Temperature and Substrate Dependence of 1/f-Noise in Continous Metal Films

  • P. Dutta
  • P. M. Horn
  • J. W. Eberhard
Conference paper
Part of the Springer Series in Electrophysics book series (SSEP, volume 2)


Measurement of the temperature dependence of 1/f noise in continuous copper and silver films on quartz and sapphire substrates leads to the identification of two types of noise occurring simultaneously in these films: one is strongly temperature-dependent and characteristic of the metal, while the other is weakly temperature-dependent and affected by the substrate.


Diffusion Equation Thermal Contact Sapphire Substrate Thermal Fluctuation Thermal Response 
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  1. 1.
    J. W. Eberhard and P. M. Horn, Phys. Rev. Lett.39, 643 (1977).ADSCrossRefGoogle Scholar
  2. 2.
    R. F. Voss and J. Clarke, Phys. Rev. B13, 556 (1976).ADSCrossRefGoogle Scholar
  3. 3.
    P. Dutta, J. W. Eberhard and P. M. Horn, preprint.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1978

Authors and Affiliations

  • P. Dutta
    • 1
  • P. M. Horn
    • 1
  • J. W. Eberhard
    • 2
  1. 1.The James Franck Institute and The Department of PhysicsThe University of ChicagoChicagoUSA
  2. 2.General Electric Research and Development CenterSchenectadyUSA

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