Abstract
Optical detection of EPR (ODEPR) differs from conventional detection basically in that a microwave-induced repopulation of paramagnetic Zeeman levels is indirectly detected by a change in some property of light, which is either absorbed or emitted by the defect under study. The light properties are polarizations or intensities, which are measured to detect EPR. These experiments are all double resonance experiments, one resonance being an optical resonance, the other one an EPR resonance. The optical detection of EPR has a number of interesting new features. One such feature is that, by virtue of the quantum transformation for detecting the signals from 1010 Hz to 1015 Hz, there is an enormous gain in sensitivity by several orders of magnitude. Thus, it becomes possible to study a very small number of defects. Originally, this sensitivity enhancement was used to study sparsely populated excited states of defects, and was, in fact, the major application of the optical detection of EPR. This aspect will not be discussed here in great detail. For an excellent review on the optical techniques of EPR, in particular the ODEPR of excited defect states, the reader is referred to the article by Geschwind [4.1]. It became evident only recently that the application of optical techniques to the detection of EPR is also very useful for the study of ground states of defects, especially in connection with materials science problems such as the structure determination of defects and their influence on bulk properties of solids. In this way, optical properties can be directly associated with particular defects and their structures. Properties connected with the energy levels of defects in the gap, such as electrical properties, which are of specific interest in semiconductor physics, can also be correlated with their EPR spectra.
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Spaeth, JM., Niklas, J.R., Bartram, R.H. (1992). Optical Detection of Electron Paramagnetic Resonance. In: Structural Analysis of Point Defects in Solids. Springer Series in Solid-State Sciences, vol 43. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84405-8_4
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DOI: https://doi.org/10.1007/978-3-642-84405-8_4
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