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Angle-Resolved Electron Spectroscopy Study of the Surfaces and Interfaces of Silicon

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Ordering at Surfaces and Interfaces

Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 17))

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Abstract

Three types of angle-resolved electron spectroscopy for the study of solid surfaces have been demonstrated. They are angle-resolved ultraviolet photoelectron spectroscopy (ARUPS), X-ray photoelectron diffraction (XPD) and micro-probe Auger electron diffraction (µ-AED). Electronic structures of a single-domain Si(001)c(4×2) surface are revealed by ARUPS. Arrangements of Cs atoms on the Cs/Si(001) system are studied by XPD and LEED and an arrangement of In atoms in the Si(111)4×1-In surface is studied by µ -AED.

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References

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Author information

Authors and Affiliations

  1. Department of Physics, Faculty of Science, Tohoku University, Sendai 980, Japan

    S. Kono

Authors
  1. S. Kono
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Editor information

Editors and Affiliations

  1. Department of Material Physics, Osaka University, Toyonaka, Osaka 560, Japan

    Akio Yoshimori

  2. Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan

    Teruya Shinjo

  3. Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305, Japan

    Hisatsune Watanabe

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© 1992 Springer-Verlag Berlin, Heidelberg

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Kono, S. (1992). Angle-Resolved Electron Spectroscopy Study of the Surfaces and Interfaces of Silicon. In: Yoshimori, A., Shinjo, T., Watanabe, H. (eds) Ordering at Surfaces and Interfaces. Springer Series in Materials Science, vol 17. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84482-9_12

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  • DOI: https://doi.org/10.1007/978-3-642-84482-9_12

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-84484-3

  • Online ISBN: 978-3-642-84482-9

  • eBook Packages: Springer Book Archive

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