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Determination of the Optical Constants of a Polythiophene Thin Film

  • R. Schwarz
  • W. A. Goedel
  • N. Somanathan
  • C. Bubeck
  • U. Scheunemann
  • W. Hickel
  • G. Wegner
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 107)

Abstract

Reflection and absorption spectroscopy in the visible range are used to determine the optical constants n and k of a thin spin cast film of poly(3-nhexylthiophene). The method is based on solving the Fresnel equations without any fit parameter. The results are in good accordance with a Kramers-Kronig analysis and results from ellipsometry.

Keywords

Refractive Index Optical Constant Reflection Spectroscopy Transmitted Intensity Reflection Loss 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • R. Schwarz
    • 1
  • W. A. Goedel
    • 1
  • N. Somanathan
    • 1
  • C. Bubeck
    • 1
  • U. Scheunemann
    • 2
  • W. Hickel
    • 2
  • G. Wegner
    • 1
  1. 1.Max-Planck-Institut für PolymerforschungMainzGermany
  2. 2.Hoechst AGFrankfurtGermany

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