The Analysis of Electronic Component Reliability Data

  • J. M. Marshall
  • J. A. Hayes
  • D. S. Campbell
  • A. Bendell
Conference paper


The paper describes the development of analysis procedures for data within the Electronic Component Reliability Database at Loughborough University of Technology. The database includes data acquisition from Plessey, GEC, STC and two Danish Companies.

Earlier papers have described the content and administration of the database and the path to establishing the database. The current paper concentrates instead on the analysis of the data within the base. The structure of the base has facilitated an exploratory approach to analysis and enabled the identification and calibration of relevant environmental, mounting, screening and other influences upon failure behaviour to be made from the data itself rather than from prior assumptions.


Failure Rate Electronic Component Component Type Exploratory Data Analysis Bipolar Transistor 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer-Verlag Berlin Heidelberg 1989

Authors and Affiliations

  • J. M. Marshall
    • 1
  • J. A. Hayes
    • 1
  • D. S. Campbell
    • 1
  • A. Bendell
    • 2
  1. 1.Component Technology Group, Department of Electronic & Electrical EngineeringUniversity of TechnologyLoughborough, LeicestershireUK
  2. 2.Mathematics, Statistics & Operational ResearchTrent PolytechnicNottinghamUK

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