Abstract
Phonon focusing has been extensively studied using phonons with frequencies of several hundred GHz [1]. We have recently reported a related technique for studying anisotropies of acoustic flux at sub-GHz frequencies [2]. In these experiments using coherent waves, ultrasound is generated and detected by focused immersion transducers in a water bath. The transducers act as a point-source/point-receiver pair, one of which is scanned to produce an ultrasound image. We present here the experimental results for Si along with a model which accurately reproduces the observed images.
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For a review, see G.A. Northrop and J.P. Wolfe in Nonequilibrium Phonon Dynamics,edited by W.E. Bron (Plenum, New York, 1985), Chap: 5.
Matt R. Hauser, R.L. Weaver, J.P. Wolfe, Phys. Rev. Lett. 68, 2604 (1992)
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© 1993 Springer-Verlag Berlin Heidelberg
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Hauser, M.R., Weaver, R.L., Wolfe, J.P. (1993). Internal Diffraction of Acoustic Waves in Silicon. In: Meissner, M., Pohl, R.O. (eds) Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences, vol 112. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84888-9_29
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DOI: https://doi.org/10.1007/978-3-642-84888-9_29
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-84890-2
Online ISBN: 978-3-642-84888-9
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