Characterization of a High-Intensity, Subpicosecond XeCl Laser System

  • A. J. Taylor
  • T. R. Gosnell
  • J. P. Roberts
  • D. C. MacPherson
  • C. R. Tallman
Conference paper
Part of the Springer Series in Chemical Physics book series (CHEMICAL, volume 53)

Abstract

We describe here a terawatt-class laser system based on the amplification of subpicosecond pulses in XeCl discharge amplifiers. For this system we have made a direct measurement of the output beam quality and carried out extensive measurements of the pulsewidth throughout the entire optical train.

Keywords

Quartz Autocorrelation Dick Lester DABCO 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    A. J. Taylor, J. P. Roberts, T. R. Gosnell and C. S. Lester, Opt. Lett. 14, 444 (1989).CrossRefADSGoogle Scholar
  2. 2.
    A. J. Taylor, C. R. Tallman, J. P. Roberts, C. S. Lester, T. R. Gosnell, P. H. Y. Lee, and G. A. Kyrala, Opt. Lett. 15, 39 (1990).CrossRefADSGoogle Scholar
  3. 3.
    Bernhard Dick, Sandor Szatmari, Bela Racz and Fritz Schafer, Opt. Commun. 62, 277 (1987).CrossRefADSGoogle Scholar

Copyright information

© Springer-Verlag Berlin, Heidelberg 1990

Authors and Affiliations

  • A. J. Taylor
    • 1
  • T. R. Gosnell
    • 1
  • J. P. Roberts
    • 1
  • D. C. MacPherson
    • 1
  • C. R. Tallman
    • 1
  1. 1.Los Alamos National LaboratoryLos AlamosUSA

Personalised recommendations