Characterization of a High-Intensity, Subpicosecond XeCl Laser System
We describe here a terawatt-class laser system based on the amplification of subpicosecond pulses in XeCl discharge amplifiers. For this system we have made a direct measurement of the output beam quality and carried out extensive measurements of the pulsewidth throughout the entire optical train.
KeywordsSpatial Filter Output Beam Group Velocity Dispersion XeCI Laser Fraunhofer Diffraction
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