Skip to main content

Hopping Transport in One-Dimensional Semiconductor Systems

  • Conference paper
Book cover Physics and Technology of Submicron Structures

Part of the book series: Springer Series in Solid-State Sciences ((SSSOL,volume 83))

Abstract

The channel conductance of a one-dimensional MOSFET shows reproducible irregular structure as a function of gate voltage when the device is operated near threshold at low temperatures. The voltage scale on which the structure occurs is in the order of kBT/e. The conductance variations amount to many orders of magnitude when T is taken down into the millikelvin range. These features suggest that the observed structure is due to incoherent hopping. We calculate the conductivity due to this process for a one-dimensional system both numerically and (in an average sense) using percolation theory. The two calculations are in excellent numerical agreement and reproduce the general features of the experimental data.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. A.B. Fowler, A. Harstein and R.A. Webb, Phys. Rev. Letts. 48, 196 (1982).

    Article  Google Scholar 

  2. R.F. Kwasniak, M.A. Kasiner, J. Mcingalis and P.A. Lee, Phys. Rev. Lett. 552, 224 (1984).

    Article  Google Scholar 

  3. R.A. Webb, A. Harstein, J.J. Wainer and A.B. Fowler, Phys. Rev. Letts. 54, 196 (1985).

    Google Scholar 

  4. J.J. Wainer, A.B. Fowler and R.A. Webb, Proceedings of the Seventh Conference on the Electronic Properties of 2D Systems (to be published in Surface Science).

    Google Scholar 

  5. G. Timp, A.S. Fowler, A. Harstein and P.N. Butcher, Phys. Rev. B. 33, 1499 (1986).

    Article  Google Scholar 

  6. G. Timp, A.B. Fowler, A. Hartein and P.N. Butcher, Phys. Rev. B. 34, 8771 (1986).

    Article  Google Scholar 

  7. J.A. McInnes and P.N. Butcher, J. Phys. C: Solid St. Phys. 18, L921 (1985).

    Article  Google Scholar 

  8. R.A. Serota, R.K. Halls and P.A. Lee, Phys. Rev. B. 33, 8441.

    Google Scholar 

  9. P.N. Butcher and J.A. McInnes, Proceedings of the Seventh Annual Conference on the Electronic Properties of 2D Systems (to be published in Surface Science).

    Google Scholar 

  10. P.N. Butcher and J.A. McInnes, to be published in J. Phys. C: Solid St. Phys. (1988).

    Google Scholar 

  11. P.N. Butcher, K.J. Hayden and J.A. McInnes, Phil. Mag. 36, 19 (1977).

    Article  Google Scholar 

  12. X.C. Xie and S. Das Sarma, Proceedings of the Seventh Conference on the Electronic Properties of 2D Systems (to be published in Surface Science).

    Google Scholar 

  13. V. Ambegaokar, B.I. Halperin and J.S. Langer, Phys. Rev. B 4, 2612, (1971).

    Article  Google Scholar 

  14. P.A. Lee, Phys. Rev. Letts. 53 20 42 (1984).

    Google Scholar 

  15. J. Kurkijarvi, Phys. Rev. B. 8, 822 (1973).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1988 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Butcher, P.N., McInnes, J.A. (1988). Hopping Transport in One-Dimensional Semiconductor Systems. In: Heinrich, H., Bauer, G., Kuchar, F. (eds) Physics and Technology of Submicron Structures. Springer Series in Solid-State Sciences, vol 83. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-83431-8_20

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-83431-8_20

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-83433-2

  • Online ISBN: 978-3-642-83431-8

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics