Abstract
Measurement of the temperature dependence of 1/f noise in continuous copper and silver films on quartz and sapphire substrates leads to the identification of two types of noise occurring simultaneously in these films: one is strongly temperature-dependent and characteristic of the metal, while the other is weakly temperature-dependent and affected by the substrate.
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References
J. W. Eberhard and P. M. Horn, Phys. Rev. Lett.39, 643 (1977).
R. F. Voss and J. Clarke, Phys. Rev. B13, 556 (1976).
P. Dutta, J. W. Eberhard and P. M. Horn, preprint.
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© 1978 Springer-Verlag Berlin Heidelberg
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Dutta, P., Horn, P.M., Eberhard, J.W. (1978). Temperature and Substrate Dependence of 1/f-Noise in Continous Metal Films. In: Wolf, D. (eds) Noise in Physical Systems. Springer Series in Electrophysics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87640-0_24
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DOI: https://doi.org/10.1007/978-3-642-87640-0_24
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