Surface Electromigration of Au on Si(111) Studied by REM
Surface electromigration processes of Au on Si(111) were studied by reflection electron microscopy (REM). Migration processes depended on the adsorbate structure: Au atoms on the \(\sqrt 3 \times \sqrt 3\) adsorbate structure did not show electromigration, while Au atoms on the 5×2 structure showed electromigration in a direction antiparallel to the current. Au atoms migrated not only on the adsorbate structure but also on substrate Si surfaces, resulting in formation of patches of the 5×2 and 7×7 structures. These results were compared with those reported by Yasunaga et al. Preferential spread of one domain of the 5×2 structure were noted by the present REM method.
KeywordsMigration Auger Congo
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