Abstract
In the tail of the energy distribution of electrons emitted from solids bom barded by keV ions one can notice, in certain cases, Auger electrons from the filling of inner-shell (core) holes of target atoms.
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The reader may readily estimate the effect in the shape of the yield vs. energy curve of a contamination of a few percent of doubly charged ions with energy 2Eo on a beam of single charged ions of energy Eo, a situation found in the work of references 15, 23, 24 and 25.
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Baragiola, R.A. (1981). Ion-Induced Auger Electron Emission from Solids. In: Taglauer, E., Heiland, W. (eds) Inelastic Particle-Surface Collisions. Springer Series in Chemical Physics, vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-87065-1_2
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