Abstract
We investigate the electronic structure of the interface between aluminum and polythiophene by means of MNDO semiempirical quantum calculations on a model hexamer system. The results are compared to the experimental data obtained previously. Different adsorption sites for the metal atoms are considered and the degree of charge transfer is evaluated. Finally, the aluminum deposition is compared to the doping process.
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References
J.H. Burroughes, C.A. Jones, R.H. Friend: Nature 335, 137 (1988)
J.H. Burroughes, D.D.C. Bradley, A.R. Brown, R.N. Marks, R.H. Friend, P.L. Burn, A.B. Holmes: Nature 347, 539 (1990)
G. Horowitz, D. Fichou, X. Peng, Z. Xu, F. Garnier: Solid State Commun. 72, 381 (1989)
G. Gustafson, M. Sundberg, O. Inganas, C. Svensson: J. Molec. Electr., in press
F. Gamier, G. Horowitz, X. Peng, D. Fichou: Adv. Mater 2, 592 (1990)
R. Lazzaroni, J.L. Bredas, P. Dannetun, M. Lödglund, K. Uvdal, W.R. Salaneck: Synth. Met., in press
S. Stafström, J.L. Bredas: Phys. Rev. B 38, 4180 (1988)
R. Lazzaroni, M. Lögdlund, S. Stafström, W.R. Salaneck, J.L. Bredas: J. Chem. Phys. 93, 4433 (1990)
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© 1992 Springer-Verlag Berlin Heidelberg
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Stafström, S., Salaneck, W.R., Lazzaroni, R., Brédas, J.L. (1992). Modelling the Al/Polythiophene Interface: A Semiempirical Quantum Chemical Approach. In: Kuzmany, H., Mehring, M., Roth, S. (eds) Electronic Properties of Polymers. Springer Series in Solid-State Sciences, vol 107. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84705-9_64
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DOI: https://doi.org/10.1007/978-3-642-84705-9_64
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-84707-3
Online ISBN: 978-3-642-84705-9
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