Electrical Transient Sampling System with Two Picosecond Resolution
With the advent of picosecond photodetectors, photoconductive switches and other ultrafast devices, the need has arisen for a measurement system capable of characterizing small electrical signals with picosecond accuracy. Techniques for measuring ultrafast electrical signals to date have limitations in their use. Sampling oscilloscopes have temporal resolutions limited by their electronic sampling window. This is typically ~ 25 ps. Recently, Auston1 demonstrated a sampling technique in amorphous semiconductors that can resolve electrical transients as short as 5 to 10 ps. However, the ultimate resolution of that system is constrained by a material recovery time of approximately 10 ps.