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Progress in Ion Projection Lithography

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Physics and Technology of Submicron Structures

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 83))

Abstract

Ion protection lithography (IPL) uses demagnifying ion optics to project open stencil mask structures onto a substrate with reduced (.. 5x, 10x, ..) scale [1]. The IPL technique offers high throughput potential by using duoplasmatron ion sources with high angular current densities [2] and with virtual source sizes of less than 10 pm. Thus, for organic resists, chip exposure times of ≤ 0.1 sec are easily obtained.

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References

  1. G. Stengl, H. Löschner, J. J. Muray, Solid State Technol. 29(2), 119 (1986)

    Google Scholar 

  2. G. Stengl, H. Löschner, W. Maurer, P. Wolf, J. Vac. Sci. Technol. 4(1), 194 (1986)

    Article  Google Scholar 

  3. G. Stengl, H. Löschner, E. Hammel, E.D. Wolf, J.J. Muray, NATO Workshop on Emerging Technologies for In Situ Processing, Corsica, May 4–8, 1987, in press (North-Holland)

    Google Scholar 

  4. L.-M. Buchmann, L. Csepregi, K.P. Muller, A. Chalupka, E. Hammel, H. Löschner, G. Stengl, 32nd Int. Symp. Electron, Ion and Photon Beams, May 31 - June 3, 1988, Ft. Lauderdale, FL, t.b.p. J. Vac. Sci. Technol.

    Google Scholar 

  5. R. Fischer, E. Hammel, H. Löschner, G. Stengl, P. Wolf, Microelectronic Engineering 5, 193 (North-Holland, 1986 )

    Google Scholar 

  6. G. Stengi, H. Löschner, P. Wolf, Nucl. Instr. Meth. in Phys. Res. B19/20, 987 (1987)

    Article  Google Scholar 

  7. C.W.„Slayman, J.L. Bartelt, C.M. McKenna, Proc. SPIE Vol. 333, 68 (1982)

    Article  Google Scholar 

  8. S.W. Pang, T.M. Lyszcarz. C.L. Chen, J.P. Donnelly, J.N. Randall, J. Vac. Sci. Technol. B5(1), 215 (1987)

    Google Scholar 

  9. G. Stengl, H. Löschner, E. Hammel, E.D. Wolf, Proc. 17th European Solid State Device Research Conf., ESSDERC’87, Bologna, Sept. 14–17, 1987, p. 625 (t.b.p. North-Holland)

    Google Scholar 

  10. G. Stangl, E. Cekan, E. Hammel, W. Fallmann, 5th Int. Winterschool on New Developments in Solid State Physics: Physics and Technology of Submicron Structures, Mauterndorf, Salzburg, Austria, Febr. 22–26, 1988, these Proceedings.

    Google Scholar 

  11. E-beam metrology measurements were done by H. Noll, W. Kräuter and M. Strmsek at Austria Micro Systems International GmbH, Unterpremstätten, Austria.

    Google Scholar 

  12. A. Heuberger, L.-M. Buchmann, L. Csepregi, K.P. Muller, Microelectronic Engineering 6, 333 (1987)

    Article  Google Scholar 

  13. J. Meingailis, J. Vac. Sci. Technol. B5(1), 469 (1987)

    Article  Google Scholar 

  14. G. Stengl, H. Löschner, J.J. Muray, Techn. Proc. SEMICON/ West 1986, p. 42 ( SEMI Inc., Mountain View, CA, 1986 )

    Google Scholar 

  15. G. Stengl, H. Löschner, J.J. Muray, Ext. Abstr. 18th Int. Conf. Solid State Devices and Materials, Tokyo, 29 (1986)

    Google Scholar 

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© 1988 Springer-Verlag Berlin Heidelberg

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Stengl, G., Löschner, H., Hammel, E. (1988). Progress in Ion Projection Lithography. In: Heinrich, H., Bauer, G., Kuchar, F. (eds) Physics and Technology of Submicron Structures. Springer Series in Solid-State Sciences, vol 83. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83431-8_6

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  • DOI: https://doi.org/10.1007/978-3-642-83431-8_6

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-83433-2

  • Online ISBN: 978-3-642-83431-8

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