Secondary Ion Emission from NbV-Alloys

  • J. Schou
  • G. Flentje
  • W. O. Hofer
  • U. Linke
Conference paper
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 19)


In an attempt to establish quantitative analyses of solids by secondary ion mass spectrometry (SIMS), a series of samples in the niobium-vanadium binary alloy system was studied. Ejection of cluster particles, both electrically charged and neutrals, was recently reported to confirm closely to the stoichiometry of the targets [1]. In an extension of this and related work [2,3,4] the behaviour of monoatomic particles as well as the influence of surface morphology was investigated here.


Cluster Emission Deformed Surface Layer Auger Image Vibratory Polishing Carbidic Carbon 
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Copyright information

© Springer-Verlag Berlin Heidelberg 1982

Authors and Affiliations

  • J. Schou
    • 1
  • G. Flentje
    • 2
  • W. O. Hofer
    • 2
  • U. Linke
    • 2
  1. 1.Risø National LaboratoryRoskildeDenmark
  2. 2.I.G.V., Kernforschungsanlage JülichJülichFed. Rep. of Germany

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