Determination of the Optical Constants of a Polythiophene Thin Film

  • R. Schwarz
  • W. A. Goedel
  • N. Somanathan
  • C. Bubeck
  • U. Scheunemann
  • W. Hickel
  • G. Wegner
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 107)

Abstract

Reflection and absorption spectroscopy in the visible range are used to determine the optical constants n and k of a thin spin cast film of poly(3-nhexylthiophene). The method is based on solving the Fresnel equations without any fit parameter. The results are in good accordance with a Kramers-Kronig analysis and results from ellipsometry.

Keywords

Nickel Quartz Attenuation Chloroform Macromolecule 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • R. Schwarz
    • 1
  • W. A. Goedel
    • 1
  • N. Somanathan
    • 1
  • C. Bubeck
    • 1
  • U. Scheunemann
    • 2
  • W. Hickel
    • 2
  • G. Wegner
    • 1
  1. 1.Max-Planck-Institut für PolymerforschungMainzGermany
  2. 2.Hoechst AGFrankfurtGermany

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