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Characterization of a Pure C60 Powder Using Transmission Electron Microscopy

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Electronic Properties of Fullerenes

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 117))

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Abstract

Complementary to neutron and X ray diffraction, electron microscopy (TEM) is a very powerful technique for characterizing crystalline materials at microscopic and atomic scales. This technique has been rapidly used to study C60 and C70 solids [1, 2] and has allowed in particular to identify various lattice defects present in these materials and to determine different phase transitions through in situ experiments [1-5].

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Author information

Authors and Affiliations

  1. Laboratoire de Physique du Solide and LEM/CNRS ONERA, B.P. 72, F-92322, Châtillon Cédex, France

    A. Loiseau

  2. EMAT, University of Antwerp (RUCA), Groenenborgerlaan 171, B-2020, Antwerp, Belgium

    G. Van Tendeloo

  3. Laboratoire de Résonance Magnétique de Matériaux Solides, GDPC-USTL, case 026, F-34095, Montpellier Cédex 05, France

    P. Bernier

Authors
  1. A. Loiseau
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  2. G. Van Tendeloo
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  3. P. Bernier
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Editor information

Editors and Affiliations

  1. Institut für Festkörperphysik, Universität Wien, Strudlhofgasse 4, A-1090, Wien, Austria

    Hans Kuzmany

  2. Kernforschungszentrum Karlsruhe, Institut für Nukleare Festkörperphysik, Postfach 3640, D-76021, Karlsruhe, Germany

    Jörg Fink

  3. Physikalisches Institut II, Universität Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany

    Michael Mehring

  4. Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-70569, Stuttgart, Germany

    Siegmar Roth

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© 1993 Springer-Verlag Berlin Heidelberg

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Loiseau, A., Van Tendeloo, G., Bernier, P. (1993). Characterization of a Pure C60 Powder Using Transmission Electron Microscopy. In: Kuzmany, H., Fink, J., Mehring, M., Roth, S. (eds) Electronic Properties of Fullerenes. Springer Series in Solid-State Sciences, vol 117. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-85049-3_36

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  • DOI: https://doi.org/10.1007/978-3-642-85049-3_36

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-85051-6

  • Online ISBN: 978-3-642-85049-3

  • eBook Packages: Springer Book Archive

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