Temperature and Substrate Dependence of 1/f-Noise in Continous Metal Films
Measurement of the temperature dependence of 1/f noise in continuous copper and silver films on quartz and sapphire substrates leads to the identification of two types of noise occurring simultaneously in these films: one is strongly temperature-dependent and characteristic of the metal, while the other is weakly temperature-dependent and affected by the substrate.
KeywordsDiffusion Equation Thermal Contact Sapphire Substrate Thermal Fluctuation Thermal Response
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