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Surface Science pp 35–48Cite as

Studies of Surface Composition and Structure Using Low-Energy Ion Scattering and SIMS

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Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 73))

Abstract

The use of low energy ion scattering and secondary ion mass spectrometry for the compositional and structural analysis of the top few monolayers of a surface is reviewed. Experimental results for scattering, sputtering and recoiling from clean and adsorbate covered Ni and Ni3 Al surfaces are used to illustrate the importance of charge exchange processes for quantitative composition analysis and the role of shadowing and blocking in structural analysis.

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Author information

Authors and Affiliations

  1. Department of Physics, The University of Newcastle, Callaghan, NSW, 2308, Australia

    R. J. MacDonald, D. J. O’Connor & B. V. King

Authors
  1. R. J. MacDonald
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  2. D. J. O’Connor
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  3. B. V. King
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Editor information

Editors and Affiliations

  1. Department of Physical Chemistry, University of New South Wales, P. O. Box 1, Kensington, NSW, 2033, Australia

    Russel F. Howe  & Robert N. Lamb  & 

  2. Institut für Physikalische und Theoretische Chemie, Universität Bonn, Wegelerstrasse 12, W-5300, Bonn, Germany

    Klaus Wandelt

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© 1993 Springer-Verlag Berlin Heidelberg

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MacDonald, R.J., O’Connor, D.J., King, B.V. (1993). Studies of Surface Composition and Structure Using Low-Energy Ion Scattering and SIMS. In: Howe, R.F., Lamb, R.N., Wandelt, K. (eds) Surface Science. Springer Proceedings in Physics, vol 73. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84933-6_3

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  • DOI: https://doi.org/10.1007/978-3-642-84933-6_3

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84935-0

  • Online ISBN: 978-3-642-84933-6

  • eBook Packages: Springer Book Archive

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