Abstract
The interaction of laser pulses with strongly absorbing media has received a great deal of attention during the past five years, especially in silicon [1–3]. An important issue has been the time scale of energy transfer between a dense electron-hole plasma and the lattice. If this energy transfer were insignificant during a picosecond pulse, it is clear that the plasma temperature would attain much higher values. We have presented ample evidence [4,5] that melting of a silicon surface layer can take place during a 20 ps laser pulse. There is a sharply defined fluence threshold (0.2 J/cm2 for a 20 ps pulse at λ = 532 nm on silicon) above which the reflectivity changes to a value characteristic of liquid phase, the evaporation of silicon atoms becomes appreciable, and an amorphous phase may be created by rapid resolidification, with cooling rates exceeding 1013 °C/sec, of a thin (10 nm) molten layer on top of a cool crystalline substrate.
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© 1982 Springer-Verlag Berlin Heidelberg
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Lui, J.M., Kurz, H., Bloembergen, N. (1982). Picosecond Time-Resolved Detection of Plasma Formation and Phase Transition in Silicon. In: Eisenthal, K.B., Hochstrasser, R.M., Kaiser, W., Laubereau, A. (eds) Picosecond Phenomena III. Springer Series in Chemical Physics, vol 23. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87864-0_80
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DOI: https://doi.org/10.1007/978-3-642-87864-0_80
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