Abstract
A review of our recent study is presented. Various aspects of photoelectron spectroscopy are well suited for the investigation of electronic and geometrical properties of ordered surfaces. Angle-resolved ultraviolet photoelectron spectroscopy, x-ray photoelectron diffraction, maximum surfacesensitivity core level photoelectron spectroscopy are applied to the metal/Si(111) submonolayer interfaces; Si( 111 )√3×√3-group III, IV, V and noble-metal surfaces.
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© 1988 Springer-Verlag Berlin Heidelberg
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Kono, S. (1988). Photoelectron Spectroscopy and Photoelectron Diffraction Studies of Submonolayer Metal/Si(111) Interfaces. In: Kanamori, J., Kotani, A. (eds) Core-Level Spectroscopy in Condensed Systems. Springer Series in Solid-State Sciences, vol 81. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83437-0_22
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DOI: https://doi.org/10.1007/978-3-642-83437-0_22
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