloys

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Secondary Ion Mass Spectrometry SIMS III

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 19))

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Abstract

In an attempt to establish quantitative analyses of solids by secondary ion mass spectrometry (SIMS), a series of samples in the niobium-vanadium binary alloy system was studied. Ejection of cluster particles, both electrically charged and neutrals, was recently reported to confirm closely to the stoichiometry of the targets [1]. In an extension of this and related work [2,3,4] the behaviour of monoatomic particles as well as the influence of surface morphology was investigated here.

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References

  1. J. Schou and W.O. Hofer, to be published

    Google Scholar 

  2. G. Blaise, in “Material Characterization Using Ion Beams”, eds. J.P. Thomas and A. Cachard ( Plenum, New York, 1978 ) p. 143

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  3. Ming L. Yu and W. Reuter, J. Appl. Phys. 52, 1478 (1981)

    Article  ADS  Google Scholar 

  4. M. Riedel, T. Nenadovic and B. Perovic, Acta Chim. Acad. Sci. Hung. 97, 197 (1979)

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  5. J. Giber and W.O. Hofer, in “Proc. of the Symposium on Sputtering”, eds. P. Varga, G. Betz and F.P. Viehböck ( Inst. für Allg. Physik, Technical University of Vienna, 1980 ) p. 697

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  6. W.O. Hofer and F. Thum, Nucl. Instr. Meth. 149, 535 (1978)

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  7. G. Modler and H.E. Beske, KFA-rep. 1651, Kernforschungsanlage Jülich (1980)

    Google Scholar 

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Author information

Authors and Affiliations

  1. Risø National Laboratory, DK-4000, Roskilde, Denmark

    J. Schou

  2. I.G.V., Kernforschungsanlage Jülich, D-5170, Jülich, Fed. Rep. of Germany

    G. Flentje, W. O. Hofer & U. Linke

Authors
  1. J. Schou
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  2. G. Flentje
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  3. W. O. Hofer
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  4. U. Linke
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Editor information

Editors and Affiliations

  1. Physikalisches Institut, Universität Münster, D-4400, Münster, Fed. Rep. of Germany

    A. Benninghoven

  2. Physical Institute of the Technical University, H-1111, Budapest, Hungary

    J. Giber  & J. László  & 

  3. Department of Physical Chemistry and Radiology, Eötvös University, H-1111, Budapest, Hungary

    M. Riedel

  4. Philips Research Laboratories, Eindhoven, The Netherlands

    H. W. Werner

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© 1982 Springer-Verlag Berlin Heidelberg

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Schou, J., Flentje, G., Hofer, W.O., Linke, U. (1982). Secondary Ion Emission from NbV-Alloys. In: Benninghoven, A., Giber, J., László, J., Riedel, M., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS III. Springer Series in Chemical Physics, vol 19. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-88152-7_26

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  • DOI: https://doi.org/10.1007/978-3-642-88152-7_26

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-88154-1

  • Online ISBN: 978-3-642-88152-7

  • eBook Packages: Springer Book Archive

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