Deformation measurement by holographic interferometry

  • Werner Jüptner
  • Thomas Kreis
Part of the Research Reports ESPRIT book series (ESPRIT, volume 1)


Holography is a method for recording and reconstructing intensity and phase of a light-wave field reflected from three-dimensional objects /1,2,3/. This is in contrast to conventional photography, where only the intensity is recorded and displayed.


Interference Pattern Reference Wave Holographic Interferometry Tensile Test Specimen Object Wave 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. /1/.
    W. SCHUMANN, J.-P. ZÜRCHER, D. CUCHE: Holography and Deformation Analysis, Springer-Verlag, Berlin, Heidelberg, New York, Tokyo (1985)Google Scholar
  2. /2/.
    P. HARIHARAN: Optical Holography: Principles, Techniques and Applications, Cambridge University Press, Cambridge (1984)Google Scholar
  3. /3/.
    Y. OSTROWSKY, M. BUTUSOV, G. OSTROVSKAYA: Interferometry by Holography, Springer-Verlag, Berlin, Heidelberg, New York, Tokyo (1980)Google Scholar
  4. /4/.
    W. JÜPTNER, TH. KREIS: Holographic NDT and visual inspection in production line applications, Proc. SPIE, vol. 604, 30–36 (1986)Google Scholar
  5. /5/.
    TH. KREIS: Quantitative evaluation of interference patterns, Proc. SPIE, vol. vol. 863, 68–77 (1987)Google Scholar
  6. /6/.
    W. JÜPTNER, K. RINGER, H. WELLING: Auswertung von Interferenzstreifensystemen bei holografischer Translations- und Dehnungsmessung, Optik 38, 437–448 (1973)Google Scholar
  7. /7/.
    H. KREITLOW, TH.KREIS: Entwicklung eines Gerätesystems zur automatisierten statischen und dynamischen Auswertung holografischer Interferenzmuster, Proc. of Laser 79 Optoelectronics Conference, IPC Science and Technology Press, 426–436 (1979)Google Scholar
  8. /8/.
    R. DÄNDLIKER, B. INEICHEN, F. M. MOTHER: High resolution hologram interferometry by electronic phase measurement, Opt. Comm., vol. 9, 412–416 (1973)CrossRefGoogle Scholar
  9. /9/.
    N. ABRAMSON: The making and evaluation of holograms, Academic Press (1981)Google Scholar
  10. /10/.
    R. THALMANN, R. DÄNDLIKER: Strain measurement by heterodyne holographic interferometry, Appl. Opt., vol. 26, no. 10, 1964–1971 (1987)CrossRefGoogle Scholar
  11. /11/.
    W. JÜPTNER: Automatisierte Auswertung holografischer Interferogramme mit dem Zeilen-Scan-Verfahren, DPG/DGaO - Frühjahrsschule, Hannover (1978)Google Scholar
  12. /12/.
    W. JÜPTNER, TH. KREIS, H. KREITLOW: Automatic evaluation of holographic interferograms by reference beam phase shifting, Proc. SPIE, vol. 398, 22–29 (1983)Google Scholar
  13. /13/.
    TH. KREIS, W. JÜPTNER: Bestimmung von Bauteilfehlern durch ein kombiniertes Verfahren von holografischer Interferometrie und Finite-Elemente-Methode, VDI-Be- richte Nr. 631, 139–151 (1987)Google Scholar
  14. /14/.
    M. CHANG, CH. HÜ, P. LAM, J. C. WYANT: High precision deformation measurement by digital phase shifting holographic interferometry, Appl. Opt., vol. 24, 3780–3783 (1985)CrossRefGoogle Scholar
  15. /15/.
    P. HARIHARAN, B. F. OREB, N. BROWN: Real-Time holographic interferometry: a microcomputer system for the measurement of vector displacement, Appl. Opt.,vol.22, 876–880 (1983)CrossRefGoogle Scholar
  16. /16/.
    TH. KREIS: Digital holographic interference-phase measurement using the Fourier transform method, Journ. Opt. Soc. Am. A, vol. 3, 847–855 (1986)CrossRefGoogle Scholar
  17. /17/.
    TH. KREIS: Fourier transform evaluation of holographic interference patterns, Proc. SPIE, vol. 814, 365–371 (1987)Google Scholar
  18. /18/.
    TH. KREIS: Auswertung holografischer Interferenzmuster mit Methoden der Ortsfrequenzanalyse, VDI-Fortschritt-Berichte, Reihe 8, Nr. 108, VDI-Verlag Düsseldorf (1986)Google Scholar

Copyright information

© ECSC — EEC — EAEC, Brussels — Luxembourg 1989

Authors and Affiliations

  • Werner Jüptner
    • 1
  • Thomas Kreis
    • 1
  1. 1.BIAS — Bremer Institut für angewandte StrahltechnikBremen 71Germany

Personalised recommendations