Growth and Characterization of β-SiC Films Grown on Si by Gas-Source Molecular Beam Epitaxy

  • L. B. Rowland
  • S. Tanaka
  • R. S. Kern
  • R. F. Davis
Part of the Springer Proceedings in Physics book series (SPPHY, volume 71)

Abstract

Films of β-SiC have been grown on 4° off-axis Si (100) substrates from 1198 to 1398 K by gas-source MBE using Si2H6 and C2H4. Monocrystalline films were obtained at temperatures as low as 1248 K, as confirmed by electron diffraction. The latter films were specularly reflective. However, SEM revealed growth pits extending to the SiC surface as well as preferential growth on the pit edges. Cross-sectional TEM analysis confirmed the epitaxial relationship between the film and the Si substrate. Misfit dislocations and microtwins were also observed.

Keywords

Misfit Dislocation RHEED Pattern Epitaxial Relationship Auger Depth Profile Molecular Beam Epitaxy Apparatus 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • L. B. Rowland
    • 1
  • S. Tanaka
    • 1
  • R. S. Kern
    • 1
  • R. F. Davis
    • 1
  1. 1.Department of Materials Science and EngineeringNorth Carolina State UniversityRaleighUSA

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