The Analysis of Electronic Component Reliability Data
The paper describes the development of analysis procedures for data within the Electronic Component Reliability Database at Loughborough University of Technology. The database includes data acquisition from Plessey, GEC, STC and two Danish Companies.
Earlier papers have described the content and administration of the database and the path to establishing the database. The current paper concentrates instead on the analysis of the data within the base. The structure of the base has facilitated an exploratory approach to analysis and enabled the identification and calibration of relevant environmental, mounting, screening and other influences upon failure behaviour to be made from the data itself rather than from prior assumptions.
KeywordsFailure Rate Electronic Component Component Type Exploratory Data Analysis Bipolar Transistor
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