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Electron Nuclear Double Resonance

  • Johann-Martin Spaeth
  • Jürgen R. Niklas
  • Ralph H. Bartram
Chapter
Part of the Springer Series in Solid-State Sciences book series (SSSOL, volume 43)

Abstract

In the previous chapters the usefulness of EPR for the characterization of defect structures was demonstrated. EPR is usually a powerful tool, in particular, for preliminary first information about the main symmetry properties of the defect. If optical detection of magnetic resonance is applicable, additional knowledge about the nature of the defect arising from its optical properties can be linked to its spin resonance properties.

Keywords

Nuclear Magnetic Resonance Nuclear Spin Deep Level Transient Spectroscopy ENDOR Spectrum ENDOR Line 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1992

Authors and Affiliations

  • Johann-Martin Spaeth
    • 1
  • Jürgen R. Niklas
    • 1
  • Ralph H. Bartram
    • 2
  1. 1.Fachbereich PhysikUniversität-GesamthochschulePaderbornFed. Rep. of Germany
  2. 2.Department of PhysicsUniversity of ConnecticutStorrsUSA

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