Abstract
The current noise generated in thick films has been an important subject of study in microcircuits because of the growing applications of thick film circuits in sensitive electronic equipment. It has been well recognized that thick film integrated circuits (ICs), as compared with monolithic ICs, are best suited for low volume precision circuits and complex arrays because their production cost is much lower and a very close tolerance of component values can be obtained by trimming. The trimming process of a resistor is often performed by using an air abrasive or laser trimmer to remove resistor material from the substrate for adjusting the resistance value. The process is often automatically controlled by a computer and is widely used in the integrated circuit fabrication.
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Work supported by the National Science Foundation, Grant No. ENG 75-22280, U.S.A.
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References
C. Y. Kuo and H. G. Blank, Proc. ISHM Hybrid Microelectron. Symp. (1968)
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G. E. Pike and C. H. Seager, “Electrical Properties of DuPont Birox and Cermalloy Thick Film Resistors II: Conduction Mechanisms”, Sandia Technical Report SAND 76–0558 (1977)
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© 1978 Springer-Verlag Berlin Heidelberg
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Chen, T.M. (1978). Current Noise in Thick Film Resistors. In: Wolf, D. (eds) Noise in Physical Systems. Springer Series in Electrophysics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87640-0_19
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DOI: https://doi.org/10.1007/978-3-642-87640-0_19
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