Abstract
Electron stimulated production of positive ions from water exposed silicon monocrystals (100) and (111) has been studied following adsorption, oxidation and electron irradiation. Measurements of desorption cross section are described for both H+ ions as well as the range of minority OH+ and O+ ions observed in the study. The decay of adsorbate signal is further compared with the reduction of the oxygen (KLL) Auger signal.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
For example, T. E. Madey, D. E. Ramaker, and R. Stockbauer, Ann. Rev. Phys. Chem. 35, 215 (1984); E. M. Williams and J. L. de Segovia, Vacuum, 39, 633 (1989)
M. L. Knotek, Rep. Prog. Phys. 47, 1499 (1984).
S. L. Bennett and E. M. Williams, Vacuum, 38, 923 (1988).
M. Q. Ding, E. M. Williams, J. P. Adrados, and J. L. de Segovia, Surf. Sci. Leu. 140, L264 (1984).
R. H. Stulen and P. A. Thiel, Surf. Sci. 157, 99 (1985).
S. Ciraci and H. Wagner, Phys Rev B27, 5180 (1983); H. Ibach, H. Wagner and D. Bruchmann, Solid State Commun. 42, 457 (1982); Y. J. Chabal and S. B. Christman, Phys. Rev. B29, 6974 (1984)
J. A. Schaefer, J. Anderson, and G. J. Lapeyre, J. Vac. Sci. Technol. A3 1443 (1985); J. A. Schaefer, F. Stucki, D. J. Frankel, W. Goepel, and G. J. Lapeyre, J. Vac. Sci. Technol. B2, 359 (1984).
M. Q. Ding and E. M. Williams, Surf. Sci. 160,189 (1985).
M. L. Knotek and P. J. Feibelman, Phys. Rev. Lett 40, 964 (1978); Surf. Sci. 90, 78 (1979)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1990 Springer-Verlag Berlin, Heidelberg
About this paper
Cite this paper
Bennett, S.L., Williams, E.M. (1990). Processes of Desorption and Desorption Cross Sections with Electrons at Silicon Surfaces. In: Betz, G., Varga, P. (eds) Desorption Induced by Electronic Transitions DIET IV. Springer Series in Surface Sciences, vol 19. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84145-3_29
Download citation
DOI: https://doi.org/10.1007/978-3-642-84145-3_29
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-84147-7
Online ISBN: 978-3-642-84145-3
eBook Packages: Springer Book Archive