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Spectroscopic Depth Profiling Using Thermal Waves

  • Richard M. Miller
Part of the Topics in Current Physics book series (TCPHY, volume 47)

Abstract

Spectroscopy can be used to gain information on the identity and concentration of chemical species present in a sample. Unfortunately, it is rarely possible to obtain the equivalent information on the spatial distribution of a chromophore. There are many samples where such information would be extremely valuable, ranging from the study of deposition processes, through chemical modification of surfaces to membrane transport. Spatial information in the x-y plane normal to the incident radiation can be readily obtained by the use of imaging detectors [7.1,2] or scanned spot systems [7.3,4]. Whether information can be obtained in the z direction through the sample thickness depends on the scale over which information is required. If selective information is required on the surface layers over a range of angstroms to nanometers, then techniques from conventional surface science can be used; for example photoelectron spectroscopy and high resolution electron energy loss spectroscopy [7.5]. For penetration depths of a micrometer or so, evanescent wave methods such as attenuated total reflection (ATR) may be suitable [7.6]. For scales of greater than a few hundred micrometers, the only practical techniques are destructive, involving sectioning of the sample to convert it into a thin planar geometry which can be examined by the methods described above. In the interesting region of a few micrometers to a few hundred micrometers, photoacoustic and photothermal methods offer the possbility of performing real nondestructive depth profiling on a wide range of sample types.

Keywords

Impulse Response Depth Profile Thermal Wave Photoacoustic Signal Cross Spectral Density 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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© Springer-Verlag Berlin Heidelberg 1989

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  • Richard M. Miller

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