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Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Metals

  • W. Lange
  • D. Holtkamp
  • M. Jirikowsky
  • A. Benninghoven
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 25)

Abstract

Normally samples for the investigation of the secondary ion emission from organic molecules are prepared outside the vacuum chamber of the mass spectrometer, by deposition of an appropriate solution on a substrate surface. Because of unavoidable contaminations originating from the ambient atmosphere and the solvent, and possible reactions between the solvent and the substrate material, this deposition technique does not result in a well-defined and reproducible chemical environment of the sample molecules on the target.

Keywords

Layer Growth Amino Acid Molecule Target Heating Damage Cross Section Monolayer Equivalent 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1983

Authors and Affiliations

  • W. Lange
    • 1
  • D. Holtkamp
    • 1
  • M. Jirikowsky
    • 1
  • A. Benninghoven
    • 1
  1. 1.Physikalisches InstitutUniversität MünsterMünsterFed. Rep. of Germany

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