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Electron Holography and Its Applications to Surface Observation

  • Conference paper
Ordering at Surfaces and Interfaces

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 17))

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Abstract

The phase distribution of an electron beam is now measurable to a precision of 1/100 of the wavelength by using both electron holography and a “coherent” field-emission electron beam. Holographic interference micrographs obtained in this way can display the thickness distribution of a thin film or the topography of a single-crystalline surface in atomic dimensions.

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Author information

Authors and Affiliations

  1. Advanced Research Laboratory, Hitachi, Ltd., Hatoyama, Saitama, 350-03, Japan

    A. Tonomura

Authors
  1. A. Tonomura
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Editor information

Editors and Affiliations

  1. Department of Material Physics, Osaka University, Toyonaka, Osaka 560, Japan

    Akio Yoshimori

  2. Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan

    Teruya Shinjo

  3. Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan

    Hisatsune Watanabe

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© 1992 Springer-Verlag Berlin, Heidelberg

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Tonomura, A. (1992). Electron Holography and Its Applications to Surface Observation. In: Yoshimori, A., Shinjo, T., Watanabe, H. (eds) Ordering at Surfaces and Interfaces. Springer Series in Materials Science, vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84482-9_4

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  • DOI: https://doi.org/10.1007/978-3-642-84482-9_4

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84484-3

  • Online ISBN: 978-3-642-84482-9

  • eBook Packages: Springer Book Archive

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