Electron Holography and Its Applications to Surface Observation
The phase distribution of an electron beam is now measurable to a precision of 1/100 of the wavelength by using both electron holography and a “coherent” field-emission electron beam. Holographic interference micrographs obtained in this way can display the thickness distribution of a thin film or the topography of a single-crystalline surface in atomic dimensions.
KeywordsCoherence GaAs Beryllium Molybdenite
Unable to display preview. Download preview PDF.
- K. Takayanagi and K. Yagi, Trans. Jpn. Inst. Metals 24, 37 (1983).Google Scholar
- A. Endo, H. Daimon and S. Ino, to be published in Proceedings of the 12th International Congress for Electron Microscopy., Seattle 1990.Google Scholar
- D. Gabor, Proc. R. Soc. London, Ser. A 197, 454 (1949).Google Scholar
- A. Tonomura, Rev. Mod. Phys. 59, 639 (1987); see also A. Tonomura, Physics Today, April (1990) p. 22.Google Scholar
- J. Endo et al., Proceedings of the 13th International Comission for Optics, edited by H. Ohzu ( Organizing Committee, Sapporo, 1984 ) p. 480.Google Scholar