Advertisement

Determination of Defect Symmetries from ENDOR Angular Dependences

  • Johann-Martin Spaeth
  • Jürgen R. Niklas
  • Ralph H. Bartram
Chapter
  • 168 Downloads
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 43)

Abstract

The analysis of ENDOR angular dependences may sometimes be difficult since there is no systematic procedure leading from the experimental data directly to the structure of the defect. The only way to proceed is by guessing a defect model, and comparing angular dependences calculated for this model with the experimental ones. If no agreement is achievable, the defect model is wrong and must be modified. The interaction parameters, such as the shf and the quadrupole constants, are not known for the defect. They must be ”fitted” in order to obtain coincidence between the simulated and the experimental angular dependences. This fit, however, will only work if the structure of the model is correct in all details. Only the angular dependence of the ENDOR spectra provides the essential information about the defect structure. Therefore, a single ENDOR spectrum tells nothing about the validity of a defect model in most cases. The main step in any analysis of an ENDOR angular dependence is the simulation of angular dependences for a given defect model and given interaction parameters. The second step then is the fit of the interaction parameters to the experimental angular dependence.

Keywords

Angular Dependence Defect Model Magnetic Field Variation Interaction Tensor ENDOR Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Reference

  1. 6.1
    J.-M. Spaeth: Z. Physik 192, 107 (1966)CrossRefADSGoogle Scholar
  2. 6.2
    J.-M. Spaeth, M. Sturm: Phys. Stat. Sol. (b) 42, 739 (1970)CrossRefADSGoogle Scholar
  3. 6.3
    W.T. Doyle, A.B. Wolbarst: J. Phys. Chem. Sol. 36, 549 (1975)CrossRefADSGoogle Scholar
  4. 6.4
    G. Heder, J.R. Niklas, J.-M. Spaeth: Phys. Stat. Sol. (b) 100, 567 (1980)CrossRefADSGoogle Scholar
  5. 6.5
    J.R. Niklas, J.-M. Spaeth: Solid State Commun. 46, 121 (1983)CrossRefADSGoogle Scholar
  6. 6.6
    S. Greulich-Weber, J.R. Niklas, E. Weber, J.-M. Spaeth: Phys. Rev. B 30, 6292 (1984)CrossRefADSGoogle Scholar
  7. 6.7
    S. Greulich-Weber, J.R. Niklas, J.-M. Spaeth: J. Phys. C: Solid State Phys. 17, 911 (1984)CrossRefADSGoogle Scholar
  8. 6.8
    A. Cayley: Journal f. d. reine u. angew. Math. 32, 119 (1846)CrossRefzbMATHGoogle Scholar
  9. 6.9
    C. Rudowicz: Magn. Res. Rev. 13, 1 (1987)Google Scholar
  10. 6.10
    H.A. Buckmaster: Can. J. Phys. 42, 386 (1964)CrossRefADSGoogle Scholar
  11. 6.11
    J.R. Niklas, J.-M. Spaeth, G.D. Watkins: Proc. of the MRS Conf., San Francisco 1985, 46, 237 (1985)Google Scholar
  12. 6.12
    F. Beeler, M. Scheffler, O. Jepsen, O. Gunnarsson: Phys. Rev. Lett. 54, 2525 (1985)CrossRefADSGoogle Scholar
  13. 6.13
    H.A. Jahn, E. Teller: Proc. Roy. Soc. A 161, 220 (1937)CrossRefADSGoogle Scholar
  14. 6.14
    J. Sierro: J. Phys. Chem. Sol. 28, 417 (1967)CrossRefADSGoogle Scholar
  15. 6.15
    R.C. DuVarney, J.R. Niklas, J.-M. Spaeth: Phys. Stat. Sol. (b) 128, 673 (1985)CrossRefADSGoogle Scholar
  16. 6.16
