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Ordering at Surfaces and Interfaces pp 337–342Cite as

Interfacial Superstructure and Schottky-Barrier Height of Metal/GaAs Contacts

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Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 17))

Abstract

The interfacial superstructures of metal(Al or Sb)/ GaAs(001) contacts are observed by using the grazing incident x-ray diffraction (GID) method. The Schottky-barrier heights for these contacts are also determined by using the current-voltage(I-V) or capacitance-voltage(C-V) methods. The Schottky-barrier heights for Al/GaAs contacts with and without an interfacial superstructure are almost the same. On the other hand, the Schottky-barrier heights of the Sb/GaAs contacts are found to differ by as much as 0.1 eV according to the difference in interfacial superstructure. This indicates the importance of the local electronic structure for Schottky-barrier formation at the metal/GaAs interfaces. The present results are discussed in connection with the current Schottky-barrier models.

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Author information

Authors and Affiliations

  1. Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan

    K. Hirose, K. Akimoto, I. Hirosawa, J. Mizuki, T. Mizutani & J. Matsui

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  1. K. Hirose
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  2. K. Akimoto
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  3. I. Hirosawa
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  4. J. Mizuki
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  5. T. Mizutani
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  6. J. Matsui
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Editor information

Editors and Affiliations

  1. Department of Material Physics, Osaka University, Toyonaka, Osaka 560, Japan

    Akio Yoshimori

  2. Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan

    Teruya Shinjo

  3. Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan

    Hisatsune Watanabe

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© 1992 Springer-Verlag Berlin, Heidelberg

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Hirose, K., Akimoto, K., Hirosawa, I., Mizuki, J., Mizutani, T., Matsui, J. (1992). Interfacial Superstructure and Schottky-Barrier Height of Metal/GaAs Contacts. In: Yoshimori, A., Shinjo, T., Watanabe, H. (eds) Ordering at Surfaces and Interfaces. Springer Series in Materials Science, vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84482-9_38

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  • DOI: https://doi.org/10.1007/978-3-642-84482-9_38

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84484-3

  • Online ISBN: 978-3-642-84482-9

  • eBook Packages: Springer Book Archive

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