Abstract
Two dimensional structures[1] in semiconductors are the major focus of this meeting. Diverse studies of these 2D devices where the electrons are confined to a single layer in these semiconducting material has substantially increased our knowledge of the behavior of electrons. Confinement in the lateral plane is equally desirable but this is much more difficult to achieve because of the limitations of conventional lithography. Conventional lithography is limited in two ways: (a) the lateral structures are large as compared to the electron wavelength, and (b) the high energy of the ions used for reactive etching create a damage layer in the sidewalls deep enough to affect the operation of the devices.
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Quate, C.F. (1992). Surface Modification with the SXM’s. In: Bauer, G., Kuchar, F., Heinrich, H. (eds) Low-Dimensional Electronic Systems. Springer Series in Solid-State Sciences, vol 111. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84857-5_8
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DOI: https://doi.org/10.1007/978-3-642-84857-5_8
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