Abstract
Normally samples for the investigation of the secondary ion emission from organic molecules are prepared outside the vacuum chamber of the mass spectrometer, by deposition of an appropriate solution on a substrate surface. Because of unavoidable contaminations originating from the ambient atmosphere and the solvent, and possible reactions between the solvent and the substrate material, this deposition technique does not result in a well-defined and reproducible chemical environment of the sample molecules on the target.
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© 1983 Springer-Verlag Berlin Heidelberg
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Lange, W., Holtkamp, D., Jirikowsky, M., Benninghoven, A. (1983). Secondary Ion Emission from UHV-Deposited Amino Acid Overlayers on Metals. In: Benninghoven, A. (eds) Ion Formation from Organic Solids. Springer Series in Chemical Physics, vol 25. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87148-1_13
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DOI: https://doi.org/10.1007/978-3-642-87148-1_13
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