    Th. Müssig, J.R. Niklas, F. Granzer, J.-M. Spaeth: Crystal Lattice Defects and Amorphous Materials 16, 169 (1987)Google Scholar
  17. 6.17
    J. Michel, J.R. Niklas, J.-M. Spaeth, C. Weinert: Phys. Rev. Lett. 57, 611 (1986)CrossRefADSGoogle Scholar
  18. 6.18
    J. Michel, J.R. Niklas, J.-M. Spaeth: Phys. Rev. B 40, 1732 (1989)CrossRefADSGoogle Scholar
  19. 6.19
    R. Wörner, O.F. Schirmer: Solid State Commun. 51, 665 (1984)CrossRefGoogle Scholar
  20. 6.20
    S. Greulich-Weber, J.R. Niklas, J.-M. Spaeth: J. Phys.: Condens. Matter 35, 1 (1989)Google Scholar
  21. 6.21
    H. Seidel: ”Superhyperfeinstruktur-Analyse paramagnetischer Störstellen in Kristallen mit Elektronen-Kern-Doppelresonanz (ENDOR)”; Habilitationsschrift, Univ. Stuttgart (1966)Google Scholar
  22. 6.22
    J. Hage, J.R. Niklas, J.-M. Spaeth: J. Electron. Mater. A 14, 1051 (1984)Google Scholar
  23. 6.23
    J. Hage, J.R. Niklas, J.-M. Spaeth: J. Phys. C: Semcond. Sei. and Tech- nol. 4, 773 (1989)ADSGoogle Scholar
  24. 6.24
    J.E. Feuchtwang: Phys. Rev. 126, 1628 (1962)CrossRefADSGoogle Scholar
  25. 6.25
    D. Schoemaker: Phys. Rev. 174, 1060 (1968)CrossRefADSGoogle Scholar
  26. 6.26
    J. Hage, J.R. Niklas, J.-M. Spaeth: Mater. Sei. Forum 10–12, 259 (1986)Google Scholar
  27. 6.27
    J. Hage: ”Magnetische Resonanzuntersuchungen an intrinsischen Defekten und Ubergangsmetallzentren in GaAs und GaP”; Doctoral Dissertation, Universität-GH Paderborn (1987)Google Scholar
  28. 6.28
    G.G. Beiford, R.L. Beiford, J.F. Burkhalter: J. Magn. Res. 11. 251 (1973)CrossRefGoogle Scholar
  29. 6.29
    M.I. Scullane, L.K. White, N.D. Chasteen: J. Magn. Res. 47, 383 (1982)CrossRefGoogle Scholar
  30. 6.30
    G. Heder, J.-M. Spaeth, A.H. Harker: J. Phys. C: Solid State Phys. 13, 4965 (1980)CrossRefADSGoogle Scholar
  31. 6.31
    J.-M. Spaeth, F. Koschnick: J. Phys. Chem. Sol. 52, 1 (1991)CrossRefADSGoogle Scholar
  32. 6.32
    H. Overhof, M. Scheffler, C.M. Weinert: Materials Science Forum 38–41, 293 (1989)Google Scholar
  33. 6.33
    H.H. Assenault, P. Marmet: Rev. Sci. Inst. 48, 512 (1977)CrossRefADSGoogle Scholar
  34. 6.34
    M.U.A. Bromba, H. Ziegler: Anal. Chem. 51, 1760 (1979)CrossRefGoogle Scholar
  35. 6.35
    H. Ziegler: Appi. Spectrosc. 35, 88 (1981)CrossRefADSGoogle Scholar
  36. 6.36
    M.U.A. Bromba, H. Ziegler: Anal. Chem. 53, 1583 (1981)CrossRefGoogle Scholar
  37. 6.37
    R.W. Schafer, R.M. Merserean, M.A. Richards: Proc. of the IEEE 69, 432 (1981)CrossRefADSGoogle Scholar
  38. 6.38
    B.R. Frieden: ”Image Enhancement and Restoration”,in Topics in Applied Physics, Vol. 6, ed. by T.S. Huang (Springer, Berlin, Heidelberg, New York 1979)Google Scholar
  39. 6.39
    J.R. Niklas: ”Elektronen-Kern-Doppelresonanz-Spektroskopie zur Strukturuntersuchung von Festkörperstörstellen”; Habilitationsschrift, Universität-GH Paderborn (1983)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Johann-Martin Spaeth
    • 1
  • Jürgen R. Niklas
    • 1
  • Ralph H. Bartram
    • 2
  1. 1.Fachbereich PhysikUniversität-GesamthochschulePaderbornFed. Rep. of Germany
  2. 2.Department of PhysicsUniversity of ConnecticutStorrsUSA

Personalised recommendations